{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T19:17:18Z","timestamp":1742930238916,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":5,"publisher":"Springer Singapore","isbn-type":[{"type":"print","value":"9789811580604"},{"type":"electronic","value":"9789811580611"}],"license":[{"start":{"date-parts":[[2020,12,11]],"date-time":"2020-12-11T00:00:00Z","timestamp":1607644800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,12,11]],"date-time":"2020-12-11T00:00:00Z","timestamp":1607644800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021]]},"DOI":"10.1007\/978-981-15-8061-1_39","type":"book-chapter","created":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T20:08:45Z","timestamp":1607630925000},"page":"483-490","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring"],"prefix":"10.1007","author":[{"given":"P. N.","family":"Bajeel","sequence":"first","affiliation":[]},{"given":"M.","family":"Kumar","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,12,11]]},"reference":[{"issue":"2","key":"39_CR1","first-page":"177","volume":"6","author":"PN Bajeel","year":"2015","unstructured":"Bajeel PN, Kumar M (2015) A component reliability test plan for a parallel system with failure rate as the exponential function of covariates. Math Eng Sci Aerosp 6(2):177\u2013190","journal-title":"Math Eng Sci Aerosp"},{"issue":"6","key":"39_CR2","doi-asserted-by":"publisher","first-page":"1236","DOI":"10.1287\/opre.22.6.1236","volume":"22","author":"S Gal","year":"1974","unstructured":"Gal S (1974) Optimal test design for reliability demonstration. Oper Res 22(6):1236\u20131242","journal-title":"Oper Res"},{"issue":"1","key":"39_CR3","doi-asserted-by":"publisher","first-page":"17","DOI":"10.1109\/24.994899","volume":"51","author":"JH Nair","year":"2002","unstructured":"Nair JH, Sabnis SV (2002) A reliability test-plan for series systems with components having stochastic failure rates. IEEE T Reliab 51(1):17\u201322","journal-title":"IEEE T Reliab"},{"issue":"4","key":"39_CR4","doi-asserted-by":"publisher","first-page":"406","DOI":"10.1109\/24.9849","volume":"37","author":"J Rajgopal","year":"1988","unstructured":"Rajgopal J, Mazumdar M (1988) A type-II censored, log test time based, component-testing procedure for a parallel system. IEEE T Reliab 37(4):406\u2013412","journal-title":"IEEE T Reliab"},{"issue":"5","key":"39_CR5","doi-asserted-by":"publisher","first-page":"454","DOI":"10.1016\/j.stamet.2007.11.001","volume":"5","author":"P Vellaisamy","year":"2008","unstructured":"Vellaisamy P, Kumar M (2008) Optimal component test plans for a parallel system based on type-II censoring. Stat Methodol 5(5):454\u2013461","journal-title":"Stat Methodol"}],"container-title":["Advances in Intelligent Systems and Computing","Proceedings of the Sixth International Conference on Mathematics and Computing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-15-8061-1_39","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T20:24:12Z","timestamp":1607631852000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-981-15-8061-1_39"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,11]]},"ISBN":["9789811580604","9789811580611"],"references-count":5,"URL":"https:\/\/doi.org\/10.1007\/978-981-15-8061-1_39","relation":{},"ISSN":["2194-5357","2194-5365"],"issn-type":[{"type":"print","value":"2194-5357"},{"type":"electronic","value":"2194-5365"}],"subject":[],"published":{"date-parts":[[2020,12,11]]},"assertion":[{"value":"11 December 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}