{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T08:28:50Z","timestamp":1761294530415,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":15,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789811961342"},{"type":"electronic","value":"9789811961359"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-981-19-6135-9_8","type":"book-chapter","created":{"date-parts":[[2022,10,20]],"date-time":"2022-10-20T14:04:46Z","timestamp":1666274686000},"page":"94-108","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Fault Arc Detection Method Based on Multi Feature Analysis and PNN"],"prefix":"10.1007","author":[{"given":"Chao","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0403-0058","authenticated-orcid":false,"given":"Jiachuan","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiankai","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5493-0033","authenticated-orcid":false,"given":"Rao","family":"Fu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,10,21]]},"reference":[{"key":"8_CR1","unstructured":"Yang, K., Zhang, R.C., Yang, J.H., et al.: Series arc fault diagnostic method based on fractal dimension and support vector machine. Transactions of China Electro-technical Society 31(2), 70\u201377 (2016)"},{"key":"8_CR2","volume-title":"Research on Fault Arc Feature Extraction and Adaptive Detection Technology","author":"JW Liu","year":"2019","unstructured":"Liu, J.W.: Research on Fault Arc Feature Extraction and Adaptive Detection Technology. Zhejiang University, Hangzhou (2019)"},{"issue":"4","key":"8_CR3","first-page":"218","volume":"41","author":"HJ Zhao","year":"2020","unstructured":"Zhao, H.J., Qin, H.Y., Liu, K., et al.: Detection method of series fault arc based on correlation theory and zero break feature fusion. Chinese J. Scientific Instrument 41(4), 218\u2013228 (2020)","journal-title":"Chinese J. Scientific Instrument"},{"issue":"2","key":"8_CR4","first-page":"463","volume":"47","author":"GW Long","year":"2021","unstructured":"Long, G.W., Mu, H.B., Zhang, D.N., et al.: Series arc fault identification technology based on multi-feature fusion neural network. High Voltage Technol. 47(2), 463\u2013471 (2021)","journal-title":"High Voltage Technol."},{"issue":"4","key":"8_CR5","doi-asserted-by":"publisher","first-page":"1955","DOI":"10.1109\/TSG.2015.2407868","volume":"6","author":"Z Wang","year":"2015","unstructured":"Wang, Z., Ba Log, R.S.: Arc fault and flash signal analysis in DC distribution systems using wavelet transformation. IEEE Trans. Smart Grid 6(4), 1955\u20131963 (2015)","journal-title":"IEEE Trans. Smart Grid"},{"key":"8_CR6","doi-asserted-by":"crossref","unstructured":"Liu, S., Dong, L., Liao, X., et al.: Application of the variational mode decomposition-based time and time\u2013frequency domain analysis on series dc arc fault detection of photovoltaic arrays. IEEE Access. 7, 126177\u2013126190 (2019)","DOI":"10.1109\/ACCESS.2019.2938979"},{"issue":"11","key":"8_CR7","first-page":"2423","volume":"35","author":"Z Li","year":"2014","unstructured":"Li, Z., Zhu, M., Chu, F., et al.: Mechanical fault diagnosis method based on empirical wavelet transform. Chinese J. Scientific Instrument 35(11), 2423\u20132432 (2014)","journal-title":"Chinese J. Scientific Instrument"},{"issue":"9","key":"8_CR8","first-page":"126","volume":"30","author":"LI Chun-Zhi","year":"2008","unstructured":"Chun-Zhi, L.I., Rong-Jian, H.E., Tian, G.M.: Research on the application of the mathematical morphology filtering in vibration signal analysis. Computer Eng. Sci. 30(9), 126\u2013127 (2008)","journal-title":"Computer Eng. Sci."},{"key":"8_CR9","doi-asserted-by":"crossref","unstructured":"Dini, D.A., Brazis, P.W., Yen, K.H.: Development of Arc-Fault Circuit-Interrupter requirements for Photovoltaic systems. In: IEEE Photovoltaic Specialists Conference, pp.1790\u20131794 (2011)","DOI":"10.1109\/PVSC.2011.6186301"},{"key":"8_CR10","unstructured":"Liu, J.:Analysis of GB\/T 31143\u20142014. Electrical & Energy Management Technology (2015)"},{"key":"8_CR11","doi-asserted-by":"crossref","unstructured":"Yaman, O., Yeti, H., Karakse, M.: Image processing and machine learning\u2010based classification method for hyperspectral images. The Journal of Eng. 2, 85-96 (2021)","DOI":"10.1049\/tje2.12012"},{"key":"8_CR12","doi-asserted-by":"crossref","unstructured":"Bouchet, A., et al.: Compensatory fuzzy mathematical morphology. Signal, Image and Video Processing (2017)","DOI":"10.1007\/s11760-017-1058-y"},{"issue":"2","key":"8_CR13","doi-asserted-by":"publisher","first-page":"307","DOI":"10.1016\/j.asej.2019.03.011","volume":"10","author":"A Mm","year":"2019","unstructured":"Mm, A., Rrp, B., Pkr, A.: A combined mathematical morphology and extreme learning machine techniques based approach to micro-grid protection. Ain Shams Eng. J. 10(2), 307\u2013318 (2019)","journal-title":"Ain Shams Eng. J."},{"key":"8_CR14","doi-asserted-by":"crossref","unstructured":"Pourkamali-Anaraki, F., Hariri-Ardebili, M.A.: Neural networks and imbalanced learning for data-driven scientific computing with uncertainties. IEEE Access 9, 1533415350 (2021)","DOI":"10.1109\/ACCESS.2021.3052680"},{"key":"8_CR15","unstructured":"Chang, D.T. Probabilistic Deep Learning with Probabilistic Neural Networks and Deep Probabilistic Models. (2021)"}],"container-title":["Communications in Computer and Information Science","Neural Computing for Advanced Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-19-6135-9_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,20]],"date-time":"2022-10-20T14:06:57Z","timestamp":1666274817000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-19-6135-9_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9789811961342","9789811961359"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-981-19-6135-9_8","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"21 October 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"NCAA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Computing for Advanced Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Jinan","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 July 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 July 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"3","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ncaa2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/dl2link.com\/ncaa2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"205","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"77","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"38% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.09","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.68","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}