{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:05:59Z","timestamp":1725537959443},"publisher-location":"Berlin, Heidelberg","reference-count":8,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642040191"},{"type":"electronic","value":"9783642040207"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-04020-7_48","type":"book-chapter","created":{"date-parts":[[2009,9,14]],"date-time":"2009-09-14T14:43:19Z","timestamp":1252939399000},"page":"450-457","source":"Crossref","is-referenced-by-count":0,"title":["Warning List Identification Based on Reliability Knowledge in Warranty Claims Information System"],"prefix":"10.1007","author":[{"given":"SangHyun","family":"Lee","sequence":"first","affiliation":[]},{"given":"ByungSu","family":"Jung","sequence":"additional","affiliation":[]},{"given":"KyungIl","family":"Moon","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"issue":"6","key":"48_CR1","doi-asserted-by":"publisher","first-page":"765","DOI":"10.1109\/TSMCA.2005.851343","volume":"35","author":"J. Bai","year":"2005","unstructured":"Bai, J., Pham, H.: Repair-limit Risk-free Warranty Policies with Imperfect Repair. IEEE Transactions on Systems, Man, and Cybernetics Part A\u00a035(6), 765\u2013772 (2005)","journal-title":"IEEE Transactions on Systems, Man, and Cybernetics Part A"},{"issue":"1","key":"48_CR2","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1016\/j.jss.2003.10.024","volume":"74","author":"D.R. Jeske","year":"2005","unstructured":"Jeske, D.R., Zhang, X.: Some Successful Approaches to Software Reliability Modeling in Industry. Journal of Systems and Software\u00a074(1), 85\u201399 (2005)","journal-title":"Journal of Systems and Software"},{"key":"48_CR3","doi-asserted-by":"publisher","first-page":"135","DOI":"10.1016\/j.ress.2005.11.011","volume":"92","author":"M. Junga","year":"2007","unstructured":"Junga, M., Bai, D.S.: Analysis of field data under two-dimensional warranty. Reliability Engineering & System Safety\u00a092, 135\u2013143 (2007)","journal-title":"Reliability Engineering & System Safety"},{"issue":"7","key":"48_CR4","doi-asserted-by":"publisher","first-page":"667","DOI":"10.1108\/02656710510610820","volume":"22","author":"M.R. Karim","year":"2005","unstructured":"Karim, M.R., Suzuki, K.: Analysis of Warranty Claim Data: A Literature Review. International Journal of Quality & Reliability Management\u00a022(7), 667\u2013686 (2005)","journal-title":"International Journal of Quality & Reliability Management"},{"issue":"1","key":"48_CR5","doi-asserted-by":"publisher","first-page":"71","DOI":"10.1016\/S0951-8320(03)00073-5","volume":"81","author":"K.D. Majeske","year":"2003","unstructured":"Majeske, K.D.: A mixture model for automobile warranty data. Reliability Engineering & System Safety\u00a081(1), 71\u201377 (2003)","journal-title":"Reliability Engineering & System Safety"},{"issue":"9","key":"48_CR6","doi-asserted-by":"publisher","first-page":"503","DOI":"10.1108\/02635570210450181","volume":"102","author":"M.W.C. So","year":"2002","unstructured":"So, M.W.C., Sculli, D.: The role of trust, quality, value and risk in conducting e-business. Industrial Management & Data Systems\u00a0102(9), 503\u2013512 (2002)","journal-title":"Industrial Management & Data Systems"},{"issue":"3","key":"48_CR7","doi-asserted-by":"publisher","first-page":"380","DOI":"10.1109\/TC.2004.1261844","volume":"53","author":"X. Teng","year":"2004","unstructured":"Teng, X., Pham, H.: A Software Cost Model for Quantifying the Gain with Considerations of Random Field Environments. IEEE Trans. Computers\u00a053(3), 380\u2013384 (2004)","journal-title":"IEEE Trans. Computers"},{"issue":"2","key":"48_CR8","doi-asserted-by":"publisher","first-page":"120","DOI":"10.1198\/004017002317375073","volume":"44","author":"H. Wu","year":"2001","unstructured":"Wu, H., Meeker, W.Q.: Early Detection of Reliability Problems Using Information from Warranty Databases. Technometrics\u00a044(2), 120\u2013133 (2001)","journal-title":"Technometrics"}],"container-title":["Lecture Notes in Computer Science","Emerging Intelligent Computing Technology and Applications. With Aspects of Artificial Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-04020-7_48.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,30]],"date-time":"2021-04-30T06:54:21Z","timestamp":1619765661000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-04020-7_48"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642040191","9783642040207"],"references-count":8,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-04020-7_48","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2009]]}}}