{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:04:17Z","timestamp":1725555857263},"publisher-location":"Berlin, Heidelberg","reference-count":7,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642125348"},{"type":"electronic","value":"9783642125355"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-12535-5_53","type":"book-chapter","created":{"date-parts":[[2010,5,8]],"date-time":"2010-05-08T15:53:31Z","timestamp":1273334011000},"page":"451-458","source":"Crossref","is-referenced-by-count":1,"title":["Thermal Modeling of GaN HEMTs"],"prefix":"10.1007","author":[{"given":"D.","family":"Vasileska","sequence":"first","affiliation":[]},{"given":"A.","family":"Ashok","sequence":"additional","affiliation":[]},{"given":"O.","family":"Hartin","sequence":"additional","affiliation":[]},{"given":"S. M.","family":"Goodnick","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"53_CR1","doi-asserted-by":"publisher","first-page":"1366","DOI":"10.1016\/j.microrel.2008.07.052","volume":"48","author":"M. Bouya","year":"2008","unstructured":"Bouya, M., Malbert, N., Labat, N., Carisetti, D., Perdu, P., Cl\u00e9ment, J.C., Lambert, B., Bonnet, M.: Analysis of traps effect on AlGaN\/GaN HEMT by luminescence techniques. Microelectronics Reliability\u00a048, 1366 (2008)","journal-title":"Microelectronics Reliability"},{"key":"53_CR2","doi-asserted-by":"publisher","first-page":"7353","DOI":"10.1063\/1.361424","volume":"79","author":"J. Lai","year":"1996","unstructured":"Lai, J., Majumdar, A.: Concurent thermal and electrical modeling of submicrometer silicon devices. Journ. of Appl. Phys.\u00a079, 7353 (1996)","journal-title":"Journ. of Appl. Phys."},{"key":"53_CR3","doi-asserted-by":"publisher","first-page":"6686","DOI":"10.1063\/1.359082","volume":"77","author":"A. Majumdar","year":"1995","unstructured":"Majumdar, A., Fushinobu, K., Hijikata, K.: Effect of gate voltage on hot electron and hot phonon interaction and transport in a submicrometer transistor. Journ. of Appl. Phys.\u00a077, 6686 (1995)","journal-title":"Journ. of Appl. Phys."},{"issue":"10","key":"53_CR4","doi-asserted-by":"publisher","first-page":"2313","DOI":"10.1002\/pssa.200622101","volume":"203","author":"A. Matulionis","year":"2006","unstructured":"Matulionis, A.: Hot phonons in GaN channels for HEMTs. Phys. Stat. Sol. A\u00a0203(10), 2313 (2006)","journal-title":"Phys. Stat. Sol. A"},{"issue":"6","key":"53_CR5","doi-asserted-by":"publisher","first-page":"1306","DOI":"10.1109\/TED.2008.921263","volume":"55","author":"K. Raleva","year":"2008","unstructured":"Raleva, K., Vasileska, D., Goodnick, S.M., Nedjalkov, M.: Modeling Thermal Effects in Nanodevices. IEEE Trans. on Elec. Devices\u00a055(6), 1306 (2008)","journal-title":"IEEE Trans. on Elec. Devices"},{"key":"53_CR6","doi-asserted-by":"publisher","first-page":"236","DOI":"10.1007\/s10825-008-0210-x","volume":"7","author":"S. Sridharan","year":"2008","unstructured":"Sridharan, S., Venkatachalam, A., Yoder, P.D.: Electrothermal analysis of AlGaN\/GaN high electron mobility transistors. Journ. of Compt. Electronics\u00a07, 236 (2008)","journal-title":"Journ. of Compt. Electronics"},{"key":"53_CR7","doi-asserted-by":"publisher","first-page":"112111","DOI":"10.1063\/1.2349315","volume":"89","author":"K.T. Tsen","year":"2006","unstructured":"Tsen, K.T., Kiang, J.G., Ferry, D.K., Morko\u00e7, H.: Subpicosecond time-resolved Raman studies of LO phonons in GaN: Dependence on photoexcited carrier density. Appl. Physc. Lett.\u00a089, 112111 (2006)","journal-title":"Appl. Physc. Lett."}],"container-title":["Lecture Notes in Computer Science","Large-Scale Scientific Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-12535-5_53.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,30]],"date-time":"2021-04-30T11:42:38Z","timestamp":1619782958000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-12535-5_53"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642125348","9783642125355"],"references-count":7,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-12535-5_53","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2010]]}}}