{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T16:15:32Z","timestamp":1743005732892,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":26,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811359491"},{"type":"electronic","value":"9789811359507"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-981-13-5950-7_26","type":"book-chapter","created":{"date-parts":[[2019,1,25]],"date-time":"2019-01-25T02:31:33Z","timestamp":1548383493000},"page":"297-309","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Countermeasure Against Differential Scan Attack in AES Algorithm"],"prefix":"10.1007","author":[{"given":"Jayesh","family":"Popat","sequence":"first","affiliation":[]},{"given":"Usha","family":"Mehta","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,1,25]]},"reference":[{"key":"26_CR1","doi-asserted-by":"publisher","DOI":"10.1049\/PBCS009E","volume-title":"VLSI Testing: Digital and Mixed Analogue\/Digital Techniques","author":"SL Hurst","year":"1998","unstructured":"Hurst, S.L.: VLSI Testing: Digital and Mixed Analogue\/Digital Techniques. IEE, London (1998)"},{"key":"26_CR2","volume-title":"Applied Cryptography: Protocols, Algorithms, and Source Code in C","author":"B Schneier","year":"1996","unstructured":"Schneier, B.: Applied Cryptography: Protocols, Algorithms, and Source Code in C. Wiley, Hoboken (1996)"},{"issue":"12","key":"26_CR3","doi-asserted-by":"publisher","first-page":"2481","DOI":"10.1587\/transfun.E93.A.2481","volume":"E93-A","author":"R Nara","year":"2010","unstructured":"Nara, R., Satoh, K., Yanagisawa, M., Ohtsuki, T., Togawa, N.: Scan-based side-channel attack against RSA cryptosystems using scan signatures. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. E93-A(12), 2481\u20132489 (2010)","journal-title":"IEICE Trans. Fundam. Electron. Commun. Comput. Sci."},{"issue":"2","key":"26_CR4","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1929943.1929952","volume":"16","author":"Y Liu","year":"2011","unstructured":"Liu, Y., Wu, K., Karri, R.: Scan-based attacks on linear feedback shift register based stream ciphers. ACM Trans. Des. Autom. Electron. Syst. (TODAES) 16(2), 1\u201315 (2011)","journal-title":"ACM Trans. Des. Autom. Electron. Syst. (TODAES)"},{"key":"26_CR5","unstructured":"Nara, R., Togawa, N., Yanagisawa, M., Ohtsuki, T.: Scan-based attack against ellipticcurve cryptosystems. In: 15th IEEE Asia and South Pacific Design Automation Conference (ASP-DAC10), pp. 407\u2013412 (2010)"},{"key":"26_CR6","unstructured":"Yang, B., Wu, K., Karri, R.: Scan based side channel attack on dedicated hardware implementations of data encryption standard. In: Proceedings of IEEE International Test Conference, pp. 339\u2013 344 (2004)"},{"issue":"10","key":"26_CR7","doi-asserted-by":"publisher","first-page":"2287","DOI":"10.1109\/TCAD.2005.862745","volume":"25","author":"B Yang","year":"2006","unstructured":"Yang, B., Wu, K., Karri, R.: Secure scan: a design-for-test architecture for cryptochips. IEEE Trans. Comput. Aided Des. Integr. Circu. Syst. 25(10), 2287\u20132293 (2006)","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circu. Syst."},{"key":"26_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"104","DOI":"10.1007\/3-540-68697-5_9","volume-title":"Advances in Cryptology \u2014 CRYPTO \u201996","author":"PC Kocher","year":"1996","unstructured":"Kocher, P.C.: Timing attacks on implementations of diffie-hellman, RSA, DSS, and other systems. In: Koblitz, N. (ed.) CRYPTO 1996. LNCS, vol. 1109, pp. 104\u2013113. Springer, Heidelberg (1996). https:\/\/doi.org\/10.1007\/3-540-68697-5_9"},{"key":"26_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","volume-title":"Advances in Cryptology \u2014 CRYPTO\u2019 99","author":"P Kocher","year":"1999","unstructured":"Kocher, P., Jaffe, J., Jun, B.: Differential power analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388\u2013397. Springer, Heidelberg (1999). https:\/\/doi.org\/10.1007\/3-540-48405-1_25"},{"key":"26_CR10","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"200","DOI":"10.1007\/3-540-45418-7_17","volume-title":"Smart Card Programming and Security","author":"J-J Quisquater","year":"2001","unstructured":"Quisquater, J.-J., Samyde, D.: ElectroMagnetic analysis (EMA): measures and counter-measures for smart cards. In: Attali, I., Jensen, T.P. (eds.) E-smart 2001. LNCS, vol. 2140, pp. 200\u2013210. Springer, Heidelberg (2001). https:\/\/doi.org\/10.1007\/3-540-45418-7_17"},{"key":"26_CR11","unstructured":"Kommerling, O., Kuhn, M.G.: Design principles for tamper-resistant smartcardprocessors. In: Proceedings of the USENIX Workshop on Smartcard Technology, p. 22. USENIX Association, Berkeley (1999)"},{"key":"26_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"260","DOI":"10.1007\/3-540-36400-5_20","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"C Aum\u00fcller","year":"2003","unstructured":"Aum\u00fcller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Kaliski, B.S., Ko\u00e7, \u00c7.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260\u2013275. