{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T12:53:11Z","timestamp":1753275191655},"publisher-location":"Berlin, Heidelberg","reference-count":21,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642383137"},{"type":"electronic","value":"9783642383144"}],"license":[{"start":{"date-parts":[[2013,1,1]],"date-time":"2013-01-01T00:00:00Z","timestamp":1356998400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.1007\/978-3-642-38314-4_7","type":"book-chapter","created":{"date-parts":[[2013,6,4]],"date-time":"2013-06-04T07:16:30Z","timestamp":1370330190000},"page":"91-105","source":"Crossref","is-referenced-by-count":13,"title":["Effects of Negative Testing on TDD: An Industrial Experiment"],"prefix":"10.1007","author":[{"given":"Adnan","family":"Causevic","sequence":"first","affiliation":[]},{"given":"Rakesh","family":"Shukla","sequence":"additional","affiliation":[]},{"given":"Sasikumar","family":"Punnekkat","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Sundmark","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"7_CR1","volume-title":"Extreme programming explained: embrace change","author":"K. Beck","year":"2000","unstructured":"Beck, K.: Extreme programming explained: embrace change. Addison-Wesley Longman Publishing Co., Inc., Boston (2000)"},{"key":"7_CR2","volume-title":"Test driven: practical tdd and acceptance tdd for java developers","author":"L. Koskela","year":"2007","unstructured":"Koskela, L.: Test driven: practical tdd and acceptance tdd for java developers. Manning Publications Co., Greenwich (2007)"},{"key":"7_CR3","doi-asserted-by":"crossref","unstructured":"Causevic, A., Sundmark, D., Punnekkat, S.: An industrial survey on contemporary aspects of software testing. In: Proceedings of the 3rd International Conference on Software Testing, Verification and Validation (ICST), pp. 393\u2013401 (2010)","DOI":"10.1109\/ICST.2010.52"},{"issue":"5","key":"7_CR4","doi-asserted-by":"publisher","first-page":"337","DOI":"10.1016\/j.infsof.2003.09.011","volume":"46","author":"B. George","year":"2003","unstructured":"George, B., Williams, L.: A structured experiment of test-driven development. Information and Software Technology\u00a046(5), 337\u2013342 (2003)","journal-title":"Information and Software Technology"},{"key":"7_CR5","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1109\/TSE.2005.37","volume":"31","author":"H. Erdogmus","year":"2005","unstructured":"Erdogmus, H., Morisio, M., Torchiano, M.: On the effectiveness of the test-first approach to programming. IEEE Transactions on Software Engineering\u00a031, 226\u2013237 (2005)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"7_CR6","unstructured":"Janzen, D.S., Saiedian, H.: On the influence of test-driven development on software design. In: Conference on Software Engineering Education and Training, pp. 141\u2013148 (2006)"},{"key":"7_CR7","first-page":"285","volume-title":"Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007","author":"A. Gupta","year":"2007","unstructured":"Gupta, A., Jalote, P.: An experimental evaluation of the effectiveness and efficiency of the test driven development. In: Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, pp. 285\u2013294. IEEE Computer Society, Washington, DC (2007)"},{"key":"7_CR8","doi-asserted-by":"publisher","first-page":"229","DOI":"10.1109\/ITNG.2009.11","volume-title":"Proceedings of the 2009 Sixth International Conference on Information Technology: New Generations","author":"J.H. Vu","year":"2009","unstructured":"Vu, J.H., Frojd, N., Shenkel-Therolf, C., Janzen, D.S.: Evaluating test-driven development in an industry-sponsored capstone project. In: Proceedings of the 2009 Sixth International Conference on Information Technology: New Generations, pp. 229\u2013234. IEEE Computer Society, Washington, DC (2009)"},{"key":"7_CR9","doi-asserted-by":"crossref","unstructured":"Causevic, A., Sundmark, D., Punnekkat, S.: Factors limiting industrial adoption of test driven development: A systematic review. In: 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST), pp. 337\u2013346 (March 2011)","DOI":"10.1109\/ICST.2011.19"},{"key":"7_CR10","doi-asserted-by":"crossref","unstructured":"Causevic, A., Punnekkat, S., Sundmark, D.: Quality of testing in test driven development. In: 2012 Eight International Conference on the Quality of Information and Communications Technology (QUATIC) (September 