{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T01:10:31Z","timestamp":1740445831882,"version":"3.37.3"},"publisher-location":"Berlin, Heidelberg","reference-count":20,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642155840"},{"type":"electronic","value":"9783642155857"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-15585-7_15","type":"book-chapter","created":{"date-parts":[[2010,8,25]],"date-time":"2010-08-25T01:58:59Z","timestamp":1282701539000},"page":"155-164","source":"Crossref","is-referenced-by-count":1,"title":["A Generic Approach to Run Mutation Analysis"],"prefix":"10.1007","author":[{"given":"Siamak","family":"Haschemi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephan","family":"Wei\u00dfleder","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"doi-asserted-by":"crossref","unstructured":"Schuler, D., Zeller, A.: (Un-)Covering Equivalent Mutants. In: 3rd International Conference on Software Testing, Verification, and Validation (ICST) (April 2010)","key":"15_CR1","DOI":"10.1109\/ICST.2010.30"},{"unstructured":"Haschemi, S.: MuUnit (2010), http:\/\/code.google.com\/p\/muunit\/","key":"15_CR2"},{"key":"15_CR3","doi-asserted-by":"publisher","first-page":"81","DOI":"10.1109\/ASE.2000.873653","volume-title":"ASE 2000: Proceedings of the 15th IEEE International Conference on Automated Software Engineering, Washington, DC, USA","author":"P.E. Black","year":"2000","unstructured":"Black, P.E., Okun, V., Yesha, Y.: Mutation operators for specifications. In: ASE 2000: Proceedings of the 15th IEEE International Conference on Automated Software Engineering, Washington, DC, USA, p. 81. IEEE Computer Society, Los Alamitos (2000)"},{"key":"15_CR4","doi-asserted-by":"crossref","first-page":"402","DOI":"10.1145\/1062455.1062530","volume-title":"ICSE 2005: Proceedings of the 27th International Conference on Software Engineering","author":"J.H. Andrews","year":"2005","unstructured":"Andrews, J.H., Briand, L.C., Labiche, Y.: Is mutation an appropriate tool for testing experiments? In: ICSE 2005: Proceedings of the 27th International Conference on Software Engineering, pp. 402\u2013411. ACM, New York (2005)"},{"issue":"4","key":"15_CR5","doi-asserted-by":"publisher","first-page":"279","DOI":"10.1109\/TSE.1977.231145","volume":"3","author":"R.G. Hamlet","year":"1977","unstructured":"Hamlet, R.G.: Testing Programs with the Aid of a Compiler. IEEE Transactions on Software Engineering\u00a03(4), 279\u2013290 (1977)","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"4","key":"15_CR6","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"R.A. DeMillo","year":"1978","unstructured":"DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Hints on Test Data Selection: Help for the Practicing Programmer. Computer Journal\u00a011(4), 34\u201341 (1978)","journal-title":"Computer Journal"},{"issue":"1","key":"15_CR7","doi-asserted-by":"publisher","first-page":"5","DOI":"10.1145\/125489.125473","volume":"1","author":"A.J. Offutt","year":"1992","unstructured":"Offutt, A.J.: Investigations of the Software Testing Coupling Effect. ACM Transactions on Software Engineering and Methodology\u00a01(1), 5\u201320 (1992)","journal-title":"ACM Transactions on Software Engineering and Methodology"},{"issue":"5","key":"15_CR8","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1109\/32.286422","volume":"20","author":"A.J. Offutt","year":"1994","unstructured":"Offutt, A.J., Lee, S.D.: An Empirical Evaluation of Weak Mutation. IEEE Transactions on Software Engineering\u00a020(5), 337\u2013344 (1994)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"15_CR9","doi-asserted-by":"publisher","first-page":"177","DOI":"10.1145\/29650.29669","volume-title":"SIGPLAN 1987: Papers of the Symposium on Interpreters and Interpretive