{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T17:15:37Z","timestamp":1742922937947,"version":"3.40.3"},"publisher-location":"Berlin, Heidelberg","reference-count":14,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642116278"},{"type":"electronic","value":"9783642116285"}],"license":[{"start":{"date-parts":[[2010,1,1]],"date-time":"2010-01-01T00:00:00Z","timestamp":1262304000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-11628-5_58","type":"book-chapter","created":{"date-parts":[[2010,2,26]],"date-time":"2010-02-26T04:02:20Z","timestamp":1267156940000},"page":"523-530","source":"Crossref","is-referenced-by-count":0,"title":["Test Based on Built-In Current Sensors for Mixed-Signal Circuits"],"prefix":"10.1007","author":[{"given":"Rom\u00e1n","family":"Mozuelos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yolanda","family":"Lechuga","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mar","family":"Mart\u00ednez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Salvador","family":"Bracho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"58_CR1","doi-asserted-by":"publisher","first-page":"796","DOI":"10.1049\/el:19960557","volume":"32","author":"M. Robson","year":"1996","unstructured":"Robson, M., Russell, G.: Current Monitoring Technique for Testing Embedded Analogue Functions in Mixed-Signal ICs. Electronics Letters\u00a032, 796\u2013798 (1996)","journal-title":"Electronics Letters"},{"key":"58_CR2","doi-asserted-by":"publisher","first-page":"159","DOI":"10.1145\/989995.989997","volume":"9","author":"S. Sabade","year":"2004","unstructured":"Sabade, S., Walker, D.M.H.: IDDX-Based Test Methods: A Survey. ACM Transactions on Design Automation of Electronic Systems\u00a09, 159\u2013198 (2004)","journal-title":"ACM Transactions on Design Automation of Electronic Systems"},{"issue":"5","key":"58_CR3","doi-asserted-by":"publisher","first-page":"543","DOI":"10.1023\/B:JETT.0000042518.15795.f0","volume":"20","author":"B. Alorda","year":"2004","unstructured":"Alorda, B., Canals, V., Segura, J.: A two-level Power-Grid Model for Transient Current Testing Evaluation. J. Electronic Testing\u00a020(5), 543\u2013552 (2004)","journal-title":"J. Electronic Testing"},{"key":"58_CR4","doi-asserted-by":"publisher","first-page":"345","DOI":"10.1049\/el:19970275","volume":"33","author":"Y. Maidon","year":"1997","unstructured":"Maidon, Y., Deval, Y., Begueret, J.B., Tomas, J., Dom, J.P.: 3.3V CMOS Built-In Current Sensor. IEE Electronics Letters\u00a033, 345\u2013346 (1997)","journal-title":"IEE Electronics Letters"},{"key":"58_CR5","doi-asserted-by":"crossref","unstructured":"Stopjakov\u00e1, V., Manhaeve, H., Sidiropulos, M.: On-Chip Transient Current Monitor for Testing of Low-Voltage CMOS IC. In: Proceedings of Design, Automation and Test in Europe, pp. 538\u2013542 (1999)","DOI":"10.1145\/307418.307560"},{"key":"58_CR6","doi-asserted-by":"publisher","first-page":"441","DOI":"10.1049\/el:19990359","volume":"35","author":"J. Segura","year":"1999","unstructured":"Segura, J., De Paul, I., Roca, M., Isern, E., Hawkins, C.J.: Experimental Analysis of Transient Current Testing Based on Charge Observation. Electronic Letter\u00a035, 441\u2013447 (1999)","journal-title":"Electronic Letter"},{"key":"58_CR7","unstructured":"Mozuelos, R., Pel\u00e1ez, N., Mart\u00ednez, M., Bracho, S.: Built-in Current Sensor in Mixed Circuit Test Based on Dynamic Power Supply Consumption. In: IEEE International On-Line Testing Workshop, pp. 25\u201328 (1996)"},{"key":"58_CR8","unstructured":"Mozuelos, R., Mart\u00ednez, M., Bracho, S.: Built-In Sensor Based on the Time Variation of the Transient Current Supply in Analogue Circuits. In: XVI Conference on Design of Circuits and Integrated Systems, pp. 630\u2013635 (2001)"},{"key":"58_CR9","doi-asserted-by":"crossref","unstructured":"Lechuga, Y., Mozuelos, R., Mart\u00ednez, M., Bracho, S.: Built-in Dynamic Current Sensor for Hard to Detect Faults in Mixed Signal ICs. In: Design, Automation and Test in Europe Conference and Exhibition, pp. 205\u2013211 (2002)","DOI":"10.1109\/DATE.2002.998271"},{"key":"58_CR10","doi-asserted-by":"publisher","first-page":"775","DOI":"10.1049\/el:20030475","volume":"39","author":"Y. Lechuga","year":"2003","unstructured":"Lechuga, Y., Mozuelos, R., Mart\u00ednez, M., Bracho, S.: Built-in Sensor based on Current Supply High-Frequency Behaviour. IEE Electronics Letters\u00a039, 775\u2013777 (2003)","journal-title":"IEE Electronics Letters"},{"key":"58_CR11","doi-asserted-by":"publisher","DOI":"10.1002\/0471728527","volume-title":"CMOS Electronics: How it Works, How it Fails","author":"J. Segura","year":"2004","unstructured":"Segura, J., Hawkins, C.: CMOS Electronics: How it Works, How it Fails. IEEE Press, Los Alamitos (2004)"},{"key":"58_CR12","doi-asserted-by":"publisher","first-page":"123","DOI":"10.1109\/TCAD.2007.907255","volume":"27","author":"D. Arum\u00ed","year":"2008","unstructured":"Arum\u00ed, D., Rodr\u00edguez-Monta\u00f1\u00e9s, R., Figueras, J.: Experimental Characterization of CMOS Interconnect Open Defects. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\u00a027, 123\u2013136 (2008)","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"58_CR13","doi-asserted-by":"crossref","unstructured":"Olbrich, T., Mozuelos, R., Richardson, A., Bracho, S.: Design-for-Test (DfT) Study in a Current Mode DAC. In: IEE Proceedings Circuits, Devices and Systems, vol.\u00a0143, pp. 374\u2013379 (1996)","DOI":"10.1049\/ip-cds:19960956"},{"key":"58_CR14","unstructured":"Mozuelos, R., Lechuga, Y., Allende, M.A., Mart\u00ednez, M., Bracho, S.: Experimental Evaluation of a Built-in Current Sensor for Analog Circuits. In: Design of Circuits and Integrated Systems Conference, pp. 96\u2013100 (2004)"}],"container-title":["IFIP Advances in Information and Communication Technology","Emerging Trends in Technological Innovation"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-11628-5_58","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,18]],"date-time":"2025-02-18T22:03:49Z","timestamp":1739916229000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-11628-5_58"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642116278","9783642116285"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-11628-5_58","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2010]]}}}