{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T05:08:01Z","timestamp":1761973681059,"version":"build-2065373602"},"publisher-location":"Berlin, Heidelberg","reference-count":25,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642387883"},{"type":"electronic","value":"9783642387890"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.1007\/978-3-642-38789-0_7","type":"book-chapter","created":{"date-parts":[[2013,5,2]],"date-time":"2013-05-02T17:40:19Z","timestamp":1367516419000},"page":"76-87","source":"Crossref","is-referenced-by-count":3,"title":["The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs"],"prefix":"10.1007","author":[{"given":"Jaime","family":"Espinosa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"de Andr\u00e9s","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juan-Carlos","family":"Ruiz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pedro","family":"Gil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"39","key":"7_CR1","doi-asserted-by":"publisher","first-page":"118","DOI":"10.1109\/MC.2006.31","volume":"1","author":"V. Narayanan","year":"2006","unstructured":"Narayanan, V., Xie, Y.: Reliability concerns in embedded systems design. IEEE Computer\u00a01(39), 118\u2013120 (2006)","journal-title":"IEEE Computer"},{"key":"7_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"223","DOI":"10.1007\/978-3-642-33678-2_19","volume-title":"SAFECOMP 2012","author":"O. Hannius","year":"2012","unstructured":"Hannius, O., Karlsson, J.: Impact of soft errors in a jet engine controller. In: Ortmeier, F., Daniel, P. (eds.) SAFECOMP 2012. LNCS, vol.\u00a07612, pp. 223\u2013234. Springer, Heidelberg (2012)"},{"issue":"6","key":"7_CR3","doi-asserted-by":"publisher","first-page":"10","DOI":"10.1109\/MM.2005.110","volume":"25","author":"S. Borkar","year":"2005","unstructured":"Borkar, S.: Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro\u00a025(6), 10\u201316 (2005)","journal-title":"IEEE Micro"},{"key":"7_CR4","unstructured":"JEDEC: Measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices. JEDEC Standard JESD89A. JEDEC (2006)"},{"key":"7_CR5","doi-asserted-by":"crossref","unstructured":"Gracia-Moran, J., Gil-Tomas, D., Saiz-Adalid, L.J., Baraza, J.C., Gil-Vicente, P.J.: Experimental validation of a fault tolerant microcomputer system against intermittent faults. In: DSN, pp. 413\u2013418 (2010)","DOI":"10.1109\/DSN.2010.5544288"},{"key":"7_CR6","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1109\/RAMS.2008.4925824","volume-title":"Proceedings of the 2008 Annual Reliability and Maintainability Symposium","author":"C. Constantinescu","year":"2008","unstructured":"Constantinescu, C.: Intermittent faults and effects on reliability of integrated circuits. In: Proceedings of the 2008 Annual Reliability and Maintainability Symposium, pp. 370\u2013374. IEEE Computer Society, Washington, DC (2008)"},{"key":"7_CR7","doi-asserted-by":"publisher","first-page":"11","DOI":"10.1109\/TDSC.2004.2","volume":"1","author":"A. Avizienis","year":"2004","unstructured":"Avizienis, A., Laprie, J.C., Randell, B., Landwehr, C.: Basic concepts and taxonomy of dependable and secure computing. IEEE Trans. Dependable Secur. Comput.\u00a01, 11\u201333 (2004)","journal-title":"IEEE Trans. Dependable Secur. Comput."},{"key":"7_CR8","doi-asserted-by":"crossref","unstructured":"Johnson, C., Holloway, C.: The dangers of failure masking in fault-tolerant software: Aspects of a recent in-flight upset event. In: 2007 2nd Institution of Engineering and Technology International Conference on System Safety, pp. 60\u201365 (October 2007)","DOI":"10.1049\/cp:20070442"},{"issue":"4","key":"7_CR9","doi-asserted-by":"publisher","first-page":"66","DOI":"10.1109\/54.735929","volume":"15","author":"C. Bolchini","year":"1998","unstructured":"Bolchini, C., Salice, F., Sciuto, D.: Fault analysis for networks with concurrent error detection. IEEE Des. Test\u00a015(4), 66\u201374 (1998)","journal-title":"IEEE Des. Test"},{"key":"7_CR10","volume-title":"New Methods of Concurrent Checking (Frontiers in Electronic Testing)","author":"M. Goessel","year":"2008","unstructured":"Goessel, M., Ocheretny, V., Sogomonyan, E., Marienfeld, D.: New Methods of Concurrent Checking (Frontiers in Electronic Testing), 1st edn. Springer Publishing Company, Incorporated (2008)","edition":"1"},{"key":"7_CR11","doi-asserted-by":"crossref","unstructured":"Iyer, R.K., Rossetti, D.J.: A statistical load dependency model for cpu errors at slac. In: Twenty-Fifth International Symposium on Fault-Tolerant Computing, \u2018Highlights from Twenty-Five Years\u2019, p. 373 (June 1995)","DOI":"10.1109\/FTCSH.1995.532661"},{"key":"7_CR12","doi-asserted-by":"publisher","first-page":"3278","DOI":"10.1109\/TNS.2004.839172","volume":"51","author":"P.E. Dodd","year":"2004","unstructured":"Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R.: Production and propagation of single-event transients in high-speed digital logic ics. IEEE Transactions on Nuclear Science\u00a051, 3278\u20133284 (2004)","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"7_CR13","doi-asserted-by":"crossref","first-page":"343","DOI":"10.1145\/1966445.1966477","volume-title":"Proceedings of the Sixth Conference on Computer Systems, EuroSys 2011","author":"E.B. Nightingale","year":"2011","unstructured":"Nightingale, E.B., Douceur, J.R., Orgovan, V.: