{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T07:08:33Z","timestamp":1784012913487,"version":"3.55.0"},"publisher-location":"Singapore","reference-count":25,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819228676","type":"print"},{"value":"9789819228683","type":"electronic"}],"license":[{"start":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T00:00:00Z","timestamp":1784073600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T00:00:00Z","timestamp":1784073600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2027]]},"DOI":"10.1007\/978-981-92-2868-3_33","type":"book-chapter","created":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T06:58:49Z","timestamp":1784012329000},"page":"387-396","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Industrial Anomaly Detection via Multi-view Image Attention Fusion"],"prefix":"10.1007","author":[{"given":"Yujie","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-0812-7694","authenticated-orcid":false,"given":"Xufei","family":"Zhuang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ting","family":"Du","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ziheng","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cha","family":"Gan-Qi-Qi-Ge","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ren","family":"Qing-Dao-Er-Ji","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanyuan","family":"Zhi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Lv","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yupeng","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,7,15]]},"reference":[{"key":"33_CR1","first-page":"9584","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"P Bergmann","year":"2019","unstructured":"Bergmann, P., Fauser, M., Sattlegger, D., Steger, C.: Mvtec ad \u2014 a comprehensive real-world dataset for unsupervised anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 9584\u20139592 (2019)"},{"issue":"4","key":"33_CR2","doi-asserted-by":"publisher","first-page":"947","DOI":"10.1007\/s11263-022-01578-9","volume":"130","author":"P Bergmann","year":"2022","unstructured":"Bergmann, P., Batzner, K., Fauser, M., Sattlegger, D., Steger, C.: Beyond dents and scratches: logical constraints in unsupervised anomaly detection and localization. Int. J. Comput. Vis. 130(4), 947\u2013969 (2022)","journal-title":"Int. J. Comput. Vis."},{"key":"33_CR3","first-page":"22883","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"C Wang","year":"2024","unstructured":"Wang, C., et al.: Real-iad: a real-world multi-view dataset for benchmarking versatile industrial anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 22883\u201322892 (2024)"},{"key":"33_CR4","volume-title":"Advances in Neural Information Processing Systems 36 (NeurIPS 2023), Datasets and Benchmarks Track","author":"Q Zhou","year":"2023","unstructured":"Zhou, Q., et al.: Pad: a dataset and benchmark for pose-agnostic anomaly detection. In: Advances in Neural Information Processing Systems 36 (NeurIPS 2023), Datasets and Benchmarks Track (2023)"},{"key":"33_CR5","first-page":"3950","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, VAND","author":"M Kruse","year":"2024","unstructured":"Kruse, M., Rudolph, M., Woiwode, D., Rosenhahn, B.: Splatpose & detect: pose-agnostic 3d anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, VAND, vol. 2, pp. 3950\u20133960 (2024)"},{"key":"33_CR6","first-page":"1906","volume-title":"Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV)","author":"M Rudolph","year":"2021","unstructured":"Rudolph, M., Wandt, B., Rosenhahn, B.: Same same but different: semi-supervised defect detection with normalizing flows. In: Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 1906\u20131915 (2021)"},{"key":"33_CR7","first-page":"1705","volume-title":"Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV)","author":"D Gong","year":"2019","unstructured":"Gong, D., et al.: Memorizing normality to detect anomaly: memory-augmented deep autoencoder for unsupervised anomaly detection. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV), pp. 1705\u20131714 (2019)"},{"key":"33_CR8","first-page":"1829","volume-title":"Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV)","author":"M Rudolph","year":"2022","unstructured":"Rudolph, M., Wehrbein, T., Rosenhahn, B., Wandt, B.: Fully convolutional cross-scale-flows for image-based defect detection. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV), pp. 1829\u20131838 (2022)"},{"key":"33_CR9","volume-title":"Advances in Neural Information Processing Systems 35 (NeurIPS 2022), Spotlight Track","author":"Z You","year":"2022","unstructured":"You, Z., et al.: A unified model for multi-class anomaly detection. In: Advances in Neural Information Processing Systems 35 (NeurIPS 2022), Spotlight Track (2022)"},{"key":"33_CR10","first-page":"202","volume-title":"Proceedings of the 17th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP)","author":"P Bergmann","year":"2022","unstructured":"Bergmann, P., Jin, X., Sattlegger, D., Steger, C.: The MVTec 3d-ad dataset for unsupervised 3d anomaly detection and localization. In: Proceedings of the 17th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP), pp. 202\u2013213 (2022)"},{"key":"33_CR11","first-page":"9646","volume-title":"Proceedings of the IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","author":"L Hua","year":"2025","unstructured":"Hua, L., Su, X., Luo, Y., You, S., Long, J.: HieClip: hierarchical clip with explicit alignment for zero-shot anomaly detection. In: Proceedings of the IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), pp. 9646\u20139650 (2025)"},{"key":"33_CR12","first-page":"1932","volume-title":"Proceedings of the AAAI Conference on Artificial Intelligence (AAAI)","author":"Z Gu","year":"2024","unstructured":"Gu, Z., Zhu, B., Zhu, G., Chen, Y., Tang, M., Wang, J.: AnomalyGPT: detecting industrial anomalies using large vision-language models. In: Proceedings of the AAAI Conference on Artificial Intelligence (AAAI), vol. 38, pp. 1932\u20131940 (2024)"},{"key":"33_CR13","first-page":"19606","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"J Jeong","year":"2023","unstructured":"Jeong, J., Zou, Y., Kim, T., Zhang, D., Ravichandran, A., Dabeer, O.: Winclip: zero\u2212\/few-shot anomaly classification and segmentation. