{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:15:19Z","timestamp":1725538519951},"publisher-location":"Berlin, Heidelberg","reference-count":30,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642044243"},{"type":"electronic","value":"9783642044250"}],"license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-04425-0_16","type":"book-chapter","created":{"date-parts":[[2009,9,30]],"date-time":"2009-09-30T09:52:04Z","timestamp":1254304324000},"page":"211-225","source":"Crossref","is-referenced-by-count":7,"title":["Influencing Factors in Model-Based Testing with UML State Machines: Report on an Industrial Cooperation"],"prefix":"10.1007","author":[{"given":"Stephan","family":"Wei\u00dfleder","sequence":"first","affiliation":[]}],"member":"297","reference":[{"key":"16_CR1","unstructured":"Object Management Group: Unified Modeling Language (UML), version 2.1 (2007)"},{"key":"16_CR2","doi-asserted-by":"crossref","unstructured":"Fraser, G., Wotawa, F.: Ordering coverage goals in model checker based testing. In: ICSTW 2008: Proceedings of the 2008 IEEE ICST Workshop, vol.\u00a00, pp. 31\u201340 (2008)","DOI":"10.1109\/ICSTW.2008.31"},{"key":"16_CR3","unstructured":"Wei\u00dfleder, S.: ParTeG (Partition Test Generator), http:\/\/parteg.sourceforge.net"},{"key":"16_CR4","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809163","volume-title":"Introduction to Software Testing","author":"P. Ammann","year":"2008","unstructured":"Ammann, P., Offutt, J.: Introduction to Software Testing. Cambridge University Press, New York (2008)"},{"key":"16_CR5","unstructured":"Binder, R.V.: Testing object-oriented systems: models, patterns, and tools. Addison-Wesley Longman Publishing Co., Inc. (1999)"},{"key":"16_CR6","volume-title":"Art of Software Testing","author":"G.J. Myers","year":"1979","unstructured":"Myers, G.J.: Art of Software Testing. John Wiley & Sons, Inc., New York (1979)"},{"key":"16_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","DOI":"10.1007\/b137241","volume-title":"Model-Based Testing of Reactive Systems: Advanced Lectures","author":"M. Broy","year":"2005","unstructured":"Broy, M., Jonsson, B., Katoen, J.P.: Model-Based Testing of Reactive Systems: Advanced Lectures. LNCS, vol.\u00a03472. Springer, Heidelberg (2005)"},{"key":"16_CR8","volume-title":"Practical Model-Based Testing: A Tools Approach","author":"M. Utting","year":"2006","unstructured":"Utting, M., Legeard, B.: Practical Model-Based Testing: A Tools Approach. Morgan Kaufmann Publishers Inc., San Francisco (2006)"},{"key":"16_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"416","DOI":"10.1007\/3-540-46852-8_30","volume-title":"\u00abUML\u00bb \u201999 - The Unified Modeling Language. Beyond the Standard","author":"J. Offutt","year":"1999","unstructured":"Offutt, J., Abdurazik, A.: Generating tests from UML specifications. In: France, R.B., Rumpe, B. (eds.) UML 1999. LNCS, vol.\u00a01723, pp. 416\u2013429. Springer, Heidelberg (1999)"},{"key":"16_CR10","unstructured":"Sokenou, D.: Generating Test Sequences from UML Sequence Diagrams and State Diagrams. In: INFORMATIK 2006, pp. 236\u2013240 (2006)"},{"key":"16_CR11","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"383","DOI":"10.1007\/3-540-40011-7_28","volume-title":"UML 2000 - The Unified Modeling Language. Advancing the Standard","author":"A. Abdurazik","year":"2000","unstructured":"Abdurazik, A., Offutt, J.: Using UML collaboration diagrams for static checking and test generation. In: Evans, A., Kent, S., Selic, B. (eds.) UML 2000. LNCS, vol.\u00a01939, pp. 383\u2013395. Springer, Heidelberg (2000)"},{"key":"16_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"301","DOI":"10.1007\/978-3-540-75101-4_30","volume-title":"Computer Safety, Reliability, and Security","author":"M. Friske","year":"2007","unstructured":"Friske, M., Schlingloff, B.H.: Improving Test Coverage for UML State Machines Using Transition Instrumentation. In: Saglietti, F., Oster, N. (eds.) SAFECOMP 2007. LNCS, vol.\u00a04680, pp. 301\u2013314. Springer, Heidelberg (2007)"},{"key":"16_CR13","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"151","DOI":"10.1007\/978-3-540-69073-3_17","volume-title":"Models in Software Engineering","author":"S. Wei\u00dfleder","year":"2008","unstructured":"Wei\u00dfleder, S., Schlingloff, B.H.: Deriving Input Partitions from UML Models for Automatic Test Generation. In: Giese, H. (ed.) MODELS 2008. LNCS, vol.