{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,14]],"date-time":"2025-06-14T05:23:18Z","timestamp":1749878598502,"version":"3.40.2"},"publisher-location":"Berlin, Heidelberg","reference-count":33,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642288715"},{"type":"electronic","value":"9783642288722"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012]]},"DOI":"10.1007\/978-3-642-28872-2_29","type":"book-chapter","created":{"date-parts":[[2012,3,22]],"date-time":"2012-03-22T20:48:16Z","timestamp":1332449296000},"page":"425-438","source":"Crossref","is-referenced-by-count":14,"title":["Reduction of Test Suites Using Mutation"],"prefix":"10.1007","author":[{"given":"Macario","family":"Polo Usaola","sequence":"first","affiliation":[]},{"given":"Pedro","family":"Reales Mateo","sequence":"additional","affiliation":[]},{"given":"Beatriz","family":"P\u00e9rez Lamancha","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"issue":"4","key":"29_CR1","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"R. DeMillo","year":"1978","unstructured":"DeMillo, R., Lipton, R.J., Sayward, F.G.: Hints on test data selection: Help for the practicing programmer. IEEE Computer\u00a011(4), 34\u201341 (1978)","journal-title":"IEEE Computer"},{"issue":"2","key":"29_CR2","doi-asserted-by":"publisher","first-page":"113","DOI":"10.1002\/stvr.226","volume":"11","author":"E.F. Barbosa","year":"2001","unstructured":"Barbosa, E.F., Maldonado, J.C., Vincenzi, A.M.R.: Toward the determination of sufficient mutant operators for C. Software Testing, Verification and Reliability\u00a011(2), 113\u2013136 (2001)","journal-title":"Software Testing, Verification and Reliability"},{"key":"29_CR3","doi-asserted-by":"publisher","first-page":"165","DOI":"10.1002\/(SICI)1099-1689(199709)7:3<165::AID-STVR143>3.0.CO;2-U","volume":"7","author":"A.J. Offutt","year":"1996","unstructured":"Offutt, A.J., Craft, W.: Using compiler optimization techniques to detect equivalent mutants. Software Testing, Verification and Reliability\u00a07, 165\u2013192 (1996)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"4","key":"29_CR4","doi-asserted-by":"publisher","first-page":"279","DOI":"10.1109\/TSE.1977.231145","volume":"3","author":"R. Hamlet","year":"1977","unstructured":"Hamlet, R.: Testing programs with the help of a compiler. IEEE Transactions on Software Engineering\u00a03(4), 279\u2013290 (1977)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"29_CR5","doi-asserted-by":"publisher","first-page":"205","DOI":"10.1002\/(SICI)1099-1689(199912)9:4<205::AID-STVR186>3.0.CO;2-X","volume":"9","author":"E.S. Mresa","year":"1999","unstructured":"Mresa, E.S., Bottaci, L.: Efficiency of Mutation Operators and Selective Mutation Strategies: An Empirical Study. Software Testing, Verification and Reliability\u00a09, 205\u2013232 (1999)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"3","key":"29_CR6","doi-asserted-by":"publisher","first-page":"185","DOI":"10.1016\/0164-1212(94)00098-0","volume":"31","author":"W.E. Wong","year":"1995","unstructured":"Wong, W.E., Mathur, A.P.: Reducing the Cost of Mutation Testing: An Empirical Study. Journal of Systems and Software\u00a031(3), 185\u2013196 (1995)","journal-title":"Journal of Systems and Software"},{"key":"29_CR7","doi-asserted-by":"crossref","unstructured":"Untch, R., Offutt, A., Harrold, M.: Mutation analysis using program schemata. In: International Symposium on Software Testing, and Analysis, Cambridge, Massachusetts, June 28-30, pp. 139\u2013148 (1993)","DOI":"10.1145\/174146.154265"},{"issue":"5","key":"29_CR8","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1109\/32.286422","volume":"20","author":"A.J. Offutt","year":"1994","unstructured":"Offutt, A.J., Lee, S.D.: An Empirical Evaluation of Weak Mutation. IEEE Transactions on Software Engineering\u00a020(5), 337\u2013344 (1994)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"29_CR9","doi-asserted-by":"crossref","unstructured":"Reales, P., Polo, M., Offutt, J.: Mutation at System and Functional Levels. In: Third International Conference on Software Testing, Verification, and Validation Workshops, Paris, France, pp. 110\u2013119 (April 2010)","DOI":"10.1109\/ICSTW.2010.18"},{"key":"29_CR10","doi-asserted-by":"crossref","unstructured":"Hirayama, M., Yamamoto, T., Okayasu, J., Mizuno, O., Kikuno, T.: Elimination of Crucial Faults by a New Selective Testing Method. In: International Symposium on