{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T06:13:02Z","timestamp":1783923182093,"version":"3.55.0"},"publisher-location":"Singapore","reference-count":30,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819234400","type":"print"},{"value":"9789819234417","type":"electronic"}],"license":[{"start":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T00:00:00Z","timestamp":1783987200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T00:00:00Z","timestamp":1783987200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2027]]},"DOI":"10.1007\/978-981-92-3441-7_1","type":"book-chapter","created":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T05:38:35Z","timestamp":1783921115000},"page":"3-14","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Unsupervised Code Representation Learning via Contrastive Learning for Cross-Project Defect Prediction"],"prefix":"10.1007","author":[{"given":"Hanlin","family":"Zhao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhiyong","family":"Feng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ruitao","family":"Feng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,7,14]]},"reference":[{"key":"1_CR1","series-title":"Reliability, and Security (QRS)","first-page":"72","volume-title":"IEEE 23rd International Conference on Software Quality","author":"J Xu","year":"2023","unstructured":"Xu, J., Chen, P., Yin, B., Huang, Z., Qiu, Q.: FINDGATE: fine-grained defect prediction based on a heterogeneous discrete code graph-guided attention transformer. In: IEEE 23rd International Conference on Software Quality Reliability, and Security (QRS), pp. 72\u201382. IEEE, Piscataway, NJ (2023)"},{"key":"1_CR2","doi-asserted-by":"publisher","first-page":"161","DOI":"10.1016\/j.infsof.2018.10.003","volume":"106","author":"X Chen","year":"2019","unstructured":"Chen, X., Zhang, D., Zhao, Y., Cui, Z., Ni, C.: Software defect number prediction: unsupervised vs supervised methods. Inform. Softw. Technol. 106, 161\u2013181 (2019)","journal-title":"Inform. Softw. Technol."},{"key":"1_CR3","series-title":"Reliability and Security","first-page":"111","volume-title":"2018 IEEE International Conference on Software Quality","author":"X Zhang","year":"2018","unstructured":"Zhang, X., Ben, K., Zeng, J.: Cross-entropy: a new metric for software defect prediction. In: 2018 IEEE International Conference on Software Quality Reliability and Security, pp. 111\u2013122. IEEE, Piscataway, NJ (2018)"},{"issue":"6","key":"1_CR4","doi-asserted-by":"publisher","first-page":"1276","DOI":"10.1109\/TSE.2011.103","volume":"38","author":"T Hall","year":"2012","unstructured":"Hall, T., Beecham, S., Bowes, D., Gray, D., Counsell, S.: A systematic literature review on fault prediction performance in software engineering. IEEE Trans. Softw. Eng. 38(6), 1276\u20131304 (2012)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"12","key":"1_CR5","doi-asserted-by":"publisher","first-page":"2803","DOI":"10.1109\/TSE.2020.2968520","volume":"47","author":"H Chen","year":"2020","unstructured":"Chen, H., Jing, X., Li, Z., Wu, D., Peng, Y., Huang, Z.: An empirical study on heterogeneous defect prediction approaches. IEEE Trans. Softw. Eng. 47(12), 2803\u20132822 (2020)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"5","key":"1_CR6","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3719006","volume":"34","author":"I Ahmed","year":"2025","unstructured":"Ahmed, I. et al.: Artificial intelligence for software engineering: the journey so far and the road ahead. ACM Trans. Softw. Eng. Methodol. 34(5), 1\u201327 (2025)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"issue":"2","key":"1_CR7","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1007\/s11334-020-00380-5","volume":"18","author":"Y Khatri","year":"2022","unstructured":"Khatri, Y., Singh, S.K.: Cross project defect prediction: a comprehensive survey with its SWOT analysis. Innov. Syst. Softw. Eng. 18(2), 263\u2013281 (2022)","journal-title":"Innov. Syst. Softw. Eng."},{"key":"1_CR8","doi-asserted-by":"publisher","first-page":"456","DOI":"10.1109\/32.799939","volume":"25","author":"VR Basili","year":"1996","unstructured":"Basili, V.R., Briand, L.C., Melo, W.L.: A validation of object-oriented design metrics as quality indicators. IEEE Trans. Softw. Eng. 25, 456\u2013473 (1996)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"1_CR9","first-page":"353","volume":"71","author":"F Akiyama","year":"1971","unstructured":"Akiyama, F.: An example of software system debugging. Int. J. Perform. Eng. 71, 353\u2013359 (1971)","journal-title":"Int. J. Perform. Eng."