{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T06:57:15Z","timestamp":1725605835473},"publisher-location":"Berlin, Heidelberg","reference-count":28,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642223853"},{"type":"electronic","value":"9783642223860"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-22386-0_20","type":"book-chapter","created":{"date-parts":[[2011,9,9]],"date-time":"2011-09-09T14:32:25Z","timestamp":1315578745000},"page":"261-274","source":"Crossref","is-referenced-by-count":3,"title":["A Framework for Defect Prediction in Specific Software Project Contexts"],"prefix":"10.1007","author":[{"given":"Dindin","family":"Wahyudin","sequence":"first","affiliation":[]},{"given":"Rudolf","family":"Ramler","sequence":"additional","affiliation":[]},{"given":"Stefan","family":"Biffl","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"20_CR1","unstructured":"Basili, V., Caldiera, G., Rombach, H.D.: The Goal Question Metric Approach. \u00a02, 6 (1994)"},{"key":"20_CR2","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1109\/32.815326","volume":"25","author":"N. Fenton","year":"1999","unstructured":"Fenton, N., Neil, M.: A Critique of Software Defect Prediction Models. IEEE Trans. Softw. Eng.\u00a025, 15 (1999)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"20_CR3","doi-asserted-by":"publisher","first-page":"8","DOI":"10.1109\/32.859533","volume":"26","author":"T.L. Graves","year":"2000","unstructured":"Graves, T.L., Karr, A.F., Marron, J.S., Siy, H.: Predicting fault incidence using software change history. IEEE Transactions on Software Engineering\u00a026, 8 (2000)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"20_CR4","doi-asserted-by":"publisher","first-page":"5","DOI":"10.1109\/24.159804","volume":"41","author":"T. Khoshgoftaar","year":"1992","unstructured":"Khoshgoftaar, T., Bhattacharyya, B., Richardson, G.: Predicting Software Errors, During Development, Using Nonlinear Regression Models: A Comparative Study. IEEE Transaction on Reliability\u00a041, 5 (1992)","journal-title":"IEEE Transaction on Reliability"},{"key":"20_CR5","unstructured":"Kitchenham, B.: Guidelines for performing Systematic Literature Reviews in Software Engineering (2007)"},{"key":"20_CR6","volume-title":"Proceedings of the 28th International Conference on Software Engineering","author":"B. Kitchenham","year":"2006","unstructured":"Kitchenham, B., Kutay, C., Jeffery, R., Connaughton, C.: Lessons learnt from the analysis of large-scale corporate databases. In: Proceedings of the 28th International Conference on Software Engineering. ACM, Shanghai (2006)"},{"key":"20_CR7","doi-asserted-by":"publisher","first-page":"316","DOI":"10.1109\/TSE.2007.1001","volume":"33","author":"B.A. Kitchenham","year":"2007","unstructured":"Kitchenham, B.A., Mendes, E., Travassos, G.H.: Cross versus Within-Company Cost Estimation Studies: A Systematic Review. IEEE Transactions on Software Engineering\u00a033, 316\u2013329 (2007)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"20_CR8","doi-asserted-by":"publisher","first-page":"23","DOI":"10.1109\/MS.2005.149","volume":"22","author":"A.G. Koru","year":"2005","unstructured":"Koru, A.G., Hongfang, L.: Building Defect Prediction Models in Practice. IEEE Softw.\u00a022, 23\u201329 (2005)","journal-title":"IEEE Softw."