{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T16:21:31Z","timestamp":1742919691409,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":5,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811365072"},{"type":"electronic","value":"9789811365089"}],"license":[{"start":{"date-parts":[[2019,6,14]],"date-time":"2019-06-14T00:00:00Z","timestamp":1560470400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2019,6,14]],"date-time":"2019-06-14T00:00:00Z","timestamp":1560470400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-981-13-6508-9_56","type":"book-chapter","created":{"date-parts":[[2019,6,13]],"date-time":"2019-06-13T22:02:37Z","timestamp":1560463357000},"page":"468-473","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Research on ATML-Oriented Test Application Development Platform"],"prefix":"10.1007","author":[{"given":"Jin","family":"Luo","sequence":"first","affiliation":[]},{"given":"Hua","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Huang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,6,14]]},"reference":[{"key":"56_CR1","unstructured":"IEEE Std 1671-2010.: Standard for Automatic Test Markup Language for Exchanging Automatic Test Equipment and Test Information via XML (2011)"},{"issue":"6","key":"56_CR2","first-page":"8","volume":"24","author":"S Fan","year":"2016","unstructured":"Fan, S.: Study of test resources and test requirements automatic matching method in ATML. Computer Meas. Control 24(6), 8\u201311 (2016)","journal-title":"Computer Meas. Control"},{"key":"56_CR3","doi-asserted-by":"crossref","unstructured":"Jain, A., Delgado, S.: Automatic ATML test description translation to a COTS test executive. In: IEEE AutoTestCon, pp. 190\u2013194 (2009)","DOI":"10.1109\/AUTEST.2009.5314093"},{"key":"56_CR4","doi-asserted-by":"crossref","unstructured":"Ordonez Camacho, D., Mens, K.: Appareil: a tool for building automated program translators using annotated grammars. In: IEEE ICASE, pp. 489\u2013491 (2008)","DOI":"10.1109\/ASE.2008.85"},{"issue":"4","key":"56_CR5","first-page":"111","volume":"29","author":"S Zhu","year":"2010","unstructured":"Zhu, S.: Research and application of test application development platform on STD standard. Comput. Technol. Autom. 29(4), 111\u2013114 (2010)","journal-title":"Comput. Technol. Autom."}],"container-title":["Lecture Notes in Electrical Engineering","Communications, Signal Processing, and Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-13-6508-9_56","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,2,11]],"date-time":"2021-02-11T21:27:33Z","timestamp":1613078853000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-13-6508-9_56"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6,14]]},"ISBN":["9789811365072","9789811365089"],"references-count":5,"URL":"https:\/\/doi.org\/10.1007\/978-981-13-6508-9_56","relation":{},"ISSN":["1876-1100","1876-1119"],"issn-type":[{"type":"print","value":"1876-1100"},{"type":"electronic","value":"1876-1119"}],"subject":[],"published":{"date-parts":[[2019,6,14]]},"assertion":[{"value":"14 June 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CSPS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference in Communications, Signal Processing, and Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Dalian","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14 July 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"16 July 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7th","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"csps2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}