{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,29]],"date-time":"2025-06-29T10:10:01Z","timestamp":1751191801935,"version":"3.41.0"},"publisher-location":"Singapore","reference-count":6,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811078439"},{"type":"electronic","value":"9789811078446"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-981-10-7844-6_13","type":"book-chapter","created":{"date-parts":[[2018,1,2]],"date-time":"2018-01-02T05:42:22Z","timestamp":1514871742000},"page":"133-142","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["An Efficient Model for Soft Error Vulnerability of Dynamic Circuits"],"prefix":"10.1007","author":[{"given":"Yan","family":"Sun","sequence":"first","affiliation":[]},{"given":"Yuesheng","family":"Cao","sequence":"additional","affiliation":[]},{"given":"Jinwen","family":"Li","sequence":"additional","affiliation":[]},{"given":"Tiejun","family":"Li","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,1,3]]},"reference":[{"key":"13_CR1","doi-asserted-by":"crossref","unstructured":"Kumar, J., Tahoori, M.B.: A low power soft error suppression technique for dynamic logic. In: 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 454\u2013462 (2005)","DOI":"10.1109\/DFTVS.2005.9"},{"key":"13_CR2","doi-asserted-by":"crossref","unstructured":"Cha, H., Patel, J.H.: A logic-level model for $$\\alpha $$-particle hits in CMOS circuits. In: IEEE International Conference on Computer Design, pp. 538\u2013542 (1993)","DOI":"10.1109\/ICCD.1993.393319"},{"key":"13_CR3","doi-asserted-by":"crossref","unstructured":"Naseer, R., Draper, J., Boulghassoul, Y., Dasgupta, S., Witulski, A.: Critical charge and SET pulse widths for combinational logic in commercial 90\u00a0nm CMOS technology. In: ACM Great Lakes Symposium on VLSI, pp. 227\u2013230 (2007)","DOI":"10.1145\/1228784.1228843"},{"key":"13_CR4","doi-asserted-by":"publisher","first-page":"1161","DOI":"10.1109\/TVLSI.2009.2020391","volume":"17","author":"D Rossi","year":"2009","unstructured":"Rossi, D., Cazeaux, J.M., Omana, M., Metra, C., Chatterjee, A.: Accurate linear model for SET critical charge estimation. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 17, 1161\u20131166 (2009)","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"13_CR5","doi-asserted-by":"publisher","first-page":"247","DOI":"10.1109\/TVLSI.2016.2569562","volume":"25","author":"M Raji","year":"2017","unstructured":"Raji, M., Ghavami, B.: Soft error rate reduction of combinational circuits using gate sizing in the presence of process variations. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 25, 247\u2013260 (2017)","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"13_CR6","unstructured":"Shivakumar, P., Kistler, M., Keckler, S.W., Burger, D., Alvisi, L.: Modeling the effect of technology trends on the soft error rate of combinational logic. In: International Conference on Dependable Systems and Networks, pp. 389\u2013398 (2002)"}],"container-title":["Communications in Computer and Information Science","Computer Engineering and Technology"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-10-7844-6_13","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,29]],"date-time":"2025-06-29T09:49:42Z","timestamp":1751190582000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-10-7844-6_13"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9789811078439","9789811078446"],"references-count":6,"URL":"https:\/\/doi.org\/10.1007\/978-981-10-7844-6_13","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2018]]},"assertion":[{"value":"3 January 2018","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"NCCET","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"CCF National Conference on Computer Engineering and Technology","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Xiamen","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2017","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"16 August 2017","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 August 2017","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"nccet2017","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.nccet.cn","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}