},{"key":"1_CR10","volume-title":"Elements of Software Science (Operating and Programming Systems Series)","author":"M Halstead","year":"1977","unstructured":"Halstead, M.: Elements of Software Science (Operating and Programming Systems Series). Elsevier Science Inc., New York (1977)"},{"issue":"6","key":"1_CR11","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"S Chidamber","year":"1994","unstructured":"Chidamber, S., Kemerer, C.: A metrics suite for object-oriented design. IEEE Trans. Softw. Eng. 20(6), 476\u2013493 (1994)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"6","key":"1_CR12","doi-asserted-by":"publisher","first-page":"491","DOI":"10.1109\/32.689404","volume":"24","author":"R Harrison","year":"1998","unstructured":"Harrison, R., Counsell, S., Nithi, R.: An evaluation of the MOOD set of object-oriented software metrics. IEEE Trans. Softw. Eng. 24(6), 491\u2013496 (1998)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"1_CR13","doi-asserted-by":"publisher","first-page":"460","DOI":"10.1109\/ESEM.2009.5316002","volume-title":"2009 3rd International Symposium on Empirical Software Engineering and Measurement","author":"AEC Cruz","year":"2009","unstructured":"Cruz, A.E.C., Ochimizu, K.: Towards logistic regression models for predicting fault-prone code across software projects. In: 2009 3rd International Symposium on Empirical Software Engineering and Measurement, pp. 460\u2013463. IEEE Press, New York (2009)"},{"key":"1_CR14","first-page":"1","volume-title":"2014 Communications Security Conference (CSC 2014)","author":"C Shan","year":"2014","unstructured":"Shan, C., Chen, B., Hu, C., Xue, J., Li, N.: Software defect prediction model based on LLE and SVM. In: 2014 Communications Security Conference (CSC 2014), pp. 1\u20135. IEEE, New York (2014)"},{"key":"1_CR15","first-page":"548","volume-title":"2018 ACM\/IEEE 40th International Conference on Software Engineering: Companion (ICSE-Companion)","author":"K Meinke","year":"2018","unstructured":"Meinke, K., Bennaceur, A.: Machine learning for software engineering: models, methods, and applications. In: 2018 ACM\/IEEE 40th International Conference on Software Engineering: Companion (ICSE-Companion), pp. 548\u2013549. IEEE, Piscataway, NJ (2018)"},{"key":"1_CR16","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1145\/1181309.1181314","volume-title":"ASID \u201906: Proceedings of the 1st Workshop on Architectural and System Support for Improving Software Dependability","author":"Z Li","year":"2006","unstructured":"Li, Z., Tan, L., Wang, X., Lu, S., Zhou, Y., Zhai, C.: Have things changed now? An empirical study of bug characteristics in modern open source software. In: ASID \u201906: Proceedings of the 1st Workshop on Architectural and System Support for Improving Software Dependability, pp. 25\u201333. ACM, New York (2006)"},{"key":"1_CR17","first-page":"334","volume-title":"Proceedings of the 12th Working Conference on Mining Software Repositories","author":"M White","year":"2015","unstructured":"White, M., Vendome, C., Linares-V\u00e1squez, M., Poshyvanyk, D.: Toward deep learning software repositories. In: Proceedings of the 12th Working Conference on Mining Software Repositories, pp. 334\u2013345. IEEE Press, Piscataway (2015)"},{"key":"1_CR18","first-page":"297","volume-title":"Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14\u201322, 2016","author":"S Wang","year":"2016","unstructured":"Wang, S., Liu, T., Tan, L.: Automatically learning semantic features for defect prediction. In: Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14\u201322, 2016, pp. 297\u2013308. ACM, New York (2016)"},{"key":"1_CR19","series-title":"Reliability and Security (QRS), July 25\u201329, 2017","first-page":"318","volume-title":"2017 IEEE International Conference on Software Quality","author":"J Li","year":"2017","unstructured":"Li, J., He, P., Zhu, J., Lyu, M.R.: Software defect prediction via convolutional neural network. In: 2017 IEEE International Conference on Software Quality Reliability and Security (QRS), July 25\u201329, 2017, pp. 318\u2013328. IEEE Computer Society, Los Alamitos, California (2017)"},{"key":"1_CR20","doi-asserted-by":"publisher","first-page":"161","DOI":"10.1109\/DSA52907.2021.00025","volume-title":"Proceedings of 2021 8th International Conference on Dependable Systems and Their Applications (DSA) 5\u20136, 2021","author":"TY Yu","year":"2021","unstructured":"Yu, T.Y., Huang, C.Y., Fang, N.C.: Use of deep learning model with attention mechanism for software fault prediction. In: Proceedings of 2021 8th International Conference on Dependable Systems and Their Applications (DSA) 5\u20136, 2021, pp. 161\u2013171. IEEE, Piscataway (2021)"},{"issue":"1","key":"1_CR21","doi-asserted-by":"publisher","first-page":"84","DOI":"10.1109\/TSE.2022.3144348","volume":"49","author":"C Pornprasit","year":"2023","unstructured":"Pornprasit, C., Tantithamthavorn, C.K.: DeepLineDP: towards a deep learning approach for line-level defect prediction. IEEE Trans. Softw. Eng. 49(1), 84\u201398 (2023)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"1","key":"1_CR22","doi-asserted-by":"publisher","first-page":"172","DOI":"10.1109\/TSE.2024.3503723","volume":"51","author":"S Yin","year":"2025","unstructured":"Yin, S. et al.: Line-level defect prediction by capturing code contexts with graph convolutional networks. IEEE Trans. Softw. Eng. 51(1), 172\u2013191 (2025)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"1_CR23","doi-asserted-by":"publisher","first-page":"152","DOI":"10.1007\/s44196-024-00551-3","volume":"17","author":"X Wang","year":"2024","unstructured":"Wang, X., Lu, L., Yang, Z., Tian, Q., Lin, H.: Parameter-efficient multi-classification software defect detection method based on pre-trained LLMs. Int. J. Comput. Intell. Syst. 17, 152 (2024). https:\/\/doi.org\/10.1007\/s44196-024-00551-3","journal-title":"Int. J. Comput. Intell. Syst."