{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T12:13:30Z","timestamp":1725624810900},"publisher-location":"Berlin, Heidelberg","reference-count":5,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540112099"},{"type":"electronic","value":"9783642683565"}],"license":[{"start":{"date-parts":[[1982,1,1]],"date-time":"1982-01-01T00:00:00Z","timestamp":378691200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1982]]},"DOI":"10.1007\/978-3-642-68356-5_4","type":"book-chapter","created":{"date-parts":[[2011,10,25]],"date-time":"2011-10-25T05:11:37Z","timestamp":1319519497000},"page":"45-58","source":"Crossref","is-referenced-by-count":0,"title":["Ein 32-Bit Rechenwerk Mit Eingebautem Hardware-Selbsttest"],"prefix":"10.1007","author":[{"given":"G.","family":"Grassl","sequence":"first","affiliation":[]},{"given":"W.","family":"Daehn","sequence":"additional","affiliation":[]},{"given":"U.","family":"Ludemann","sequence":"additional","affiliation":[]},{"given":"U.","family":"Theus","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"4_CR1","volume-title":"T\u00fcbingen","author":"Schmitter","year":"1981","unstructured":"Schmitter, E.J.: \u201eDevelopment of the fault-tolerant multimicro-computer system BFS\u201c. Proceedings of the workshop on Selfdiagnosis and Fault Tolerance, pp. 216\u2013226, T\u00fcbingen (1981)"},{"key":"4_CR2","doi-asserted-by":"crossref","unstructured":"Beyers, J.W.; Dohse, L.J.; Fucetola, J.P.; Kochis, R.L.; Lob, C.G.; Taylor, G.L.; Zeller, E.R.: \u201eA 32b VLSI CPU chip\u201c. ISSCC 1981, Digest of Technical Papers, pp. 104\u2013105 (1981)","DOI":"10.1109\/ISSCC.1981.1156198"},{"key":"4_CR3","doi-asserted-by":"crossref","unstructured":"K\u00f6nemann, B; Mucha, J.; Zwiehoff, G.; \u201eBuilt-in test for complex digital integrated circuits\u201c. IEEE Journal of Solid-State Circuits, pp. 315\u2013319 (1980)","DOI":"10.1109\/JSSC.1980.1051391"},{"key":"4_CR4","unstructured":"Pomper, M.; Beifu\u00df, W.; Horninger, K.; Schwabe, U.: \u201eA 32-bit execution unit in advanced NMOS technology\u201c. ESSCIRC 1981, Digest of Technical Papers, pp. 50\u201353 (1981)"},{"key":"4_CR5","doi-asserted-by":"crossref","unstructured":"Theus, U.: \u201eA self-testing ROM device\u201c. ISSCC 1981, Digest of Technical Papers, pp. 176\u2013177 (1981)","DOI":"10.1109\/ISSCC.1981.1156147"}],"container-title":["Informatik-Fachberichte","Fehlertolerierende Rechnersysteme"],"original-title":[],"language":"de","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-68356-5_4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,15]],"date-time":"2019-05-15T04:55:36Z","timestamp":1557896136000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-68356-5_4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1982]]},"ISBN":["9783540112099","9783642683565"],"references-count":5,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-68356-5_4","relation":{},"ISSN":["0343-3005"],"issn-type":[{"type":"print","value":"0343-3005"}],"subject":[],"published":{"date-parts":[[1982]]}}}