{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:56:01Z","timestamp":1725537361124},"publisher-location":"Berlin, Heidelberg","reference-count":17,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642045530"},{"type":"electronic","value":"9783642045547"}],"license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-04554-7_6","type":"book-chapter","created":{"date-parts":[[2009,9,14]],"date-time":"2009-09-14T18:11:16Z","timestamp":1252951876000},"page":"82-97","source":"Crossref","is-referenced-by-count":3,"title":["Optimal String Edit Distance Based Test Suite Reduction for SDL Specifications"],"prefix":"10.1007","author":[{"given":"G\u00e1bor","family":"Kov\u00e1cs","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G\u00e1bor \u00c1rp\u00e1d","family":"N\u00e9meth","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mahadevan","family":"Subramaniam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zolt\u00e1n","family":"Pap","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"3","key":"6_CR1","doi-asserted-by":"publisher","first-page":"1090","DOI":"10.1109\/5.533956","volume":"43","author":"D. Lee","year":"1996","unstructured":"Lee, D., Yiannakakis, M.: Principles and methods of testing finite state machines \u2013 a survey. Proceedings of the IEEE\u00a043(3), 1090\u20131123 (1996)","journal-title":"Proceedings of the IEEE"},{"key":"6_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"269","DOI":"10.1007\/3-540-45075-0_16","volume-title":"SDL 2003: System Design","author":"G. Kov\u00e1cs","year":"2003","unstructured":"Kov\u00e1cs, G., Pap, Z., Le, V.D., Wu-Hen-Chang, A., Csopaki, G.: Applying mutation analysis to SDL specifications. In: Reed, R., Reed, J. (eds.) SDL 2003. LNCS, vol.\u00a02708, pp. 269\u2013284. Springer, Heidelberg (2003)"},{"key":"6_CR3","first-page":"25","volume-title":"AST 2008: Proceedings of the 3rd international workshop on Automation of software test","author":"W.E. Wong","year":"2008","unstructured":"Wong, W.E., Restrepo, A., Qi, Y., Choi, B.: An EFSM-based test generation for validation of SDL specifications. In: AST 2008: Proceedings of the 3rd international workshop on Automation of software test, pp. 25\u201332. ACM, New York (2008)"},{"key":"6_CR4","unstructured":"Schmitt, M., Grabowski, J., Hogrefe, D., Koch, B.: Autolink \u2013 a tool for the automatic and semi-automatic test generation. In: Wolisz, A., Schieferdecker, I., Rennoch, A. (eds.) Formale Beschreibungstechniken f\u00fcr verteilte Systeme, Nr. 315, GMD-Studien. GMD-Forschungszentrum Informationstechnik GmbH (1997)"},{"key":"6_CR5","unstructured":"Tretmans, G., Brinksma, H.: Torx: Automated model-based testing. In: Hartman, A., Dussa-Ziegler, K. (eds.) First European Conference on Model-Driven Software Engineering, pp. 31\u201343 (2003)"},{"key":"6_CR6","unstructured":"Jard, C., Jeron, T.: TGV: Theory, principles and algorithms. In: 6th World Conference on Integrated Design and Process Technology, IDPT 2002 (2002)"},{"key":"6_CR7","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1007\/978-0-387-35516-0_13","volume-title":"13th IFIP International Conference on Testing of Communicating Systems (TestCom 2000)","author":"L. Heerink","year":"2000","unstructured":"Heerink, L., Feenstra, J., Tretmans, J.: Formal test automation: The conference protocol with phact. In: Ural, H., Probert, R.L., von Bochmann, G. (eds.) 13th IFIP International Conference on Testing of Communicating Systems (TestCom 2000), pp. 211\u2013220. Kluwer Academic, Dordrecht (2000)"},{"issue":"3","key":"6_CR8","doi-asserted-by":"publisher","first-page":"270","DOI":"10.1145\/152388.152391","volume":"2","author":"M. Harrold","year":"1993","unstructured":"Harrold, M., Gupta, R., Soffa, M.: A methodology for controlling the size of a test suite. Transactions on Software Engineering and Methodology\u00a02(3), 270\u2013285 (1993)","journal-title":"Transactions on Software Engineering and Methodology"},{"key":"6_CR9","first-page":"31","volume-title":"Proceedings of the IFIP