},{"key":"1_CR24","first-page":"6706","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Seattle, WA, USA, June 14\u201319, 2020","author":"I Misra","year":"2020","unstructured":"Misra, I., van der Maaten, L.: Self-supervised learning of pretext-invariant representations. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Seattle, WA, USA, June 14\u201319, 2020, pp. 6706\u20136716. IEEE, Piscataway (2020)"},{"issue":"10","key":"1_CR25","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3561970","volume":"55","author":"N Rethmeier","year":"2023","unstructured":"Rethmeier, N., Augenstein, I.: A primer on contrastive pretraining in language processing: methods, lessons learned, and perspectives. ACM Comput. Surv. 55(10), 1\u201317 (2023)","journal-title":"ACM Comput. Surv."},{"key":"1_CR26","first-page":"1322","volume-title":"Proceedings of the 2008 IEEE International Joint Conference on Neural Networks (IJCNN 2008), Hong Kong, China, June 1\u20138, 2008","author":"H He","year":"2008","unstructured":"He, H., Bai, Y., Garcia, E.A., Li, S.: ADASYN: adaptive synthetic sampling approach for imbalanced learning. In: Proceedings of the 2008 IEEE International Joint Conference on Neural Networks (IJCNN 2008), Hong Kong, China, June 1\u20138, 2008, pp. 1322\u20131328. IEEE, Piscataway (2008)"},{"key":"1_CR27","first-page":"437","volume-title":"Proceedings of the 2014 International Symposium on Software Testing and Analysis (ISSTA 2014), San Jose, CA, USA, July 21\u201325, 2014","author":"R Just","year":"2014","unstructured":"Just, R., Jalali, D., Ernst, M.D.: Defects4J: a database of existing faults to enable controlled testing studies for Java programs. In: Proceedings of the 2014 International Symposium on Software Testing and Analysis (ISSTA 2014), San Jose, CA, USA, July 21\u201325, 2014, pp. 437\u2013440. ACM, New York (2014)"},{"key":"1_CR28","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1145\/1368088.1368161","volume-title":"Proceedings of the 30th International Conference on Software Engineering","author":"T Zimmermann","year":"2008","unstructured":"Zimmermann, T., Nagappan, N.: Predicting defects using network analysis on dependency graphs. In: Sch\u00e4fer, W., Dwyer, M.B., Gruhn, V. (eds.) Proceedings of the 30th International Conference on Software Engineering, pp. 531\u2013540. ACM, New York (2008)"},{"issue":"2","key":"1_CR29","doi-asserted-by":"publisher","first-page":"237","DOI":"10.1109\/TSE.2012.20","volume":"39","author":"K Dejaeger","year":"2012","unstructured":"Dejaeger, K., Verbraken, T., Baesens, B.: Toward comprehensible software fault prediction models using Bayesian network classifiers. IEEE Trans. Softw. Eng. 39(2), 237\u2013257 (2012)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"5","key":"1_CR30","doi-asserted-by":"publisher","first-page":"649","DOI":"10.1016\/j.jss.2007.07.040","volume":"81","author":"HA Alhija","year":"2008","unstructured":"Alhija, H.A., Azzeh, M., Almasalha, F.: Predicting defect-prone software modules using support vector machines. J. Syst. Softw. 81(5), 649\u2013660 (2008)","journal-title":"J. Syst. Softw."}],"container-title":["Lecture Notes in Computer Science","Advanced Intelligent Computing Technology and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-92-3441-7_1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T05:38:37Z","timestamp":1783921117000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-92-3441-7_1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,14]]},"ISBN":["9789819234400","9789819234417"],"references-count":30,"URL":"https:\/\/doi.org\/10.1007\/978-981-92-3441-7_1","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,14]]},"assertion":[{"value":"14 July 2026","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"The authors have no competing interests to declare that are relevant to the content of this article.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Disclosure of Interests"}},{"value":"ICIC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Toronto","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Canada","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2026","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 July 2026","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 July 2026","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icic2026a","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.ic-icc.cn\/2026\/index.htm","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}