Empirical Software Engineering (ISESE 2002), Nara, Japan, October 3-4, pp. 183\u2013191 (2002)","DOI":"10.1109\/ISESE.2002.1166937"},{"issue":"2","key":"29_CR11","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1002\/stvr.392","volume":"19","author":"M. Polo","year":"2008","unstructured":"Polo, M., Piattini, M., Garc\u00eda-Rodr\u00edguez, I.: Decreasing the cost of mutation testing with 2-order mutants. Software Testing, Verification and Reliability\u00a019(2), 111\u2013131 (2008)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"3","key":"29_CR12","doi-asserted-by":"publisher","first-page":"165","DOI":"10.1002\/(SICI)1099-1689(199709)7:3<165::AID-STVR143>3.0.CO;2-U","volume":"7","author":"A.J. Offutt","year":"1997","unstructured":"Offutt, A.J., Pan, J.: Automatically detecting equivalent mutants and infeasible paths. Software Testing, Verification and Reliability\u00a07(3), 165\u2013192 (1997)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"2","key":"29_CR13","doi-asserted-by":"publisher","first-page":"76","DOI":"10.1109\/MS.2005.30","volume":"22","author":"B. Baudry","year":"2005","unstructured":"Baudry, B., Fleurey, F., J\u00e9z\u00e9quel, J.-M., Traon, Y.L.: Automatic test case optimization: a bacteriologic algorithm. IEEE Software\u00a022(2), 76\u201382 (2005)","journal-title":"IEEE Software"},{"key":"29_CR14","doi-asserted-by":"publisher","first-page":"207","DOI":"10.1002\/stvr.238","volume":"11","author":"S.W. Kim","year":"2001","unstructured":"Kim, S.W., Clark, J.A., McDermid, J.A.: Investigating the effectiveness of object-oriented testing strategies using the mutation method. Software Testing, Verification and Reliability\u00a011, 207\u2013225 (2001)","journal-title":"Software Testing, Verification and Reliability"},{"key":"29_CR15","doi-asserted-by":"crossref","unstructured":"Ammann, P., Offutt, J.: Introduction to software testing. Cambridge University Press (2008)","DOI":"10.1017\/CBO9780511809163"},{"issue":"1","key":"29_CR16","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1002\/stvr.348","volume":"17","author":"M. Polo","year":"2007","unstructured":"Polo, M., Piattini, M., Tendero, S.: Integrating techniques and tools for testing automation. Software Testing, Verification and Reliability\u00a017(1), 3\u201339 (2007)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"3","key":"29_CR17","doi-asserted-by":"publisher","first-page":"195","DOI":"10.1109\/TSE.2003.1183927","volume":"29","author":"J.A. Jones","year":"2003","unstructured":"Jones, J.A., Harrold, M.J.: Test-Suite Reduction and Prioritization for Modified Condition\/Decision Coverage. IEEE Transactions on Software Engineering\u00a029(3), 195\u2013209 (2003)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"29_CR18","volume-title":"Computers and Intractability","author":"M.R. Garey","year":"1979","unstructured":"Garey, M.R., Johnson, D.S.: Computers and Intractability. W.H. Freeman, New York (1979)"},{"issue":"3","key":"29_CR19","doi-asserted-by":"publisher","first-page":"270","DOI":"10.1145\/152388.152391","volume":"2","author":"M. Harrold","year":"1993","unstructured":"Harrold, M., Gupta, R., Soffa, M.: A methodology for controlling the size of a test suite. ACM Transactions on Software Engineering and Methodology\u00a02(3), 270\u2013285 (1993)","journal-title":"ACM Transactions on Software Engineering and Methodology"},{"key":"29_CR20","doi-asserted-by":"crossref","unstructured":"Jeffrey, D., Gupta, N.: Test suite reduction with selective redundancy. In: International Conference on Software Maintenance, Budapest, Hungary, pp. 549\u2013558 (2005)","DOI":"10.1109\/ICSM.2005.88"},{"key":"29_CR21","doi-asserted-by":"crossref","unstructured":"Tallam, S., Gupta, N.: A concept analysis inspired greedy algorithm for test suite minimization. In: 6th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, pp. 35\u201342 (2005)","DOI":"10.1145\/1108792.1108802"},{"key":"29_CR22","doi-asserted-by":"crossref","unstructured":"Heimdahl, M., George, D.: Test-Suite Reduction for Model Based Tests: Effects on Test Quality and Implications for Testing. In: 19th IEEE International Conference on Automated Software Engineering, pp. 176\u2013185 (2004)","DOI":"10.1109\/ASE.2004.1342735"},{"key":"29_CR23","doi-asserted-by":"crossref","unstructured":"McMaster, S., Memon, A.: Call Stack Coverage for Test Suite Reduction. In: 21st IEEE International Conference on Software Maintenance, Budapest, Hungary, pp. 