{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T12:39:59Z","timestamp":1768480799289,"version":"3.49.0"},"publisher-location":"Berlin, Heidelberg","reference-count":15,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"value":"9783642173127","type":"print"},{"value":"9783642173134","type":"electronic"}],"license":[{"start":{"date-parts":[[2010,1,1]],"date-time":"2010-01-01T00:00:00Z","timestamp":1262304000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-17313-4_35","type":"book-chapter","created":{"date-parts":[[2010,11,11]],"date-time":"2010-11-11T17:09:54Z","timestamp":1289495394000},"page":"356-367","source":"Crossref","is-referenced-by-count":46,"title":["Predicting Defect Priority Based on Neural Networks"],"prefix":"10.1007","author":[{"given":"Lian","family":"Yu","sequence":"first","affiliation":[]},{"given":"Wei-Tek","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Wei","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Fang","family":"Wu","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"35_CR1","doi-asserted-by":"crossref","unstructured":"Rothermel, G., Untch, R.H., Chu, C., Harrold, M.J.: Prioritizing Test Cases for Regression Testing. IEEE Transactions on Software Engineering (2001)","DOI":"10.1109\/32.962562"},{"key":"35_CR2","unstructured":"Dawson, E., David, Y.C., Seth, H.: Bugs as Deviant Behavior: A General Approach to Inferring Errors in Systems Code (2003)"},{"key":"35_CR3","unstructured":"Miguel, R., Paulo, C., Jos\u00e9, N.: Evolution of neural networks for classification and regression. Neurocomputing (2007)"},{"key":"35_CR4","unstructured":"David, H., William, P.: Finding Bugs is Easy. ACM SIGPLAN Notices (2004)"},{"key":"35_CR5","volume-title":"Static and dynamic analysis: synergy and duality","author":"D. Michael","year":"2005","unstructured":"Michael, D.: Static and dynamic analysis: synergy and duality. IEEE Computer Society, Los Alamitos (2005)"},{"key":"35_CR6","unstructured":"The Byte Code Engineering Library, http:\/\/jakarta.apache.org\/bcel\/2003"},{"key":"35_CR7","unstructured":"Ted, K., Dawson, E.: Using Statistical Analysis to Counter the Impact of Static Analysis Approximations. In: 10th International Symposium (2003)"},{"key":"35_CR8","doi-asserted-by":"crossref","unstructured":"Thomas, J., Ostrand, E.J., Weyuker, R.M.: Predicting the Location and Number of Faults in Large Software Systems. IEEE Transactions on Software Engineering (2005)","DOI":"10.1109\/TSE.2005.49"},{"key":"35_CR9","doi-asserted-by":"crossref","unstructured":"Khoshgoftaar, T.M., Allen, E.B., Kalaichelva, K.S.: Early Quality Prediction: A Case Study in Telecommunications, IEEE Software, pp. 65\u201371 (1996)","DOI":"10.1109\/52.476287"},{"key":"35_CR10","doi-asserted-by":"publisher","first-page":"653","DOI":"10.1109\/32.859533","volume":"26","author":"T.L. Graves","year":"2000","unstructured":"Graves, T.L., Karr, A.F., Marron, J.S.: Predicting Fault Incidence Using Software Change History. IEEE Tran., Software Reliability Eng.\u00a026, 653\u2013661 (2000)","journal-title":"IEEE Tran., Software Reliability Eng."},{"key":"35_CR11","volume-title":"The Data Mining Approach to Automated Software Testing","author":"L. Mark","year":"2003","unstructured":"Mark, L., Menahem, F., Abraham, K.: The Data Mining Approach to Automated Software Testing. ACM, New York (2003)"},{"key":"35_CR12","doi-asserted-by":"crossref","unstructured":"Kremenek, T., Ashcraft, K., Yang, J.: Correlation Exploitation in Error Ranking. In: Proceedings of the 12th ACM SIGSOFT Twelfth International (2004)","DOI":"10.1145\/1029894.1029909"},{"key":"35_CR13","doi-asserted-by":"crossref","unstructured":"Bush, W., Pincus, J., Sielaff, D.: A static analyzer for finding dynamic programming errors. In: Software: Practice and Experience, pp. 775\u2013802 (2000)","DOI":"10.1002\/(SICI)1097-024X(200006)30:7<775::AID-SPE309>3.0.CO;2-H"},{"key":"35_CR14","doi-asserted-by":"crossref","unstructured":"Hallem, S., Chelf, B., Xie, Y.: A system and language for building system-specific, static analysis. In: PLDI (2002)","DOI":"10.21236\/ADA419593"},{"key":"35_CR15","unstructured":"Hallem, S., Lam, M.S.: Tracking down software bugs using automatic anomaly detection. In: International Conference on Software Engineering (2002)"}],"container-title":["Lecture Notes in Computer Science","Advanced Data Mining and Applications"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-17313-4_35","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,6]],"date-time":"2019-06-06T02:53:22Z","timestamp":1559789602000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-17313-4_35"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642173127","9783642173134"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-17313-4_35","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010]]}}}