},{"key":"20_CR9","volume-title":"The 16th IEEE International Symposium on Software Reliability Engineering","author":"P.L. Li","year":"2005","unstructured":"Li, P.L., Herbsleb, J., Shaw, M.: Forecasting Field Defect Rates Using a Combined Time-Based and Metrics-Based Approach: A Case Study of OpenBSD. In: The 16th IEEE International Symposium on Software Reliability Engineering, IEEE Computer Society, Los Alamitos (2005)"},{"key":"20_CR10","volume-title":"Proceedings of the 28th International Conference on Software Engineering","author":"P.L. Li","year":"2006","unstructured":"Li, P.L., Herbsleb, J., Shaw, M., Robinson, B.: Experiences and results from initiating field defect prediction and product test prioritization efforts at ABB Inc. In: Proceedings of the 28th International Conference on Software Engineering. ACM, Shanghai (2006)"},{"key":"20_CR11","volume-title":"The 28th International Conference on Software Engineering","author":"P.L. Li","year":"2006","unstructured":"Li, P.L., Herbsleb, J., Shaw, M., Robinson, B.: Experiences and results from initiating field defect prediction and product test prioritization efforts at ABB Inc. In: The 28th International Conference on Software Engineering. ACM, Shanghai (2006)"},{"key":"20_CR12","volume-title":"Proceedings of the 9th International Symposium on Software Metrics","author":"T. Menzies","year":"2003","unstructured":"Menzies, T., Di Stefano, J., Ammar, K., McGill, K., Callis, P., Chapman, R., Davis, J.: When Can We Test Less? In: Proceedings of the 9th International Symposium on Software Metrics. IEEE Computer Society, Los Alamitos (2003)"},{"key":"20_CR13","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TSE.2007.256941","volume":"33","author":"T. Menzies","year":"2007","unstructured":"Menzies, T., Greenwald, J., Frank, A.: Data Mining Static Code Attributes to Learn Defect Predictors. IEEE Transactions on Software Engineering\u00a033, 2\u201313 (2007)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"20_CR14","volume-title":"The 30th International Conference on Software Engineering","author":"R. Moser","year":"2008","unstructured":"Moser, R., Pedrycz, W., Succi, G.: A Comparative Analysis of the Efficiency of Change Metrics and Static Code Attributes for Defect Prediction. In: The 30th International Conference on Software Engineering. ACM, Leipzig (2008)"},{"key":"20_CR15","volume-title":"Applied Linear Regression Models","author":"C.J. Nachtsheim","year":"2004","unstructured":"Nachtsheim, C.J., Kutner, M.H.: Applied Linear Regression Models. McGraw-Hill Education, New York (2004)"},{"key":"20_CR16","volume-title":"The 27th International Conference on Software Engineering","author":"N. Nagappan","year":"2005","unstructured":"Nagappan, N., Ball, T.: Use of relative code churn measures to predict system defect density. In: The 27th International Conference on Software Engineering. ACM, St. Louis (2005)"},{"key":"20_CR17","volume-title":"The 28th International Conference on Software Engineering","author":"N. Nagappan","year":"2006","unstructured":"Nagappan, N., Ball, T., Zeller, A.: Mining metrics to predict component failures. In: The 28th International Conference on Software Engineering. ACM, Shanghai (2006)"},{"key":"20_CR18","doi-asserted-by":"crossref","first-page":"452","DOI":"10.1145\/1134285.1134349","volume-title":"Proceedings of the 28th International Conference on Software Engineering","author":"N. Nagappan","year":"2006","unstructured":"Nagappan, N., Ball, T., Zeller, A.: Mining metrics to predict component failures. In: Proceedings of the 28th International Conference on Software Engineering, pp. 452\u2013461. ACM, New York (2006)"},{"key":"20_CR19","doi-asserted-by":"publisher","first-page":"402","DOI":"10.1109\/TSE.2007.1015","volume":"33","author":"H.M. Olague","year":"2007","unstructured":"Olague, H.M., Etzkorn, L.H., Gholston, S., Quattlebaum, S.: Empirical Validation of Three Software Metrics Suites to Predict Fault-Proneness of Object-Oriented Classes Developed Using Highly Iterative or Agile Software Development Processes. IEEE Transactions on Software Engineering\u00a033, 402\u2013419 (2007)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"20_CR20","volume-title":"Fourth International Workshop on Software Quality