{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T15:51:20Z","timestamp":1725637880551},"publisher-location":"Berlin, Heidelberg","reference-count":6,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642272066"},{"type":"electronic","value":"9783642272073"}],"license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-27207-3_25","type":"book-chapter","created":{"date-parts":[[2011,12,2]],"date-time":"2011-12-02T14:05:35Z","timestamp":1322834735000},"page":"250-255","source":"Crossref","is-referenced-by-count":0,"title":["The Systematic Practice of Test Design Automation"],"prefix":"10.1007","author":[{"given":"Oksoon","family":"Jeong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"25_CR1","doi-asserted-by":"crossref","unstructured":"Richardson, D.J., Owen O\u2019Malley, T.: Cindy Tittle: Approach to Specification-Based Testing. In: ACM SIGSOFT 1989, TAV3, pp. 86\u201396 (1989)","DOI":"10.1145\/75309.75319"},{"key":"25_CR2","doi-asserted-by":"crossref","unstructured":"Tai, K.C., Lei, Y.: A Test Generation Strategy for Pairwise Testing. IEEE Transactions on Software Engineering\u00a028(1) (2002)","DOI":"10.1109\/32.979992"},{"issue":"10","key":"25_CR3","doi-asserted-by":"publisher","first-page":"1054","DOI":"10.1145\/4372.4375","volume":"28","author":"R. Mandl","year":"1985","unstructured":"Mandl, R.: Orthogonal Latin Squares: An Application of Experimental Design to Compiler Testing. Comm. ACM\u00a028(10), 1054\u20131058 (1985)","journal-title":"Comm. ACM"},{"key":"25_CR4","unstructured":"Lazic, L., Mastorakis, N.: Orthogonal Array application for optimal combination of software defect detection techniques choice. WEAS Trans. Computers\u00a07(8) (August 2008)"},{"key":"25_CR5","doi-asserted-by":"crossref","unstructured":"Cohen, D.M., Dalal, S.R., Fredman, M.L., Patton, G.C.: The AETG System: An Approach to Testing. IEEE Tran. Software Eng. 23(7) (July 1997)","DOI":"10.1109\/32.605761"},{"key":"25_CR6","doi-asserted-by":"crossref","unstructured":"Armstrong, D.B.: On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets. IEEE Tran. Electronic Computer\u00a0EC-15(1) (February 1966)","DOI":"10.1109\/PGEC.1966.264376"}],"container-title":["Communications in Computer and Information Science","Software Engineering, Business Continuity, and Education"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-27207-3_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,20]],"date-time":"2019-06-20T05:41:28Z","timestamp":1561009288000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-27207-3_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642272066","9783642272073"],"references-count":6,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-27207-3_25","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2011]]}}}