Techniques","author":"V..A.J. Offutt","year":"1987","unstructured":"Offutt, VI, A.J., King, K.N.: A Fortran 77 Interpreter for Mutation Analysis. In: SIGPLAN 1987: Papers of the Symposium on Interpreters and Interpretive Techniques, pp. 177\u2013188. ACM, New York (1987)"},{"doi-asserted-by":"crossref","unstructured":"Irvine, S.A., Pavlinic, T., Trigg, L., Cleary, J.G., Inglis, S.J., Utting, M.: Jumble Java Byte Code to Measure the Effectiveness of Unit Tests. In: TAICPART-MUTATION: Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (2007)","key":"15_CR10","DOI":"10.1109\/TAIC.PART.2007.38"},{"unstructured":"Zschau, J., Gasparini, P., Papadopoulos, G., Filangieri, A.R., Fleming, K.: The SAFER\u00a0Consortium: SAFER - Seismic eArly warning For EuRope. In: EGU General Assembly, Vienna, Austria (April 2007) (poster)","key":"15_CR11"},{"unstructured":"OSGi Alliance: OSGi Service Platform Core Specification, V4.1 (April 2007)","key":"15_CR12"},{"doi-asserted-by":"crossref","unstructured":"Smith, B.H., Williams, L.: An Empirical Evaluation of the MuJava Mutation Operators. In: TAICPART-MUTATION: Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (2007)","key":"15_CR13","DOI":"10.1109\/TAIC.PART.2007.12"},{"key":"15_CR14","volume-title":"EMF: Eclipse Modeling Framework","author":"D. Steinberg","year":"2009","unstructured":"Steinberg, D., Budinsky, F., Paternostro, M., Merks, E.: EMF: Eclipse Modeling Framework, 2nd edn. (Eclipse), 2nd (rev. edn.). Addison-Wesley Longman, Amsterdam (January 2009)","edition":"2"},{"key":"15_CR15","doi-asserted-by":"publisher","first-page":"69","DOI":"10.1145\/1572272.1572282","volume-title":"ISSTA 2009: Proceedings of the eighteenth international symposium on Software testing and analysis","author":"D. Schuler","year":"2009","unstructured":"Schuler, D., Dallmeier, V., Zeller, A.: Efficient mutation testing by checking invariant violations. In: ISSTA 2009: Proceedings of the eighteenth international symposium on Software testing and analysis, pp. 69\u201380. ACM, New York (2009)"},{"unstructured":"Eclipse Foundation: Modeling Workflow Engine, http:\/\/wiki.eclipse.org\/Modeling_Workflow_Engine_MWE","key":"15_CR16"},{"key":"15_CR17","volume-title":"JUnit in Action","author":"V. Massol","year":"2003","unstructured":"Massol, V., Husted, T.: JUnit in Action. Manning Publications Co., Greenwich (2003)"},{"key":"15_CR18","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9780511809163","volume-title":"Introduction to Software Testing","author":"P. Ammann","year":"2008","unstructured":"Ammann, P., Offutt, J.: Introduction to Software Testing. Cambridge University Press, New York (2008)"},{"key":"15_CR19","volume-title":"Testing Object-Oriented Systems: Models, Patterns, and Tools","author":"R.V. Binder","year":"1999","unstructured":"Binder, R.V.: Testing Object-Oriented Systems: Models, Patterns, and Tools. Addison-Wesley Longman Publishing Co., Inc., Amsterdam (1999)"},{"key":"15_CR20","doi-asserted-by":"publisher","first-page":"608","DOI":"10.1109\/TSE.2006.83","volume":"32","author":"J.H. Andrews","year":"2006","unstructured":"Andrews, J.H., Briand, L.C., Labiche, Y., Namin, A.S.: Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria. IEEE Transactions on Software Engineering\u00a032, 608\u2013624 (2006)","journal-title":"IEEE Transactions on Software Engineering"}],"container-title":["Lecture Notes in Computer Science","Testing \u2013 Practice and Research Techniques"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-15585-7_15.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T00:46:22Z","timestamp":1740444382000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-15585-7_15"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642155840","9783642155857"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-15585-7_15","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2010]]}}}