{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:09:39Z","timestamp":1725538179899},"publisher-location":"Berlin, Heidelberg","reference-count":10,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642046476"},{"type":"electronic","value":"9783642046483"}],"license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-04648-3_32","type":"book-chapter","created":{"date-parts":[[2009,9,19]],"date-time":"2009-09-19T06:47:09Z","timestamp":1253342829000},"page":"427-440","source":"Crossref","is-referenced-by-count":0,"title":["Loop Identification and Capacity Estimation of Digital Subscriber Lines with Single Ended Line Testing"],"prefix":"10.1007","author":[{"given":"Carine","family":"Neus","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wim","family":"Foubert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leo","family":"Van Biesen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"5","key":"32_CR1","doi-asserted-by":"publisher","first-page":"923","DOI":"10.1109\/JSAC.2002.1007375","volume":"20","author":"S. Galli","year":"2002","unstructured":"Galli, S., Waring, D.L.: Loop Makeup Identification Via Single Ended Testing: Beyond Mere Loop Qualification. IEEE J. Sel. Areas Commun.\u00a020(5), 923\u2013935 (2002)","journal-title":"IEEE J. Sel. Areas Commun."},{"issue":"2","key":"32_CR2","doi-asserted-by":"publisher","first-page":"528","DOI":"10.1109\/TIM.2006.870134","volume":"55","author":"S. Galli","year":"2006","unstructured":"Galli, S., Kerpez, K.J.: Single-Ended Loop Make-Up Identification. IEEE Trans. Instrum. Meas.\u00a055(2), 528\u2013549 (2006)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"32_CR3","doi-asserted-by":"publisher","first-page":"1509","DOI":"10.1109\/TIM.2006.880290","volume":"55","author":"P. Boets","year":"2006","unstructured":"Boets, P., Bostoen, T., Van Biesen, L., Pollet, T.: Pre-Processing of Signals for Single-Ended Subscriber Line Testing. IEEE Trans. Instrum. Meas.\u00a055(5), 1509\u20131518 (2006)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"32_CR4","doi-asserted-by":"publisher","first-page":"936","DOI":"10.1109\/JSAC.2002.1007376","volume":"20","author":"T. Bostoen","year":"2002","unstructured":"Bostoen, T., Boets, P., Zekri, M., Van Biesen, L., Pollet, T., Rabijns, D.: Estimation of the Transfer Function of a Subscriber Loop by Means of One-Port Scattering Parameter Measurement at the Central Office. IEEE J. Sel. Areas in Commun.\u00a020(5), 936\u2013948 (2002)","journal-title":"IEEE J. Sel. Areas in Commun."},{"key":"32_CR5","doi-asserted-by":"crossref","unstructured":"Celaya, B., Dodds, D.: Single-Ended DSL Line Tester. In: Proc. Canadian Conf. on Electrical and Computer Engineering, pp. 2155\u20132158 (2004)","DOI":"10.1109\/CCECE.2004.1347670"},{"key":"32_CR6","volume-title":"DSL: Simulation Techniques and Standards Development for Digital Subscriber Line Systems","author":"W.Y. Chen","year":"1998","unstructured":"Chen, W.Y.: DSL: Simulation Techniques and Standards Development for Digital Subscriber Line Systems. MacMillan Technical Publishing, U.S.A (1998)"},{"key":"32_CR7","volume-title":"Understanding Digital Subscriber Line Technology","author":"T. Starr","year":"1999","unstructured":"Starr, T., Cioffi, J., Silverman, P.: Understanding Digital Subscriber Line Technology. Prentice Hall, New Jersey (1999)"},{"key":"32_CR8","unstructured":"Asymmetric digital subscriber line (ADSL) transceivers. ITU, Recommendation G.992.1 (1999)"},{"key":"32_CR9","doi-asserted-by":"crossref","unstructured":"Neus, C., Boets, P., Van Biesen, L.: Transfer Function Estimation of Digital Subscriber Lines. In: IEEE Proc. Instrum. Meas. Techn. Conf. 1\u20135 (2007)","DOI":"10.1109\/IMTC.2007.378980"},{"key":"32_CR10","doi-asserted-by":"crossref","unstructured":"Vermeiren, T., Bostoen, T., Louage, F., Boets, P., Chehab, X.O.: Subscriber Loop Topology Classification by means of Time Domain Reflectometry. In: Proc. IEEE Int. Conf. Comm, pp. 1998\u20132002 (2003)","DOI":"10.1109\/ICC.2003.1203949"}],"container-title":["Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering","AccessNets"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-04648-3_32","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,22]],"date-time":"2019-05-22T14:49:40Z","timestamp":1558536580000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-04648-3_32"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642046476","9783642046483"],"references-count":10,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-04648-3_32","relation":{},"ISSN":["1867-8211","1867-822X"],"issn-type":[{"type":"print","value":"1867-8211"},{"type":"electronic","value":"1867-822X"}],"subject":[],"published":{"date-parts":[[2009]]}}}