TC6\/WG6.1 Fourth International Workshop on Protocol Test Systems IV","author":"S.T. Vuong","year":"1992","unstructured":"Vuong, S.T., Alilovic-Curgus, J.: On test coverage metrics for communication protocols. In: von Bochmann, G., Dssouli, R., Das, A. (eds.) Proceedings of the IFIP TC6\/WG6.1 Fourth International Workshop on Protocol Test Systems IV, pp. 31\u201345. North Holland, Amsterdam (1992)"},{"issue":"1","key":"6_CR10","doi-asserted-by":"publisher","first-page":"203","DOI":"10.1016\/S0377-2217(01)00284-3","volume":"142","author":"T. Cs\u00f6ndes","year":"2001","unstructured":"Cs\u00f6ndes, T., Kotnyek, B., Szab\u00f3, J.: Application of heuristic methods for conformance test selection. European Journal of Operational Research\u00a0142(1), 203\u2013218 (2001)","journal-title":"European Journal of Operational Research"},{"key":"6_CR11","series-title":"IFIP Conference Proceedings","doi-asserted-by":"publisher","first-page":"283","DOI":"10.1007\/978-0-387-35497-2_21","volume-title":"Proceedings of the IFIP 14th international Conference on Testing Communicating Systems XIV","author":"A. Williams","year":"2002","unstructured":"Williams, A., Probert, R.: Formulation of the interaction test coverage problem as an integer program. In: Schieferdecker, I., K\u00f6nig, H., Wolisz, A. (eds.) Proceedings of the IFIP 14th international Conference on Testing Communicating Systems XIV. IFIP Conference Proceedings, vol.\u00a0210, pp. 283\u2013298. Kluwer, B.V., Deventer (2002)"},{"key":"6_CR12","series-title":"IFIP Conference Proceedings","doi-asserted-by":"publisher","first-page":"267","DOI":"10.1007\/978-0-387-35497-2_20","volume-title":"Proceedings of the IFIP 14th international Conference on Testing Communicating Systems XIV","author":"L. Feijs","year":"2002","unstructured":"Feijs, L., Goga, N., Mauw, S., Tretmans, J.: Test selection, trace distance and heuristics. In: Schieferdecker, I., K\u00f6nig, H., Wolisz, A. (eds.) Proceedings of the IFIP 14th international Conference on Testing Communicating Systems XIV. IFIP Conference Proceedings, vol.\u00a0210, pp. 267\u2013282. Kluwer, B.V., Deventer (2002)"},{"key":"6_CR13","volume-title":"SDL Formal Object-oriented Language for Communicating Systems","author":"J. Ellsberger","year":"1997","unstructured":"Ellsberger, J., Hogrefe, D., Sarma, A.: SDL Formal Object-oriented Language for Communicating Systems. Prentice-Hall, Englewood Cliffs (1997)"},{"key":"6_CR14","unstructured":"International Telecommunications Union: Recommendation Z.100 (11\/07), Specification and Description Language (SDL), http:\/\/www.itu.int\/rec\/T-REC-Z.100\/en"},{"issue":"1","key":"6_CR15","doi-asserted-by":"publisher","first-page":"168","DOI":"10.1145\/321796.321811","volume":"21","author":"R. Wagner","year":"1974","unstructured":"Wagner, R., Fischer, M.: The string-to-string correction problem. Journal of the ACM\u00a021(1), 168\u2013173 (1974)","journal-title":"Journal of the ACM"},{"key":"6_CR16","unstructured":"Cormen, T., Leiserson, C., Rivest, R., Stein, C.: Introduction to Algorithms, 2nd edn. MIT Press and McGraw-Hill (2001)"},{"issue":"1","key":"6_CR17","doi-asserted-by":"publisher","first-page":"103","DOI":"10.1016\/S0166-218X(97)00120-0","volume":"76","author":"M. Dell\u2019Amico","year":"1997","unstructured":"Dell\u2019Amico, M., Martello, S.: The k-cardinality assignment problem. Discrete Applied Mathematics\u00a076(1), 103\u2013121 (1997)","journal-title":"Discrete Applied Mathematics"}],"container-title":["Lecture Notes in Computer Science","SDL 2009: Design for Motes and Mobiles"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-04554-7_6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,26]],"date-time":"2023-05-26T19:09:00Z","timestamp":1685128140000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-04554-7_6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642045530","9783642045547"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-04554-7_6","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2009]]}}}