\u00a05002, pp. 151\u2013163. Springer, Heidelberg (2008)"},{"key":"16_CR14","unstructured":"L\u00e4mmel, R., Harm, J.: Test case characterisation by regular path expressions. In: Brinksma, E., Tretmans, J. (eds.) Proc. Formal Approaches to Testing of Software (FATES 2001). Notes Series NS-01-4, BRICS, pp. 109\u2013124 (2001)"},{"key":"16_CR15","doi-asserted-by":"crossref","unstructured":"Briand, L.C., Labiche, Y., Lin, Q.: Improving statechart testing criteria using data flow information. In: ISSRE 2005, pp. 95\u2013104 (2005)","DOI":"10.1109\/ISSRE.2005.24"},{"key":"16_CR16","first-page":"139","volume-title":"ISSRE 2004","author":"N. Kosmatov","year":"2004","unstructured":"Kosmatov, N., Legeard, B., Peureux, F., Utting, M.: Boundary Coverage Criteria for Test Generation from Formal Models. In: ISSRE 2004, pp. 139\u2013150. IEEE, Los Alamitos (2004)"},{"key":"16_CR17","first-page":"517","volume-title":"ICST","author":"S. Wei\u00dfleder","year":"2008","unstructured":"Wei\u00dfleder, S., Schlingloff, B.-H.: Quality of Automatically Generated Test Cases based on OCL Expressions. In: ICST, pp. 517\u2013520. IEEE Computer Society, Los Alamitos (2008)"},{"key":"16_CR18","doi-asserted-by":"crossref","unstructured":"Chilenski, J.J., Miller, S.P.: Applicability of Modified Condition\/Decision Coverage to Software Testing. Software Engineering Journal (1994)","DOI":"10.1049\/sej.1994.0025"},{"key":"16_CR19","unstructured":"Ranville, S.: MCDC Test Vectors From Matlab Models \u2013 Automatically. In: Embedded Systems Conference, San Francisco, USA (2003)"},{"key":"16_CR20","first-page":"161","volume-title":"ICSE 2008","author":"A. Rajan","year":"2008","unstructured":"Rajan, A., Whalen, M.W., Heimdahl, M.P.E.: The effect of program and model structure on mc\/dc test adequacy coverage. In: ICSE 2008, pp. 161\u2013170. ACM, New York (2008)"},{"key":"16_CR21","unstructured":"Wei\u00dfleder, S.: Semantic-Preserving Test Model Transformations for Interchangeable Coverage Criteria. In: MBEES 2009: Model-Based Development of Embedded Systems (April 2009)"},{"key":"16_CR22","doi-asserted-by":"crossref","unstructured":"Offutt, A.J., Lee, A., Rothermel, G., Untch, R.H., Zapf, C.: An experimental determination of sufficient mutant operators. ACM Transactions on Software Engineering and Methodology, 99\u2013118 (1996)","DOI":"10.1145\/227607.227610"},{"issue":"5","key":"16_CR23","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1109\/32.286422","volume":"20","author":"A.J. Offutt","year":"1994","unstructured":"Offutt, A.J., Lee, S.D.: An empirical evaluation of weak mutation. IEEE Transactions on Software Engineering\u00a020(5), 337\u2013344 (1994)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"16_CR24","doi-asserted-by":"publisher","first-page":"81","DOI":"10.1109\/ASE.2000.873653","volume-title":"ASE 2000: Proceedings of the 15th IEEE international conference on Automated software engineering","author":"P.E. Black","year":"2000","unstructured":"Black, P.E., Okun, V., Yesha, Y.: Mutation Operators for Specifications. In: ASE 2000: Proceedings of the 15th IEEE international conference on Automated software engineering, Washington, DC, USA, p. 81. IEEE Computer Society, Los Alamitos (2000)"},{"key":"16_CR25","doi-asserted-by":"crossref","unstructured":"Andrews, J.H., Briand, L.C., Labiche, Y.: Is mutation an appropriate tool for testing experiments? In: ICSE 2005, pp. 402\u2013411. ACM, New York (2005)","DOI":"10.1145\/1062455.1062530"},{"key":"16_CR26","doi-asserted-by":"publisher","first-page":"608","DOI":"10.1109\/TSE.2006.83","volume":"32","author":"J.H. Andrews","year":"2006","unstructured":"Andrews, J.H., Briand, L.C., Labiche, Y., Namin, A.S.: Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria. IEEE Transactions on Software Engineering\u00a032, 608\u2013624 (2006)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"16_CR27","first-page":"1","volume-title":"A-MOST 2005","author":"A. Paradkar","year":"2005","unstructured":"Paradkar, A.: Case studies on fault detection effectiveness of model based test generation techniques. In: A-MOST 2005, pp. 1\u20137. ACM Press, New York (2005)"},{"key":"16_CR28","unstructured":"Chilenski, J.J.: MCDC Forms (Unique-Cause, Masking) versus Error Sensitivity, a white paper submitted to NASA Langley Research Center under contract NAS1-20341 (January 2001)"},{"key":"16_CR29","unstructured":"Certification Authorities Software Team: Position Paper-6: Rationale for Accepting Masking MC\/DC in Certification Projects (2001)"},{"key":"16_CR30","unstructured":"Budnik, C.J., Subramanyan, R., Vieira, M.: Peer-to-peer comparison of model-based test tools. In: GI Jahrestagung (1). LNI, vol.\u00a0133, pp. 223\u2013226. GI (2008)"}],"container-title":["Lecture Notes in Computer Science","Model Driven Engineering Languages and Systems"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-04425-0_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,22]],"date-time":"2019-05-22T23:01:21Z","timestamp":1558566081000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-04425-0_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642044243","9783642044250"],"references-count":30,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-04425-0_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2009]]}}}