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_20"},{"key":"26_CR13","doi-asserted-by":"publisher","first-page":"265","DOI":"10.1007\/s13389-011-0022-y","volume":"1","author":"S Endo","year":"2011","unstructured":"Endo, S., Sugawara, T., Homma, N., Aoki, T., Satoh, A.: An on-chip glitchy clock generator for testing fault injection attacks. J. Cryptogr. Eng. 1, 265\u2013270 (2011)","journal-title":"J. Cryptogr. Eng."},{"key":"26_CR14","unstructured":"Skorobogatov, S.: Low temperature data remanence in static RAM. University of Cambridge, Computer Laboratory, Technical Report UCAM-CL-TR-536, June 2002. http:\/\/www.cl.cam.ac.uk\/techreports\/UCAM-CL-TR-536.pdf"},{"key":"26_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Ko\u00e7, \u00c7.K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_2"},{"key":"26_CR16","unstructured":"Schmidt, J.-M., Hutter, M.: Optical and EM fault-attacks on CRT-based RSA: concrete results. In: Karl, J.W., Posch, C. (eds.) Austrochip 2007, 15th Austrian Workhop on Microelectronics, 11 October 2007, Graz, Austria, Proceedings, pp. 61\u201367. Verlag der Technischen Universit\u00e4t Graz, Graz (2007)"},{"key":"26_CR17","doi-asserted-by":"crossref","unstructured":"DaRolt, J., Di Natale, G., Flottes, M.L., Rouzeyre, B.: Scan attacks and countermeasures in presence of scan response compactors. In: Sixteenth IEEE European Test Symposium, Trondheim, pp. 19\u201324 (2011)","DOI":"10.1109\/ETS.2011.30"},{"key":"26_CR18","doi-asserted-by":"crossref","unstructured":"Da Rolt, J., Di Natale, G., Flottes, M.L., Rouzeyre, B.: Are advanced DfT structures sufficient for preventing scan-attacks? In: IEEE 30th VLSI Test Symposium (VTS), Hyatt Maui, HI, pp. 246\u2013251 (2012)","DOI":"10.1109\/VTS.2012.6231061"},{"key":"26_CR19","doi-asserted-by":"crossref","unstructured":"Ege, B., Das, A., Gosh, S., Verbauwhede, I.: Differential scan attack on AESwith X-tolerant and X-masked test response compactor. In: 2012 15th Euromicro Conference on Digital System Design (DSD), pp. 545\u2013552. IEEE (2012)","DOI":"10.1109\/DSD.2012.44"},{"issue":"2","key":"26_CR20","doi-asserted-by":"publisher","first-page":"329","DOI":"10.1109\/TVLSI.2008.2010045","volume":"18","author":"GD Natale","year":"2010","unstructured":"Natale, G.D., Doulcier, M., Flottes, M.L., Rouzeyre, B.: Self-test techniques for crypto-devices. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 18(2), 329\u2013333 (2010)","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"26_CR21","doi-asserted-by":"crossref","unstructured":"Da Rolt, J., Di Natale, G., Flottes, M.L., Rouzeyre, B.: On-chip test comparison for protecting confidential data in secure ICS. In: 2012 17th IEEE European Test Symposium (ETS), p. 1, May 2012","DOI":"10.1109\/ETS.2012.6233039"},{"key":"26_CR22","doi-asserted-by":"crossref","unstructured":"Sengar, G., Mukhopadhayay, D., Roy Chowdhury, D.: An efficient approach to develop secure scan tree for crypto-hardware. In: International Conference on Advanced Computing and Communications, ADCOM 2007, pp. 21\u201326, December 2007","DOI":"10.1109\/ADCOM.2007.110"},{"issue":"12","key":"26_CR23","doi-asserted-by":"publisher","first-page":"1966","DOI":"10.1109\/TCAD.2013.2274619","volume":"32","author":"A Das","year":"2013","unstructured":"Das, A., Ege, B., Ghosh, S., Batina, L., Verbauwhede, I.: Security analysis of industrial test compression schemes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12), 1966\u20131977 (2013)","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst."},{"issue":"2","key":"26_CR24","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1016\/j.jesit.2015.04.002","volume":"2","author":"K Kalaiselvi","year":"2015","unstructured":"Kalaiselvi, K., Mangalam, H.: Power efficient and high-performance VLSI architecture for AES algorithm. J. Electr. Syst. Inf. Technol. 2(2), 178\u2013183 (2015)","journal-title":"J. Electr. Syst. Inf. Technol."},{"key":"26_CR25","doi-asserted-by":"crossref","unstructured":"Ahlawat, S., Vaghani, D., Tudu, J., Singh, V.: On securing scan design from scan-based side-channel attacks. In: 2017 IEEE 26th Asian Test Symposium (ATS), pp. 58\u201363. IEEE (2017)","DOI":"10.1109\/ATS.2017.23"},{"key":"26_CR26","unstructured":"http:\/\/csrc.nist.gov\/publications\/PubsFIPS.html"}],"container-title":["Communications in Computer and Information Science","VLSI Design and Test"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-13-5950-7_26","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T21:14:30Z","timestamp":1606166070000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-13-5950-7_26"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9789811359491","9789811359507"],"references-count":26,"URL":"https:\/\/doi.org\/10.1007\/978-981-13-5950-7_26","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"25 January 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VDAT","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Symposium on VLSI Design and Test","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Madurai","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"28 June 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30 June 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vdat2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/vdat2018.tce.edu","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}