539\u2013548 (2005)","DOI":"10.1109\/ICSM.2005.29"},{"issue":"1","key":"29_CR24","doi-asserted-by":"publisher","first-page":"41","DOI":"10.1002\/smr.265","volume":"15","author":"P. Runeson","year":"2003","unstructured":"Runeson, P., Andersson, C., H\u00f6st, M.: Test processes in software product evolution -a qualitative survey on the state of practice. Journal of Software Maintenance and Evolution: Research and Practice\u00a015(1), 41\u201359 (2003)","journal-title":"Journal of Software Maintenance and Evolution: Research and Practice"},{"issue":"3","key":"29_CR25","doi-asserted-by":"publisher","first-page":"183","DOI":"10.1109\/CJECE.2004.1532522","volume":"29","author":"A.M. Geras","year":"2004","unstructured":"Geras, A.M., Smith, M.R., Miller, J.: A survey of software testing practices in Alberta. Canadian Journal of Electrical and Computer Engineering\u00a029(3), 183\u2013191 (2004)","journal-title":"Canadian Journal of Electrical and Computer Engineering"},{"key":"29_CR26","doi-asserted-by":"crossref","unstructured":"Ng, S.P., Murnane, T., Reed, K., Grant, D., Chen, T.Y.: A Preliminary Survey on Software Testing Practices in Australia, Melbourne, Australia, pp. 116\u2013125 (2004)","DOI":"10.1109\/ASWEC.2004.1290464"},{"issue":"3","key":"29_CR27","doi-asserted-by":"publisher","first-page":"80","DOI":"10.1109\/MS.2010.79","volume":"27","author":"M. Polo","year":"2010","unstructured":"Polo, M., Reales, P.: Mutation Testing Cost Redution Techniques: A Survey. IEEE Software\u00a027(3), 80\u201386 (2010)","journal-title":"IEEE Software"},{"issue":"2","key":"29_CR28","doi-asserted-by":"publisher","first-page":"99","DOI":"10.1145\/227607.227610","volume":"5","author":"A.J. Offutt","year":"1996","unstructured":"Offutt, A.J., Rothermel, G., Untch, R.H., Zapf, C.: An experimental determination of sufficient mutant operators. ACM Transactions on Software Engineering and Methodology\u00a05(2), 99\u2013118 (1996)","journal-title":"ACM Transactions on Software Engineering and Methodology"},{"issue":"4","key":"29_CR29","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1002\/(SICI)1099-1689(199912)9:4<263::AID-STVR190>3.0.CO;2-Y","volume":"9","author":"R.P. Pargas","year":"1999","unstructured":"Pargas, R.P., Harrold, M.J., Peck, R.R.: Test-Data Generation Using Genetic Algorithms. Software Testing, Verification and Reliability\u00a09(4), 263\u2013282 (1999)","journal-title":"Software Testing, Verification and Reliability"},{"key":"29_CR30","unstructured":"Offut, A.J., Pan, J., Zhang, T., Terwary, K.: Experiments with data flow and mutation testing. Report ISSE-TR-94-105 (1994)"},{"issue":"2","key":"29_CR31","doi-asserted-by":"publisher","first-page":"97","DOI":"10.1002\/stvr.308","volume":"15","author":"Y.-S. Ma","year":"2005","unstructured":"Ma, Y.-S., Offutt, J., Kwon, Y.R.: MuJava: an automated class mutation system. Software Testing, Verification and Reliability\u00a015(2), 97\u2013133 (2005)","journal-title":"Software Testing, Verification and Reliability"},{"key":"29_CR32","doi-asserted-by":"publisher","first-page":"167","DOI":"10.1002\/stvr.319","volume":"15","author":"M. Grindal","year":"2005","unstructured":"Grindal, M., Offutt, A.J., Andler, S.F.: Combination testing strategies: a survey. Software Testing, Verification and Reliability\u00a015, 167\u2013199 (2005)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"4","key":"29_CR33","doi-asserted-by":"publisher","first-page":"405","DOI":"10.1007\/s10664-005-3861-2","volume":"10","author":"H. Do","year":"2005","unstructured":"H., D., Elbaum, S.G., Rothermel, G.: Supporting Controlled Experimentation with Testing Techniques: An Infrastructure and its Potential Impact. Empirical Software Engineering: An International Journal\u00a010(4), 405\u2013435 (2005)","journal-title":"Empirical Software Engineering: An International Journal"}],"container-title":["Lecture Notes in Computer Science","Fundamental Approaches to Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-28872-2_29","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,23]],"date-time":"2025-03-23T18:50:00Z","timestamp":1742755800000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-28872-2_29"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012]]},"ISBN":["9783642288715","9783642288722"],"references-count":33,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-28872-2_29","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2012]]}}}