{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:54:42Z","timestamp":1725540882623},"publisher-location":"Berlin, Heidelberg","reference-count":17,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642105081"},{"type":"electronic","value":"9783642105098"}],"license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1007\/978-3-642-10509-8_24","type":"book-chapter","created":{"date-parts":[[2009,11,11]],"date-time":"2009-11-11T08:36:24Z","timestamp":1257928584000},"page":"208-215","source":"Crossref","is-referenced-by-count":7,"title":["A Bi-objective Model Inspired Greedy Algorithm for Test Suite Minimization"],"prefix":"10.1007","author":[{"given":"Saeed","family":"Parsa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alireza","family":"Khalilian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"4","key":"24_CR1","doi-asserted-by":"publisher","first-page":"219","DOI":"10.1002\/stvr.256","volume":"12","author":"G. Rothermel","year":"2002","unstructured":"Rothermel, G., Harrold, M.J., von Ronne, J., Hong, C.: Empirical Studies of Test-Suite Reduction. Journal of Software Testing, Verification, and Reliability\u00a012(4), 219\u2013249 (2002)","journal-title":"Journal of Software Testing, Verification, and Reliability"},{"key":"24_CR2","volume-title":"Proceedings of the International Conference on Software Maintenance","author":"G. Rothermel","year":"1998","unstructured":"Rothermel, G., Harrold, M.J., Ostrin, J., Hong, C.: An Empirical Study of the Effects of Minimization on the Fault Detection Capabilities of Test Suites. In: Proceedings of the International Conference on Software Maintenance. IEEE Computer Society, Los Alamitos (1998)"},{"key":"24_CR3","doi-asserted-by":"publisher","first-page":"270","DOI":"10.1145\/152388.152391","volume":"2","author":"M.J. Harrold","year":"1993","unstructured":"Harrold, M.J., Gupta, R., Soffa, M.L.: A methodology for controlling the size of a test suite. ACM Trans. Softw. Eng. Methodol.\u00a02, 270\u2013285 (1993)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"24_CR4","unstructured":"Chen, T.Y., Lau, M.F.: Heuristics toward the Optimization of the Size of a Test Suite. In: Proc. 3rd Int\u2019l. Conf. on Softw. Quality Management, Seville, Spain, April 1995, vol.\u00a02, pp. 415\u2013424 (1995)"},{"key":"24_CR5","doi-asserted-by":"publisher","first-page":"195","DOI":"10.1109\/TSE.2003.1183927","volume":"29","author":"J.A. Jones","year":"2003","unstructured":"Jones, J.A., Harrold, M.J.: Test-Suite Reduction and Prioritization for Modified Condition\/Decision Coverage. IEEE Trans. Softw. Eng.\u00a029, 195\u2013209 (2003)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"24_CR6","doi-asserted-by":"publisher","first-page":"99","DOI":"10.1109\/TSE.2007.70756","volume":"34","author":"S. McMaster","year":"2008","unstructured":"McMaster, S., Memon, A.: Call-Stack Coverage for GUI Test Suite Reduction. IEEE Trans. Softw. Eng.\u00a034, 99\u2013115 (2008)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"24_CR7","volume-title":"Proceedings of the 6th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering","author":"S. Tallam","year":"2005","unstructured":"Tallam, S., Gupta, N.: A concept analysis inspired greedy algorithm for test suite minimization. In: Proceedings of the 6th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering. ACM, Lisbon (2005)"},{"key":"24_CR8","volume-title":"Proceedings of the 14th International Symposium on Software Reliability Engineering","author":"D. Leon","year":"2003","unstructured":"Leon, D., Podgurski, A.: A Comparison of Coverage-Based and Distribution-Based Techniques for Filtering and Prioritizing Test Cases. In: Proceedings of the 14th International Symposium on Software Reliability Engineering. IEEE Computer Society, Los Alamitos (2003)"},{"key":"24_CR9","volume-title":"Proceedings of the 2008 ACM symposium on applied computing","author":"Z. Chen","year":"2008","unstructured":"Chen, Z., Xu, B., Zhang, X., Nie, C.: A novel approach for test suite reduction based on requirement relation contraction. In: Proceedings of the 2008 ACM symposium on applied computing. ACM, Fortaleza (2008)"},{"key":"24_CR10","doi-asserted-by":"publisher","first-page":"534","DOI":"10.1016\/j.infsof.2007.06.003","volume":"50","author":"H. Zhong","year":"2008","unstructured":"Zhong, H., Zhang, L., Mei, H.: An experimental study of four typical test suite reduction techniques. Inf. Softw. Technol.\u00a050, 534\u2013546 (2008)","journal-title":"Inf. Softw. Technol."},{"key":"24_CR11","doi-asserted-by":"crossref","unstructured":"Chen, T.Y., Lau, M.: A new heuristic for test suite reduction. Information and Software Technology\u00a040(5-6) (1998)","DOI":"10.1016\/S0950-5849(98)00050-0"},{"key":"24_CR12","doi-asserted-by":"publisher","first-page":"347","DOI":"10.1002\/(SICI)1097-024X(19980410)28:4<347::AID-SPE145>3.0.CO;2-L","volume":"28","author":"W.E. Wong","year":"1998","unstructured":"Wong, W.E., Horgan, J.R., London, S., Mathur, A.P.: Effect of test set minimization on fault detection effectiveness. Softw. Pract. Exper.\u00a028, 347\u2013369 (1998)","journal-title":"Softw. Pract. Exper."},{"key":"24_CR13","doi-asserted-by":"publisher","first-page":"19","DOI":"10.1002\/(SICI)1096-908X(199901\/02)11:1<19::AID-SMR182>3.0.CO;2-M","volume":"11","author":"N. Mansour","year":"1999","unstructured":"Mansour, N., El-Fakih, K.: Simulated annealing and genetic algorithms for optimal regression testing. Journal of Software Maintenance\u00a011, 19\u201334 (1999)","journal-title":"Journal of Software Maintenance"},{"key":"24_CR14","volume-title":"Proceedings of the 26th International Conference on Software Engineering","author":"J. Black","year":"2004","unstructured":"Black, J., Melachrinoudis, E., Kaeli, D.: Bi-Criteria Models for All-Uses Test Suite Reduction. In: Proceedings of the 26th International Conference on Software Engineering. IEEE Computer Society, Los Alamitos (2004)"},{"key":"24_CR15","unstructured":"Rothermel, G., Elbaum, S., Kinneer, A., Do, H.: Software-artifact infrastructure repository, \n                    \n                      http:\/\/www.cse.unl.edu\/~galileo\/sir"},{"key":"24_CR16","unstructured":"SAS 9.1.3 Documentation, SAS\/GRAPH 9.1 Reference, \n                    \n                      http:\/\/support.sas.com\/documentation\/onlinedoc\/91pdf\/index_913.html"},{"key":"24_CR17","volume-title":"Mathematical Statistics","author":"J.E. Freund","year":"1992","unstructured":"Freund, J.E.: Mathematical Statistics, 5th edn. Prentice-Hall, Englewood Cliffs (1992)","edition":"5"}],"container-title":["Lecture Notes in Computer Science","Future Generation Information Technology"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-10509-8_24","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,19]],"date-time":"2019-05-19T12:44:03Z","timestamp":1558269843000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-10509-8_24"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"ISBN":["9783642105081","9783642105098"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-10509-8_24","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2009]]}}}