Assurance: in Conjunction with the 6th ESEC\/FSE Joint Meeting","author":"T.J. Ostrand","year":"2007","unstructured":"Ostrand, T.J., Weyuker, E.J.: How to measure success of fault prediction models. In: Fourth International Workshop on Software Quality Assurance: in Conjunction with the 6th ESEC\/FSE Joint Meeting. ACM, Dubrovnik (2007)"},{"key":"20_CR21","volume-title":"Proceedings of the 2007 International Symposium on Software Testing and Analysis","author":"T.J. Ostrand","year":"2007","unstructured":"Ostrand, T.J., Weyuker, E.J., Bell, R.M.: Automating algorithms for the identification of fault-prone files. In: Proceedings of the 2007 International Symposium on Software Testing and Analysis. ACM, London (2007)"},{"key":"20_CR22","doi-asserted-by":"publisher","first-page":"675","DOI":"10.1109\/TSE.2007.70722","volume":"33","author":"G.J. Pai","year":"2007","unstructured":"Pai, G.J., Dugan, J.B.: Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. IEEE Transactions on Software Engineering\u00a033, 675\u2013686 (2007)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"20_CR23","doi-asserted-by":"crossref","unstructured":"Ramler, R., Wolfmaier, K.: Issues and Effort in Integrating Data from Heterogeneous Software Repositories and Corporate Databases. In: 2nd International Symposium on Empirical Software Engineering and Measurement (ESEM 2008), Kaiserslautern, Germany (2008) (forthcoming)","DOI":"10.1145\/1414004.1414071"},{"key":"20_CR24","doi-asserted-by":"publisher","first-page":"1425","DOI":"10.1016\/j.jss.2006.09.046","volume":"80","author":"M. Staples","year":"2007","unstructured":"Staples, M., Niazi, M.: Experiences using systematic review guidelines. Journal of Systems and Software\u00a080, 1425\u20131437 (2007)","journal-title":"Journal of Systems and Software"},{"key":"20_CR25","volume-title":"Proceedings of the 29th International Conference on Software Engineering","author":"K. Sunghun","year":"2007","unstructured":"Sunghun, K., Thomas, Z., James, E., Whitehead, J., Andreas, Z.: Predicting Faults from Cached History. In: Proceedings of the 29th International Conference on Software Engineering. IEEE Computer Society, Los Alamitos (2007)"},{"key":"20_CR26","doi-asserted-by":"crossref","unstructured":"Wahyudin, D., Winkler, D., Schatten, A., Tjoa, A.M., Biffl, S.: Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source \u201cApache\u201d MyFaces Project Family. In: 34th EUROMICRO Conference on Software Engineering and Advanced Applications SPPI Track, Parma, Italy (2008)","DOI":"10.1109\/SEAA.2008.36"},{"key":"20_CR27","volume-title":"The Third International Workshop on Predictor Models in Software Engineering","author":"E.J. Weyuker","year":"2007","unstructured":"Weyuker, E.J., Ostrand, T.J., Bell, R.M.: Using Developer Information as a Factor for Fault Prediction. In: The Third International Workshop on Predictor Models in Software Engineering. IEEE Computer Society, Los Alamitos (2007)"},{"key":"20_CR28","doi-asserted-by":"crossref","unstructured":"Zimmermann, T., Premraj, R., Zeller, A.: Predicting Defects for Eclipse. In: International Workshop on Predictor Models in Software Engineering, PROMISE 2007: ICSE Workshops 2007, pp. 9\u20139 (2007)","DOI":"10.1109\/PROMISE.2007.10"}],"container-title":["Lecture Notes in Computer Science","Software Engineering Techniques"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-22386-0_20.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,3]],"date-time":"2021-12-03T22:23:45Z","timestamp":1638570225000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-22386-0_20"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642223853","9783642223860"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-22386-0_20","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2011]]}}}