{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T19:43:38Z","timestamp":1726083818106},"publisher-location":"Singapore","reference-count":21,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811552311"},{"type":"electronic","value":"9789811552328"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-981-15-5232-8_11","type":"book-chapter","created":{"date-parts":[[2020,5,8]],"date-time":"2020-05-08T08:02:53Z","timestamp":1588924973000},"page":"118-128","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Optimization of Bug Reporting System (BRS): Artificial Intelligence Based Method to Handle Duplicate Bug Report"],"prefix":"10.1007","author":[{"given":"Afshan","family":"Saad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad","family":"Saad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shah Muhammad","family":"Emaduddin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rafi","family":"Ullah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,5,9]]},"reference":[{"key":"11_CR1","unstructured":"Fischer, M., Pinzger, M., Gall, H.: Analyzing and relating bug report data for feature tracking. In: WCRE, vol. 3 (2003)"},{"key":"11_CR2","doi-asserted-by":"crossref","unstructured":"Dal Sasso, T., Mocci, A., Lanza, M.: What makes a satisficing bug report? In: 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS). IEEE (2016)","DOI":"10.1109\/QRS.2016.28"},{"issue":"3","key":"11_CR3","doi-asserted-by":"publisher","first-page":"e1821","DOI":"10.1002\/smr.1821","volume":"29","author":"K Aggarwal","year":"2017","unstructured":"Aggarwal, K., et al.: Detecting duplicate bug reports with software engineering domain knowledge. J. Softw. Evol. Process 29(3), e1821 (2017)","journal-title":"J. Softw. Evol. Process"},{"key":"11_CR4","unstructured":"https:\/\/en.wikipedia.org\/wiki\/Mantis_Bug_Tracker"},{"key":"11_CR5","unstructured":"https:\/\/www.bugzilla.org\/about\/"},{"key":"11_CR6","unstructured":"https:\/\/www.quora.com\/What-is-JIRA-What-is-it-used-for"},{"key":"11_CR7","doi-asserted-by":"publisher","first-page":"35743","DOI":"10.1109\/ACCESS.2018.2850910","volume":"6","author":"Q Umer","year":"2018","unstructured":"Umer, Q., Hui, L., Yasir, S.: Emotion based automated priority prediction for bug reports. IEEE Access 6, 35743\u201335752 (2018)","journal-title":"IEEE Access"},{"key":"11_CR8","doi-asserted-by":"publisher","first-page":"557","DOI":"10.1109\/TR.2018.2799957","volume":"67","author":"M Bures","year":"2018","unstructured":"Bures, M., Frajtak, K., Ahmed, B.S.: Tapir: automation support of exploratory testing using model reconstruction of the system under test. IEEE Trans. Reliab. 67, 557\u2013580 (2018)","journal-title":"IEEE Trans. Reliab."},{"key":"11_CR9","unstructured":"Kadam, S., Shinde, S., Patekar, N., Rain, S.: Bug detection tool for websites. Int. J. Eng. Sci. 16440 (2018)"},{"key":"11_CR10","unstructured":"Bagal, P.V., et al.: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation. U.S. Patent Application 14\/992,831, filed 13 July 2017"},{"key":"11_CR11","unstructured":"Xuan, J., Jiang, H., Ren, Z., Yan, J., Luo, Z.: Automatic bug triage using semi-supervised text classification. arXiv preprint \narXiv:1704.04769\n\n (2017)"},{"issue":"5","key":"11_CR12","first-page":"89","volume":"4","author":"PN Minh","year":"2014","unstructured":"Minh, P.N.: An approach to detecting duplicate bug reports using n-gram features and cluster chrinkage technique. Int. J. Sci. Res. Publ. (IJSRP) 4(5), 89\u2013100 (2014)","journal-title":"Int. J. Sci. Res. Publ. (IJSRP)"},{"key":"11_CR13","doi-asserted-by":"crossref","unstructured":"Wang, X., Zhang, L., Xie, T., Anvik, J., Sun, J.: An approach to detecting duplicate bug reports using natural language and execution information. In: Proceedings of the 30th International Conference on Software Engineering, pp. 461\u2013470. ACM (2008)","DOI":"10.1145\/1368088.1368151"},{"key":"11_CR14","doi-asserted-by":"crossref","unstructured":"Banerjee, S., Cukic, B., Adjeroh, D.: Automated duplicate bug report classification using subsequence matching. In: 2012 IEEE 14th International Symposium on High-Assurance Systems Engineering, pp. 74\u201381. IEEE (2012)","DOI":"10.1109\/HASE.2012.38"},{"key":"11_CR15","doi-asserted-by":"crossref","unstructured":"Jalbert, N., Weimer, W.: Automated duplicate detection for bug tracking systems. In: IEEE International Conference on Dependable Systems and Networks with FTCS and DCC 2008, DSN 2008, pp. 52\u201361. IEEE (2008)","DOI":"10.1109\/DSN.2008.4630070"},{"key":"11_CR16","doi-asserted-by":"crossref","unstructured":"Sureka, A., Jalote, P.: Detecting duplicate bug report using character n-gram-based features. In: 2010 17th Asia Pacific Software Engineering Conference (APSEC), pp. 366\u2013374. IEEE (2010)","DOI":"10.1109\/APSEC.2010.49"},{"key":"11_CR17","doi-asserted-by":"crossref","unstructured":"Runeson, P., Alexandersson, M., Nyholm, O.: Detection of duplicate defect reports using natural language processing. In: Proceedings of the 29th International Conference on Software Engineering, pp. 499\u2013510. IEEE Computer Society (2007)","DOI":"10.1109\/ICSE.2007.32"},{"key":"11_CR18","doi-asserted-by":"crossref","unstructured":"Gopalan, R.P., Krishna, A.: Duplicate bug report detection using clustering. In: 2014 23rd Australian Software Engineering Conference (ASWEC), pp. 104\u2013109. IEEE (2014)","DOI":"10.1109\/ASWEC.2014.31"},{"key":"11_CR19","doi-asserted-by":"crossref","unstructured":"Bettenburg, N., Premraj, R., Zimmermann, T., Kim, S.: Duplicate bug reports considered harmful\u2026 really? In: IEEE International Conference on Software Maintenance 2008, ICSM 2008, pp. 337\u2013345. IEEE (2008)","DOI":"10.1109\/ICSM.2008.4658082"},{"key":"11_CR20","doi-asserted-by":"crossref","unstructured":"Tian, Y., Sun, C., Lo, D.: Improved duplicate bug report identification. In: 2012 16th European Conference on Software Maintenance and Reengineering (CSMR), pp. 385\u2013390. IEEE (2012)","DOI":"10.1109\/CSMR.2012.48"},{"key":"11_CR21","doi-asserted-by":"crossref","unstructured":"D\u2019Ambros, M., Lanza, M., Pinzger, M.: \u201cA bug\u2019s life\u201d visualizing a bug database. In: 4th IEEE International Workshop on Visualizing Software for Understanding and Analysis 2007, VISSOFT 2007, pp. 113\u2013120. IEEE (2007)","DOI":"10.1109\/VISSOF.2007.4290709"}],"container-title":["Communications in Computer and Information Science","Intelligent Technologies and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-15-5232-8_11","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,8]],"date-time":"2020-05-08T08:04:57Z","timestamp":1588925097000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-15-5232-8_11"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9789811552311","9789811552328"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-981-15-5232-8_11","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"9 May 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"INTAP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Technologies and Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Bahawalpur","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Pakistan","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 November 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 November 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"intap2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/jdconline.net\/intap\/index.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"224","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"60","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"6","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"27% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1 Invited Paper","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}