2012)","DOI":"10.1109\/QUATIC.2012.49"},{"issue":"1","key":"7_CR11","doi-asserted-by":"publisher","first-page":"142","DOI":"10.1037\/0021-9010.79.1.142","volume":"79","author":"B.E. Teasley","year":"1994","unstructured":"Teasley, B.E., Leventhal, L.M., Mynatt, C.R., Rohlman, D.S.: Why Software Testing Is Sometimes Ineffective: Two Applied Studies of Positive Test Strategy. Journal of Applied Psychology\u00a079(1), 142\u2013155 (1994)","journal-title":"Journal of Applied Psychology"},{"key":"7_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"210","DOI":"10.1007\/3-540-57433-6_50","volume-title":"Human-Computer Interaction","author":"L.M. Leventhal","year":"1993","unstructured":"Leventhal, L.M., Teasley, B., Rohlman, D.S., Instone, K.: Positive Test Bias in Software Testing Among Professionals: A Review. In: Bass, L.J., Unger, C., Gornostaev, J. (eds.) EWHCI 1993. LNCS, vol.\u00a0753, pp. 210\u2013218. Springer, Heidelberg (1993)"},{"key":"7_CR13","doi-asserted-by":"publisher","first-page":"169","DOI":"10.1016\/j.infsof.2009.08.007","volume":"52","author":"L. Madeyski","year":"2010","unstructured":"Madeyski, L.: The impact of test-first programming on branch coverage and mutation score indicator of unit tests: An experiment. Inf. Softw. Technol.\u00a052, 169\u2013184 (2010)","journal-title":"Inf. Softw. Technol."},{"key":"7_CR14","doi-asserted-by":"publisher","first-page":"878","DOI":"10.1109\/ICST.2012.191","volume-title":"Proceedings of the 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, ICST 2012","author":"W. Shelton","year":"2012","unstructured":"Shelton, W., Li, N., Ammann, P., Offutt, J.: Adding criteria-based tests to test driven development. In: Proceedings of the 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, ICST 2012, pp. 878\u2013886. IEEE Computer Society, Washington, DC (2012)"},{"key":"7_CR15","volume-title":"Software Metrics: A Rigorous and Practical Approach","author":"N.E. Fenton","year":"1998","unstructured":"Fenton, N.E., Pfleeger, S.L.: Software Metrics: A Rigorous and Practical Approach, 2nd edn. PWS Publishing Co., Boston (1998)","edition":"2"},{"key":"7_CR16","doi-asserted-by":"crossref","unstructured":"Causevic, A., Sundmark, D., Punnekkat, S.: Test case quality in test driven development: A study design and a pilot experiment. In: 16th International Conference on Evaluation Assessment in Software Engineering (EASE 2012), pp. 223\u2013227 (May 2012)","DOI":"10.1049\/ic.2012.0029"},{"key":"7_CR17","unstructured":"Eclipse, \n                    \n                      http:\/\/www.eclipse.org"},{"key":"7_CR18","unstructured":"jUnit Framework, \n                    \n                      http:\/\/www.junit.org"},{"key":"7_CR19","first-page":"25","volume-title":"Proceedings of the 8th International Conference on Computing Education Research, Koli 2008","author":"S. Kollanus","year":"2008","unstructured":"Kollanus, S., Isom\u00f6tt\u00f6nen, V.: Understanding tdd in academic environment: experiences from two experiments. In: Proceedings of the 8th International Conference on Computing Education Research, Koli 2008, pp. 25\u201331. ACM, New York (2008)"},{"key":"7_CR20","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1007\/11767718_26","volume-title":"Product-Focused Software Process Improvement","author":"T. Flohr","year":"2006","unstructured":"Flohr, T., Schneider, T.: Lessons learned from an XP experiment with students: Test-first needs more teachings. In: M\u00fcnch, J., Vierimaa, M. (eds.) PROFES 2006. LNCS, vol.\u00a04034, pp. 305\u2013318. Springer, Heidelberg (2006)"},{"key":"7_CR21","unstructured":"R Core Team: R: A Language and Environment for Statistical Computing. R Foundation for Statistical Computing, Vienna, Austria (2012) ISBN 3-900051-07-0"}],"container-title":["Lecture Notes in Business Information Processing","Agile Processes in Software Engineering and Extreme Programming"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-38314-4_7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T23:13:06Z","timestamp":1558393986000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-38314-4_7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"ISBN":["9783642383137","9783642383144"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-38314-4_7","relation":{},"ISSN":["1865-1348","1865-1356"],"issn-type":[{"type":"print","value":"1865-1348"},{"type":"electronic","value":"1865-1356"}],"subject":[],"published":{"date-parts":[[2013]]}}}