{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T16:11:02Z","timestamp":1746115862518,"version":"3.40.4"},"publisher-location":"Berlin, Heidelberg","reference-count":9,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642385766"},{"type":"electronic","value":"9783642385773"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.1007\/978-3-642-38577-3_66","type":"book-chapter","created":{"date-parts":[[2013,5,20]],"date-time":"2013-05-20T01:31:53Z","timestamp":1369013513000},"page":"635-643","source":"Crossref","is-referenced-by-count":0,"title":["Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator"],"prefix":"10.1007","author":[{"given":"Kuen-Suan","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ching-Hsin","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yun-Tsan","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chun-Min","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui-Min","family":"Shih","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"66_CR1","unstructured":"Buck, D.L.: Digital design for a self-temperature compensating oscillator. IEEE International Frequency Control and PDA Exhibition, 615\u2013643 (2002)"},{"key":"66_CR2","doi-asserted-by":"publisher","first-page":"101","DOI":"10.1002\/qre.513","volume":"19","author":"K.S. Chen","year":"2003","unstructured":"Chen, K.S., Pearn, W.L., Lin, P.C.: Capability measures for processes with multiple characteristics. Quality & Reliability Engineering International\u00a019, 101\u2013110 (2003)","journal-title":"Quality & Reliability Engineering International"},{"key":"66_CR3","doi-asserted-by":"publisher","first-page":"1189","DOI":"10.1016\/j.microrel.2005.10.003","volume":"46","author":"K.S. Chen","year":"2006","unstructured":"Chen, K.S., Wang, C.H., Chen, H.T.: A MAIC approach to TFT-LCD panel quality improvement. Microelectronics Reliability\u00a046, 1189\u20131198 (2006)","journal-title":"Microelectronics Reliability"},{"key":"66_CR4","doi-asserted-by":"crossref","unstructured":"Deno, S., Hehnlen, C., Landis, D.: A low cost microcontroller compensated crystal oscillator. In: IEEE Frequency Control Symposium, pp. 954\u2013960 (1997)","DOI":"10.1109\/FREQ.1997.639215"},{"key":"66_CR5","doi-asserted-by":"publisher","first-page":"239","DOI":"10.1080\/08982119408918781","volume":"7","author":"S.W. Cheng","year":"1995","unstructured":"Cheng, S.W.: Practical implementation of testing process capability indices. Quality Engineering\u00a07, 239\u2013259 (1995)","journal-title":"Quality Engineering"},{"key":"66_CR6","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1080\/00224065.1986.11978984","volume":"18","author":"V.E. Kane","year":"1986","unstructured":"Kane, V.E.: Process capability indices. Journal of Quality Technology\u00a018, 41\u201352 (1986)","journal-title":"Journal of Quality Technology"},{"key":"66_CR7","doi-asserted-by":"publisher","first-page":"2009","DOI":"10.1016\/S0026-2714(02)00126-9","volume":"42","author":"M.L. Huang","year":"2002","unstructured":"Huang, M.L., Chen, K.S., Hung, Y.H.: Integrated Process Capability Analysis with an Application in Backlight. Microelectronics Reliability\u00a042, 2009\u20132014 (2002)","journal-title":"Microelectronics Reliability"},{"key":"66_CR8","doi-asserted-by":"publisher","first-page":"1205","DOI":"10.1177\/2041297510393464","volume":"225","author":"C.C. Wang","year":"2011","unstructured":"Wang, C.C., Chen, K.S., Wang, C.H., Chang, P.H.: Application of 6-sigma Design System to Developing an Improvement Model for Multi-process Multi-characteristic Product Quality. Proceedings of the Institution of Mechanical Engineers, Part B, Journal of Engineering Manufacture\u00a0225, 1205\u20131216 (2011)","journal-title":"Proceedings of the Institution of Mechanical Engineers, Part B, Journal of Engineering Manufacture"},{"key":"66_CR9","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1080\/08982119708919102","volume":"10","author":"W.L. Pearn","year":"1997","unstructured":"Pearn, W.L., Chen, K.S.: Multi-process performance analysis: A case study. Quality Engineering\u00a010, 1\u20138 (1997)","journal-title":"Quality Engineering"}],"container-title":["Lecture Notes in Computer Science","Recent Trends in Applied Artificial Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-38577-3_66","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,30]],"date-time":"2025-04-30T10:38:14Z","timestamp":1746009494000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-38577-3_66"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"ISBN":["9783642385766","9783642385773"],"references-count":9,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-38577-3_66","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2013]]}}}