{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:12:45Z","timestamp":1725567165564},"publisher-location":"Berlin, Heidelberg","reference-count":9,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642162381"},{"type":"electronic","value":"9783642162398"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-16239-8_42","type":"book-chapter","created":{"date-parts":[[2010,9,30]],"date-time":"2010-09-30T23:14:43Z","timestamp":1285888483000},"page":"319-327","source":"Crossref","is-referenced-by-count":2,"title":["Statistical Fault Localization with Reduced Program Runs"],"prefix":"10.1007","author":[{"given":"Lina","family":"Hong","sequence":"first","affiliation":[]},{"given":"Rong","family":"Chen","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"doi-asserted-by":"crossref","unstructured":"Jones, J.A., Harrold, M.J., Stasko, J.: Visualization of test information to assist fault localization. In: Proceedings of the 24th International Conference on Software Engineering, pp. 467\u2013477 (2002)","key":"42_CR1","DOI":"10.1145\/581396.581397"},{"unstructured":"Renieris, M., Reiss, S.P.: Fault localization with nearest neighbor queries (2003)","key":"42_CR2"},{"key":"42_CR3","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"80","DOI":"10.1007\/11688839_7","volume-title":"Compiler Construction","author":"L. Guo","year":"2006","unstructured":"Guo, L., Roychoudhury, A., Wang, T.: Accurately choosing execution runs for software fault localization. In: Mycroft, A., Zeller, A. (eds.) CC 2006. LNCS, vol.\u00a03923, pp. 80\u201395. Springer, Heidelberg (2006)"},{"key":"42_CR4","doi-asserted-by":"publisher","first-page":"347","DOI":"10.1145\/1101908.1101966","volume-title":"ASE 2005: Proceedings of the 20th IEEE\/ACM international Conference on Automated software engineering","author":"T. Wang","year":"2005","unstructured":"Wang, T., Roychoudhury, A.: Automated path generation for software fault localization. In: ASE 2005: Proceedings of the 20th IEEE\/ACM international Conference on Automated software engineering, pp. 347\u2013351. ACM, New York (2005)"},{"key":"42_CR5","doi-asserted-by":"publisher","first-page":"273","DOI":"10.1145\/1101908.1101949","volume-title":"ASE 2005: Proceedings of the 20th IEEE\/ACM international Conference on Automated software engineering","author":"J.A. Jones","year":"2005","unstructured":"Jones, J.A., Harrold, M.J.: Empirical evaluation of the tarantula automatic fault-localization technique. In: ASE 2005: Proceedings of the 20th IEEE\/ACM international Conference on Automated software engineering, pp. 273\u2013282. ACM, New York (2005)"},{"key":"42_CR6","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1145\/1065010.1065014","volume-title":"PLDI 2005: Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation","author":"B. Liblit","year":"2005","unstructured":"Liblit, B., Naik, M., Zheng, A.X., Aiken, A., Jordan, M.I.: Scalable statistical bug isolation. In: PLDI 2005: Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation, pp. 15\u201326. ACM, New York (2005)"},{"issue":"5","key":"42_CR7","doi-asserted-by":"publisher","first-page":"286","DOI":"10.1145\/1095430.1081753","volume":"30","author":"C. Liu","year":"2005","unstructured":"Liu, C., Yan, X., Fei, L., Han, J., Midkiff, S.P.: Sober: statistical model-based bug localization. SIGSOFT Softw. Eng. Notes\u00a030(5), 286\u2013295 (2005)","journal-title":"SIGSOFT Softw. Eng. Notes"},{"key":"42_CR8","doi-asserted-by":"publisher","first-page":"319","DOI":"10.1145\/24039.24041","volume":"9","author":"J. Ferrante","year":"1987","unstructured":"Ferrante, J., Ottenstein, K.J., Warren, J.D.: The program dependence graph and its use in optimization. ACM Transactions on Programming Languages and Systems\u00a09, 319\u2013349 (1987)","journal-title":"ACM Transactions on Programming Languages and Systems"},{"key":"42_CR9","doi-asserted-by":"publisher","first-page":"141","DOI":"10.1145\/781131.781148","volume-title":"PLDI 2003: Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation","author":"B. Liblit","year":"2003","unstructured":"Liblit, B., Aiken, A., Zheng, A.X., Jordan, M.I.: Bug isolation via remote program sampling. In: PLDI 2003: Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation, pp. 141\u2013154. ACM, New York (2003)"}],"container-title":["IFIP Advances in Information and Communication Technology","Artificial Intelligence Applications and Innovations"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-16239-8_42.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,30]],"date-time":"2021-04-30T08:24:39Z","timestamp":1619771079000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-16239-8_42"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642162381","9783642162398"],"references-count":9,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-16239-8_42","relation":{},"ISSN":["1868-4238","1861-2288"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1861-2288"}],"subject":[],"published":{"date-parts":[[2010]]}}}