{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:06:22Z","timestamp":1725613582978},"publisher-location":"Berlin, Heidelberg","reference-count":8,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642241536"},{"type":"electronic","value":"9783642241543"}],"license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-24154-3_18","type":"book-chapter","created":{"date-parts":[[2011,9,24]],"date-time":"2011-09-24T03:38:58Z","timestamp":1316835538000},"page":"173-179","source":"Crossref","is-referenced-by-count":1,"title":["Chip Level Statistical Leakage Power Estimation Using Generalized Extreme Value Distribution"],"prefix":"10.1007","author":[{"given":"Alireza","family":"Khosropour","sequence":"first","affiliation":[]},{"given":"Hossein","family":"Aghababa","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Afzali-Kusha","sequence":"additional","affiliation":[]},{"given":"Behjat","family":"Forouzandeh","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"18_CR1","doi-asserted-by":"crossref","unstructured":"Borkar, S., Karnik, T., Narendra, S., Tschanz, J., Keshavarzi, A., De, V.: Parameter variations and impact on circuits and microarchitecture. In: IEEE DAC, pp. 338\u2013342 (2003)","DOI":"10.1145\/775832.775920"},{"key":"18_CR2","doi-asserted-by":"crossref","unstructured":"Abu-Dayya, A.A., Beaulieu, N.C.: Comparison of methods of computing correlated lognormal sum distributions and outages for digital wireless applications. In: IEEE 44th Vehicular Technology Conference, vol.\u00a01, pp. 175\u2013179 (1994)","DOI":"10.1109\/VETEC.1994.345143"},{"key":"18_CR3","doi-asserted-by":"crossref","unstructured":"Chang, H., Sapatnekar, S.S.: Full-chip analysis of leakage power under process variations, including spatial correlations. In: Proc. DAC, pp. 523\u2013528 (June 2005)","DOI":"10.1145\/1065579.1065716"},{"key":"18_CR4","doi-asserted-by":"crossref","unstructured":"Rao, R., Srivastava, A., Blaauw, D., Sylvester, D.: Statistical Estimation of Leakage Current Considering Inter- and Intra-Die Process variation. In: International Symposium on Low Power Electronics and Design, pp. 64\u201367 (2002)","DOI":"10.1145\/871506.871530"},{"key":"18_CR5","doi-asserted-by":"crossref","unstructured":"Rao, R., Devgan, A., Blaauw, D., Sylvester, D.: Parametric Yield Estimation Considering Leakage Variability. In: Design Automation Conference, pp. 442\u2013447 (2003)","DOI":"10.1145\/996566.996693"},{"key":"18_CR6","doi-asserted-by":"crossref","unstructured":"Cheng, L., Gupta, P., He, L.: Efficient Additive Statistical Leakage Estimation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\u00a028(11) (November 2009)","DOI":"10.1109\/TCAD.2009.2030433"},{"key":"18_CR7","doi-asserted-by":"crossref","unstructured":"Li, T., Yu, Z.: Statistical analysis of full-chip leakage power considering junction tunneling leakage. In: Proc. DAC, pp. 99\u2013102 (June 2007)","DOI":"10.1109\/DAC.2007.375132"},{"key":"18_CR8","doi-asserted-by":"crossref","unstructured":"Li, X., Le, J., Pileggi, L.: Projection based statistical analysis of full chip leakage power with non-log-normal distributions. In: Proc. DAC, pp. 103\u2013108 (June 2006)","DOI":"10.1145\/1146909.1146941"}],"container-title":["Lecture Notes in Computer Science","Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-24154-3_18","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,16]],"date-time":"2019-06-16T09:39:03Z","timestamp":1560677943000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-24154-3_18"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642241536","9783642241543"],"references-count":8,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-24154-3_18","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2011]]}}}