Cycles, cells and platters: an empirical analysisof hardware failures on a million consumer pcs. In: Proceedings of the Sixth Conference on Computer Systems, EuroSys 2011, pp. 343\u2013356. ACM, New York (2011)"},{"issue":"10","key":"7_CR14","doi-asserted-by":"publisher","first-page":"1423","DOI":"10.1016\/S0026-2714(99)00018-9","volume":"39","author":"K. Kimseng","year":"1999","unstructured":"Kimseng, K., Hoit, M., Tiwari, N., Pecht, M.: Physics-of-failure assessment of a cruise control module. Microelectronics Reliability\u00a039(10), 1423\u20131444 (1999)","journal-title":"Microelectronics Reliability"},{"issue":"7","key":"7_CR15","doi-asserted-by":"publisher","first-page":"673","DOI":"10.1109\/TC.1980.1675642","volume":"29","author":"J. Savir","year":"1980","unstructured":"Savir, J.: Detection of single intermittent faults in sequential circuits. IEEE Trans. Comput.\u00a029(7), 673\u2013678 (1980)","journal-title":"IEEE Trans. Comput."},{"issue":"3","key":"7_CR16","doi-asserted-by":"publisher","first-page":"649","DOI":"10.1109\/TR.2012.2208300","volume":"61","author":"A. Correcher","year":"2012","unstructured":"Correcher, A., Garcia, E., Morant, F., Quiles, E., Rodriguez, L.: Intermittent failure dynamics characterization. IEEE Transactions on Reliability\u00a061(3), 649\u2013658 (2012)","journal-title":"IEEE Transactions on Reliability"},{"key":"7_CR17","doi-asserted-by":"crossref","unstructured":"Sorensen, B., Kelly, G., Sajecki, A., Sorensen, P.: An analyzer for detecting intermittent faults in electronic devices. In: AUTOTESTCON 1994. IEEE Systems Readiness Technology Conference. \u2018Cost Effective Support Into the Next Century\u2019, Conference Proceedings, pp. 417\u2013421 (September 1994)","DOI":"10.1109\/AUTEST.1994.381590"},{"issue":"1","key":"7_CR18","doi-asserted-by":"publisher","first-page":"24","DOI":"10.1109\/40.259897","volume":"14","author":"J. Sosnowski","year":"1994","unstructured":"Sosnowski, J.: Transient fault tolerance in digital systems. IEEE Micro\u00a014(1), 24\u201335 (1994)","journal-title":"IEEE Micro"},{"issue":"3","key":"7_CR19","doi-asserted-by":"publisher","first-page":"230","DOI":"10.1109\/12.841127","volume":"49","author":"A. Bondavalli","year":"2000","unstructured":"Bondavalli, A., Chiaradonna, S., Di Giandomenico, F., Grandoni, F.: Threshold-based mechanisms to discriminate transient from intermittent faults. IEEE Trans. Comput.\u00a049(3), 230\u2013245 (2000)","journal-title":"IEEE Trans. Comput."},{"key":"7_CR20","doi-asserted-by":"crossref","unstructured":"Rashid, L., Pattabiraman, K., Gopalakrishnan, S.: Intermittent hardware errors and recovery: modelling and evaluation. In: International Conference on Quantitative Evaluation of Systems, QEST (2012)","DOI":"10.1109\/QEST.2012.37"},{"issue":"7","key":"7_CR21","doi-asserted-by":"crossref","first-page":"783","DOI":"10.1109\/43.644041","volume":"16","author":"N.A. Touba","year":"1997","unstructured":"Touba, N.A., McCluskey, E.J.: Logic synthesis of multilevel circuits with concurrent error detection. IEEE Trans. CAD\u00a016(7), 783\u2013789 (1997)","journal-title":"IEEE Trans. CAD"},{"key":"7_CR22","first-page":"186","volume-title":"Proceedings of the 1996 European conference on Design and Test, EDTC 1996","author":"M. Nicolaidis","year":"1996","unstructured":"Nicolaidis, M., Manich, S., Figueras, J.: Achieving fault secureness in parity prediction arithmetic operators: General conditions and implementations. In: Proceedings of the 1996 European conference on Design and Test, EDTC 1996, pp. 186\u2013193. IEEE Computer Society, Washington, DC (1996)"},{"issue":"5","key":"7_CR23","doi-asserted-by":"publisher","first-page":"489","DOI":"10.1023\/B:JETT.0000042513.15382.e7","volume":"20","author":"S.B. Ko","year":"2004","unstructured":"Ko, S.B., Lo, J.C.: Efficient realization of parity prediction functions in fpgas. J. Electron. Test.\u00a020(5), 489\u2013499 (2004)","journal-title":"J. Electron. Test."},{"key":"7_CR24","doi-asserted-by":"publisher","first-page":"330","DOI":"10.1109\/DFTVS.1999.802900","volume-title":"Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 1999","author":"S. D\u2019Angelo","year":"1999","unstructured":"D\u2019Angelo, S., Sechi, G.R., Metra, C.: Transient and permanent fault diagnosis for fpga-based tmr systems. In: Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 1999, pp. 330\u2013338. IEEE Computer Society, Washington, DC (1999)"},{"key":"7_CR25","doi-asserted-by":"crossref","unstructured":"Kim, C.: Detection and location of intermittent faults by monitoring carrier signal channel behavior of electrical interconnection system. In: Electric Ship Technologies Symposium, ESTS 2009, pp. 449\u2013455. IEEE (April 2009)","DOI":"10.1109\/ESTS.2009.4906550"}],"container-title":["Lecture Notes in Computer Science","Dependable Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-38789-0_7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,30]],"date-time":"2025-04-30T08:02:04Z","timestamp":1746000124000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-38789-0_7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"ISBN":["9783642387883","9783642387890"],"references-count":25,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-38789-0_7","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2013]]}}}