{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T07:22:40Z","timestamp":1725607360554},"publisher-location":"Berlin, Heidelberg","reference-count":11,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642237768"},{"type":"electronic","value":"9783642237775"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-23777-5_89","type":"book-chapter","created":{"date-parts":[[2011,9,12]],"date-time":"2011-09-12T16:45:56Z","timestamp":1315845956000},"page":"555-559","source":"Crossref","is-referenced-by-count":4,"title":["Research and Realization of Real-Time Ultrasonic TOFD Scan Imaging System"],"prefix":"10.1007","author":[{"given":"Di","family":"Tang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xingqun","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ling","family":"Xia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"89_CR1","volume-title":"Research Techniques in Non-destructive Testing","author":"M.G. Silk","year":"1977","unstructured":"Silk, M.G.: Sizing crack-like defects by ultrasonic means. In: Sharpe, R.S. (ed.) Research Techniques in Non-destructive Testing, vol.\u00a0III. Academic Press, London (1977)"},{"key":"89_CR2","first-page":"83","volume":"5","author":"M. Shyamal","year":"2000","unstructured":"Shyamal, M., Sattar, T.: An overview TOFD method and its mathematical model. NDT\u00a05, 83\u201387 (2000)","journal-title":"NDT"},{"key":"89_CR3","unstructured":"Lawson, S.: Ultrasonic testing and image processing for in progress weld inspection. Ultrasonic testing online Journal (April 1996)"},{"key":"89_CR4","volume-title":"High Frequency Postgraduate Student Colloquium","author":"O. Zahran","year":"2002","unstructured":"Zahran, O., Shihab, S., Al-Nuaimy, W., et al.: Comparison between Surface Impulse Ground Penetrating Radar Signals and Ultrasonic Time-of-flight-diffraction Signals. In: High Frequency Postgraduate Student Colloquium. IEEE, Los Alamitos (2002)"},{"key":"89_CR5","unstructured":"Li, Y.: The principle and standard introduction of Ultrasound TOFD. Non-destructive Testing\u00a06 (2003)"},{"key":"89_CR6","unstructured":"Liang, Y., Wang, L., Wang, Y.: The Principle Analysis of Ultrasonic TOFD. Non-destructive Testing\u00a032(7) (2010)"},{"key":"89_CR7","volume-title":"Embedded Systems Architecture, Programming and Design","author":"R. Kamal","year":"2006","unstructured":"Kamal, R.: Embedded Systems Architecture, Programming and Design. The McGraw2HiIl Companies, New York (2006)"},{"key":"89_CR8","volume-title":"2010 International Conference on Computer Application and System Modeling (ICCASM 2010)","author":"C.-y. Bi","year":"2010","unstructured":"Bi, C.-y., Liu, Y.-p., Wang, R.-f.: Research of Key Technologies for Embedded Linux Based on ARM. In: 2010 International Conference on Computer Application and System Modeling (ICCASM 2010). IEEE, Los Alamitos (2010)"},{"key":"89_CR9","volume-title":"Embedded Linux application development solutions","author":"Q. Sun","year":"2006","unstructured":"Sun, Q.: Embedded Linux application development solutions. People post and telecommunications publishing company, Beijing (2006)"},{"key":"89_CR10","volume-title":"Linux Device Drivers","author":"J. Corbet","year":"2005","unstructured":"Corbet, J., Rubini, A., Kroah-Hartman, G.: Linux Device Drivers, 3rd edn. O\u2019Reilly Media, Inc., Sebastopol (2005)","edition":"3"},{"key":"89_CR11","volume-title":"Linux drivers design from approaches to master","author":"J. Feng","year":"2008","unstructured":"Feng, J.: Linux drivers design from approaches to master. QingHua university publishing company, Beijing (2008)"}],"container-title":["Advances in Intelligent and Soft Computing","Advances in Computer Science, Intelligent System and Environment"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-23777-5_89.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,5,3]],"date-time":"2021-05-03T11:58:00Z","timestamp":1620043080000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-23777-5_89"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642237768","9783642237775"],"references-count":11,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-23777-5_89","relation":{},"ISSN":["1867-5662","1867-5670"],"issn-type":[{"type":"print","value":"1867-5662"},{"type":"electronic","value":"1867-5670"}],"subject":[],"published":{"date-parts":[[2011]]}}}