{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:32:51Z","timestamp":1725593571371},"publisher-location":"Berlin, Heidelberg","reference-count":16,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642222023"},{"type":"electronic","value":"9783642222030"}],"license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-22203-0_23","type":"book-chapter","created":{"date-parts":[[2011,6,28]],"date-time":"2011-06-28T00:26:28Z","timestamp":1309220788000},"page":"266-273","source":"Crossref","is-referenced-by-count":1,"title":["Parametric Software Metric"],"prefix":"10.1007","author":[{"given":"Won","family":"Shin","sequence":"first","affiliation":[]},{"given":"Tae-Wan","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Doo-Hyun","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Chun-Hyon","family":"Chang","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"23_CR1","doi-asserted-by":"crossref","unstructured":"Scotto, M., Sillitti, A.: A relational approach to software metrics. In: Proc. of the 2004 ACM symposium on Applied computing, pp. 1536\u20131540 (2004)","DOI":"10.1145\/967900.968207"},{"key":"23_CR2","doi-asserted-by":"crossref","unstructured":"Umarji, M., Seaman, C.: Gauging acceptance of software metrics: Comparing perspectives of managers and developers. In: 3rd Int. Symposium on Empirical Software Engineering and Measurement (ESEM 2009), pp. 236\u2013247 (2009)","DOI":"10.1109\/ESEM.2009.5315999"},{"key":"23_CR3","unstructured":"Fenton, N.: New Directions for Software Metrics. In: Keynote Talk CIO Symposium on Software Best Practices, pp. 1\u201321 (2006)"},{"issue":"1","key":"23_CR4","doi-asserted-by":"publisher","first-page":"77","DOI":"10.1145\/181610.181625","volume":"19","author":"J.M. Roche","year":"1994","unstructured":"Roche, J.M.: Roche.: Software Metrics and Measurement Principles. ACM SIGSOFT Software Engineering Notes\u00a019(1), 77\u201385 (1994)","journal-title":"ACM SIGSOFT Software Engineering Notes"},{"key":"23_CR5","volume-title":"Software Measurement and Estimations: A Practical Approach","author":"M. Linda","year":"2006","unstructured":"Linda, M., Laird, M., Brennan, C.: Software Measurement and Estimations: A Practical Approach. Wiley-IEEE Computer Society Press, Chichester (2006)"},{"key":"23_CR6","unstructured":"Fenton, N.E., pfleeger, S.L.: Software Metrics: A Rigorous and Practical Approach, 2nd edn. PWS Publishing Co (1997)"},{"key":"23_CR7","unstructured":"Quality Assurance and Metrics, http:\/\/www.eecs.qmul.ac.kr\/~norman\/papers\/qa_metrics_artical\/index_qa_met.htm"},{"key":"23_CR8","unstructured":"Kaur, A., Singh, S.: Empirical Analysis of CK & MOOD Metric Suit. Int. Journal of Innovation, Management and Technology\u00a01(5) (2010)"},{"key":"23_CR9","volume-title":"10th Int. Software Metrics Symposium(METRICS 2004)","author":"C. Kaner","year":"2004","unstructured":"Kaner, C., Bond, W.: Software engineering metrics: What do they measure and how do we know? In: 10th Int. Software Metrics Symposium(METRICS 2004). IEEE Computer Society Press, Los Alamitos (2004)"},{"issue":"5","key":"23_CR10","doi-asserted-by":"publisher","first-page":"51","DOI":"10.1145\/1838687.1838700","volume":"35","author":"G. Canfora","year":"2010","unstructured":"Canfora, G., Concas, G.: 2010 ICSE Workshop on Emerging Trends in Software Metrics. ACM SIGSOFT Software Engineering Notes\u00a035(5), 51\u201353 (2010)","journal-title":"ACM SIGSOFT Software Engineering Notes"},{"key":"23_CR11","doi-asserted-by":"crossref","unstructured":"Lincke, R., Lundberg, J.: Comparing software metrics tools. In: Proc. of the 2008 international symposium on Software testing and analysis, pp. 131\u2013142 (2008)","DOI":"10.1145\/1390630.1390648"},{"key":"23_CR12","first-page":"99","volume-title":"3rd International Workshop on Worst-Case Execution Time Analysis","author":"B. Lisper","year":"2003","unstructured":"Lisper, B.: Fully automatic, parametric worst-case execution time analysis. In: 3rd International Workshop on Worst-Case Execution Time Analysis, pp. 99\u2013102. Polytechnic Institute of Porto, Portugal (2003)"},{"key":"23_CR13","doi-asserted-by":"publisher","first-page":"88","DOI":"10.1145\/384197.384230","volume-title":"Workshop on Language, Compilers, and Tools for Embedded Systems","author":"E. Vivancos","year":"2001","unstructured":"Vivancos, E., Healy, C., Mueller, F., Whalley, D.: Parametric Timing Analysis. In: Workshop on Language, Compilers, and Tools for Embedded Systems, vol.\u00a036(8), pp. 88\u201393. ACM Press, New York (2001)"},{"issue":"7","key":"23_CR14","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1016\/S1474-6670(17)39931-7","volume":"33","author":"Guillem Bernat","year":"2000","unstructured":"Bernat, G., Burns, A.: An Approach To Symbolic Worst-Case Execution Time Analysis. In: Proc. 25th IFAC Workshop on Real-Time Programming (2000)","journal-title":"IFAC Proceedings Volumes"},{"key":"23_CR15","doi-asserted-by":"crossref","unstructured":"Coffman, J., Healy, C., Mueller, F., Whalley, D.: Generalizing parametric timing analysis. In: Proc. of the 2007 ACM SIGPLAN\/SIGBED Conference on LCTES 2007, vol.\u00a042(7), pp. 152\u2013154 (2007)","DOI":"10.1145\/1273444.1254795"},{"key":"23_CR16","unstructured":"WCET project, http:\/\/www.mrtc.mdh.se\/projects\/wcet\/benchmarks.html"}],"container-title":["Communications in Computer and Information Science","Software Engineering and Computer Systems"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-22203-0_23","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,12]],"date-time":"2019-06-12T12:19:03Z","timestamp":1560341943000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-22203-0_23"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642222023","9783642222030"],"references-count":16,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-22203-0_23","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2011]]}}}