{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,6]],"date-time":"2025-03-06T05:22:33Z","timestamp":1741238553797,"version":"3.38.0"},"publisher-location":"Berlin, Heidelberg","reference-count":10,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642212260"},{"type":"electronic","value":"9783642212277"}],"license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-21227-7_29","type":"book-chapter","created":{"date-parts":[[2011,5,16]],"date-time":"2011-05-16T11:07:52Z","timestamp":1305544072000},"page":"306-316","source":"Crossref","is-referenced-by-count":0,"title":["Degradation Based Blind Image Quality Evaluation"],"prefix":"10.1007","author":[{"given":"Ville","family":"Ojansivu","sequence":"first","affiliation":[]},{"given":"Leena","family":"Lepist\u00f6","sequence":"additional","affiliation":[]},{"given":"Martti","family":"Ilmoniemi","sequence":"additional","affiliation":[]},{"given":"Janne","family":"Heikkil\u00e4","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"29_CR1","doi-asserted-by":"crossref","unstructured":"Crete, F., Dolmiere, T., Ladret, P., Nicolas, M.: The blur effect: Perception and estimation with a new no-reference perceptual blur metric. In: Proc. SPIE, vol.\u00a06492 (2007)","DOI":"10.1117\/12.702790"},{"key":"29_CR2","doi-asserted-by":"publisher","first-page":"185","DOI":"10.1111\/j.1365-2818.1982.tb00412.x","volume":"27","author":"S.J. Erasmus","year":"1982","unstructured":"Erasmus, S.J., Smith, K.C.A.: An automatic focusing and astigmatism correction system for the sem and ctem. Journal of Microscopy\u00a027, 185\u2013199 (1982)","journal-title":"Journal of Microscopy"},{"key":"29_CR3","doi-asserted-by":"crossref","unstructured":"Ferzli, R., Karam, L.J.: No-reference objective wavelet based noise immune image sharpness metric. In: IEEE International Conference on Image Processing, pp. 405\u2013408 (2005)","DOI":"10.1109\/ICIP.2005.1529773"},{"issue":"4","key":"29_CR4","doi-asserted-by":"publisher","first-page":"717","DOI":"10.1109\/TIP.2008.2011760","volume":"18","author":"R. Ferzli","year":"2009","unstructured":"Ferzli, R., Karam, L.J.: A no-reference objective image sharpness metric based on the notion of just noticeable blur (JNB). IEEE Trans. Image Processing\u00a018(4), 717\u2013728 (2009)","journal-title":"IEEE Trans. Image Processing"},{"key":"29_CR5","unstructured":"Ke, Y., Tang, X., Jing, F.: The design of high-level features for photo quality assessment. In: IEEE Conference on Computer Vision and Pattern Recognition, New York, NY, pp. 419\u2013426 (June 2006)"},{"key":"29_CR6","doi-asserted-by":"crossref","unstructured":"Liu, R.T., Li, Z.R., Jia, J.Y.: Image partial blur detection and classification. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 1\u20138 (2008)","DOI":"10.1109\/CVPR.2008.4587465"},{"issue":"11","key":"29_CR7","doi-asserted-by":"publisher","first-page":"1918","DOI":"10.1109\/TIP.2005.854492","volume":"14","author":"H.R. Sheikh","year":"2005","unstructured":"Sheikh, H.R., Bovik, A.C., Cormack, L.: No-reference quality assessment using natural scene statistics: JPEG 2000. IEEE Trans. Image Processing\u00a014(11), 1918\u20131927 (2005)","journal-title":"IEEE Trans. Image Processing"},{"issue":"1","key":"29_CR8","first-page":"27","volume":"2","author":"E. Tsomko","year":"2008","unstructured":"Tsomko, E., Kim, H.J., Paik, J., Yeo, I.K.: Efficient method of detecting blurry images. Journal of Ubiquitous Convergence Technology\u00a02(1), 27\u201339 (2008)","journal-title":"Journal of Ubiquitous Convergence Technology"},{"key":"29_CR9","doi-asserted-by":"crossref","unstructured":"Varadarajan, S., Karam, L.J.: An improved perception-based no-reference objective image sharpness metric using iterative edge refinement. In: IEEE International Conference on Image Processing, pp. 401\u2013404 (2008)","DOI":"10.1109\/ICIP.2008.4711776"},{"key":"29_CR10","doi-asserted-by":"crossref","unstructured":"Zhu, X., Milanfar, P.: A no-reference sharpness metric sensitive to blur and noise. In: International Workshop on Quality of Multimedia Experience, pp. 64\u201369 (2009)","DOI":"10.1109\/QOMEX.2009.5246976"}],"container-title":["Lecture Notes in Computer Science","Image Analysis"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-21227-7_29","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,5]],"date-time":"2025-03-05T15:09:12Z","timestamp":1741187352000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-21227-7_29"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642212260","9783642212277"],"references-count":10,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-21227-7_29","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2011]]}}}