{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T12:58:39Z","timestamp":1725454719691},"publisher-location":"Berlin, Heidelberg","reference-count":7,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642387883"},{"type":"electronic","value":"9783642387890"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.1007\/978-3-642-38789-0_20","type":"book-chapter","created":{"date-parts":[[2013,5,2]],"date-time":"2013-05-02T13:40:19Z","timestamp":1367502019000},"page":"198-201","source":"Crossref","is-referenced-by-count":0,"title":["Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in On-Chip Interconnection Lines"],"prefix":"10.1007","author":[{"given":"Luis-J.","family":"Saiz-Adalid","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pedro","family":"Gil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joaqu\u00edn","family":"Gracia-Mor\u00e1n","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juan-Carlos","family":"Baraza-Calvo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"4","key":"20_CR1","doi-asserted-by":"publisher","first-page":"14","DOI":"10.1109\/MM.2003.1225959","volume":"23","author":"C. Constantinescu","year":"2003","unstructured":"Constantinescu, C.: Trends and challenges in VLSI circuit reliability. IEEE Micro\u00a023(4), 14\u201319 (2003)","journal-title":"IEEE Micro"},{"key":"20_CR2","doi-asserted-by":"crossref","unstructured":"Wei, J., Rashid, L., Pattabiraman, K., Gopalakrishnan, S.: Comparing the effects of intermittent and transient hardware faults on programs. In: Dependable Systems and Networks Workshops, pp. 53\u201358 (2011)","DOI":"10.1109\/DSNW.2011.5958835"},{"key":"20_CR3","unstructured":"Gil, P., et al.: Fault Representativeness. Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000-25245 (2002)"},{"key":"20_CR4","doi-asserted-by":"crossref","unstructured":"Fujiwara, E.: Code Design for Dependable Systems. John Wiley & Sons (2006)","DOI":"10.1002\/0471792748"},{"key":"20_CR5","doi-asserted-by":"crossref","unstructured":"Constantinescu, C.: Intermittent faults and effects on reliability of integrated circuits. In: Reliability and Maintainability Symposium (RAMS 2008), pp. 370\u2013374 (January 2008)","DOI":"10.1109\/RAMS.2008.4925824"},{"key":"20_CR6","unstructured":"LaBel, K.A.: Proton single event effects (SEE) guideline. Submitted for Publication on the NASA Electronic Parts and Packaging (NEPP) Program web site (August 2009), \n                    \n                      https:\/\/nepp.nasa.gov\/files\/18365\/Proton_RHAGuide_NASAAug09.pdf"},{"key":"20_CR7","doi-asserted-by":"crossref","unstructured":"Shamshiri, S., Cheng, K.T.: Error-Locality-Aware Linear Coding to Correct Multi-bit Upsets in SRAMs. In: IEEE International Test Conference, pp. 1\u201310 (November 2010)","DOI":"10.1109\/TEST.2010.5699220"}],"container-title":["Lecture Notes in Computer Science","Dependable Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-38789-0_20","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,12]],"date-time":"2019-05-12T15:23:59Z","timestamp":1557674639000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-38789-0_20"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"ISBN":["9783642387883","9783642387890"],"references-count":7,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-38789-0_20","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2013]]}}}