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 19606\u201319616 (2023)"},{"key":"33_CR14","first-page":"1530","volume-title":"Proceedings of the 32nd International Conference on Machine Learning (ICML)","author":"DJ Rezende","year":"2015","unstructured":"Rezende, D.J., Mohamed, S.: Variational inference with normalizing flows. In: Proceedings of the 32nd International Conference on Machine Learning (ICML), pp. 1530\u20131538 (2015)"},{"key":"33_CR15","first-page":"28690","volume-title":"Proceedings of the AAAI Conference on Artificial Intelligence (AAAI)","author":"H He","year":"2024","unstructured":"He, H., et al.: DiAD: a diffusion based framework for multi-class anomaly detection. In: Proceedings of the AAAI Conference on Artificial Intelligence (AAAI), vol. 38, p. 28690 (2024)"},{"key":"33_CR16","volume-title":"5th International Conference on Learning Representations (ICLR)","author":"L Dinh","year":"2017","unstructured":"Dinh, L., Sohl-Dickstein, J., Bengio, S.: Density estimation using real NVP. In: 5th International Conference on Learning Representations (ICLR) (2017)"},{"key":"33_CR17","first-page":"945","volume-title":"Proceedings of the IEEE International Conference on Computer Vision (ICCV)","author":"H Su","year":"2015","unstructured":"Su, H., Maji, S., Kalogerakis, E., Learned-Miller, E.: Multi-view convolutional neural networks for 3d shape recognition. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV), pp. 945\u2013953 (2015)"},{"key":"33_CR18","first-page":"2492","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"X Gu","year":"2020","unstructured":"Gu, X., Fan, Z., Zhu, S., Dai, Z., Tan, F., Tan, P.: Cascade cost volume for high-resolution multi-view stereo and stereo matching. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 2492\u20132501 (2020)"},{"key":"33_CR19","first-page":"475","volume-title":"Proceedings of the International Conference on Pattern Recognition (ICPR)","author":"T Defard","year":"2021","unstructured":"Defard, T., Setkov, A., Loesch, A., Audigier, R.: PaDIM: a patch distribution modeling framework for anomaly detection and localization. In: Proceedings of the International Conference on Pattern Recognition (ICPR), pp. 475\u2013489. Springer (2021)"},{"key":"33_CR20","first-page":"1819","volume-title":"Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV)","author":"D Gudovskiy","year":"2022","unstructured":"Gudovskiy, D., Ishizaka, S., Kozuka, K.: CFLOW-ad: real-time unsupervised anomaly detection with localization via conditional normalizing flows. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV), pp. 1819\u20131828 (2022)"},{"key":"33_CR21","first-page":"3914","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"X Zhang","year":"2023","unstructured":"Zhang, X., Li, S., Li, X., Huang, P., Shan, J., Chen, T.: DeSTSeg: segmentation guided denoising student-teacher for anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 3914\u20133923 (2023)"},{"key":"33_CR22","first-page":"9737","volume-title":"Proceedings of the IEEE\/CVF on Computer Vision and Pattern Recognition (CVPR)","author":"H Deng","year":"2022","unstructured":"Deng, H., Li, X.: Anomaly detection via reverse distillation from one-class embedding. In: Proceedings of the IEEE\/CVF on Computer Vision and Pattern Recognition (CVPR), pp. 9737\u20139746 (2022)"},{"key":"33_CR23","first-page":"14298","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"K Roth","year":"2022","unstructured":"Roth, K., Pemula, L., Zepeda, J., Sch\u00f6lkopf, B., Brox, T., Gehler, P.: Towards total recall in industrial anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 14298\u201314308 (2022)"},{"key":"33_CR24","first-page":"462","volume-title":"Proceedings of the European Conference on Computer Vision (ECCV)","author":"Y Li","year":"2024","unstructured":"Li, Y., Dong, X., Chen, C., Zhuang, W., Lyu, L.: A simple background augmentation method for object detection with diffusion model. In: Proceedings of the European Conference on Computer Vision (ECCV), pp. 462\u2013479. Springer (2024)"},{"key":"33_CR25","first-page":"3933","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"M Kruse","year":"2025","unstructured":"Kruse, M., Rosenhahn, B.: Multi-flow: multi-view enriched normalizing flows for industrial anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 3933\u20133944 (2025)"}],"container-title":["Lecture Notes in Computer Science","Knowledge Science, Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-92-2868-3_33","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T06:58:54Z","timestamp":1784012334000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-92-2868-3_33"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,15]]},"ISBN":["9789819228676","9789819228683"],"references-count":25,"URL":"https:\/\/doi.org\/10.1007\/978-981-92-2868-3_33","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,15]]},"assertion":[{"value":"15 July 2026","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"KSEM","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Knowledge Science, Engineering and Management","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Beijing","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2026","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17 July 2026","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 July 2026","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ksem2026","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/ksem2026.rosc.org.cn\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}