{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,20]],"date-time":"2025-10-20T10:22:58Z","timestamp":1760955778855,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":4,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811076046"},{"type":"electronic","value":"9789811076053"}],"license":[{"start":{"date-parts":[[2017,12,20]],"date-time":"2017-12-20T00:00:00Z","timestamp":1513728000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-981-10-7605-3_49","type":"book-chapter","created":{"date-parts":[[2017,12,19]],"date-time":"2017-12-19T06:22:45Z","timestamp":1513664565000},"page":"299-304","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Expected Patch Log Likelihood Based on Multi-layer Prior Information Learning"],"prefix":"10.1007","author":[{"given":"ShunFeng","family":"Wang","sequence":"first","affiliation":[]},{"given":"JiaCen","family":"Xie","sequence":"additional","affiliation":[]},{"given":"YuHui","family":"Zheng","sequence":"additional","affiliation":[]},{"given":"Tao","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"ShuHang","family":"Xue","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2017,12,20]]},"reference":[{"key":"49_CR1","doi-asserted-by":"publisher","first-page":"1770","DOI":"10.1109\/TIP.2011.2181401","volume":"21","author":"YW Wen","year":"2012","unstructured":"Wen, Y.W., Chan, R.H.: Parameter selection for total-variation-based image restoration using discrepancy principle. IEEE Trans. Image Process. 21, 1770\u20131781 (2012)","journal-title":"IEEE Trans. Image Process."},{"key":"49_CR2","doi-asserted-by":"publisher","first-page":"2286","DOI":"10.1109\/TSP.2012.2188520","volume":"60","author":"T Peleg","year":"2012","unstructured":"Peleg, T., Eldar, Y.C., Elad, M.: Exploiting statistical dependencies in sparse representations for signal recovery. IEEE Trans. Sig. Process. 60, 2286\u20132303 (2012)","journal-title":"IEEE Trans. Sig. Process."},{"key":"49_CR3","doi-asserted-by":"crossref","unstructured":"Zoran D, Weiss Y.: From learning models of natural image patches to whole image restoration. In: 2011 IEEE International Conference on Computer Vision (ICCV), pp. 479\u2013486. IEEE (2011)","DOI":"10.1109\/ICCV.2011.6126278"},{"issue":"9","key":"49_CR4","doi-asserted-by":"publisher","first-page":"4016","DOI":"10.1109\/TIP.2012.2201491","volume":"21","author":"S Yang","year":"2012","unstructured":"Yang, S., Wang, M., Chen, Y., et al.: Single-image super-resolution reconstruction via learned geometric dictionaries and clustered sparse coding. IEEE Trans. Image Process. 21(9), 4016 (2012). A Publication of the IEEE Signal Processing Society","journal-title":"IEEE Trans. Image Process."}],"container-title":["Lecture Notes in Electrical Engineering","Advances in Computer Science and Ubiquitous Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-10-7605-3_49","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,4]],"date-time":"2018-08-04T12:33:17Z","timestamp":1533385997000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-10-7605-3_49"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12,20]]},"ISBN":["9789811076046","9789811076053"],"references-count":4,"URL":"https:\/\/doi.org\/10.1007\/978-981-10-7605-3_49","relation":{},"ISSN":["1876-1100","1876-1119"],"issn-type":[{"type":"print","value":"1876-1100"},{"type":"electronic","value":"1876-1119"}],"subject":[],"published":{"date-parts":[[2017,12,20]]}}}