{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,20]],"date-time":"2026-07-20T07:08:37Z","timestamp":1784531317610,"version":"3.55.0"},"publisher-location":"Singapore","reference-count":38,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819234493","type":"print"},{"value":"9789819234509","type":"electronic"}],"license":[{"start":{"date-parts":[[2026,7,21]],"date-time":"2026-07-21T00:00:00Z","timestamp":1784592000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2026,7,21]],"date-time":"2026-07-21T00:00:00Z","timestamp":1784592000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2027]]},"DOI":"10.1007\/978-981-92-3450-9_50","type":"book-chapter","created":{"date-parts":[[2026,7,20]],"date-time":"2026-07-20T07:00:23Z","timestamp":1784530823000},"page":"610-622","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Fine-Grained Repair Knowledge Organization for Knowledge-Guided Automated Program Repair"],"prefix":"10.1007","author":[{"given":"Jindong","family":"Jiang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haoxuan","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yi","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nan","family":"Lin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shihang","family":"Yu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoyan","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiayin","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,7,21]]},"reference":[{"issue":"10","key":"50_CR1","doi-asserted-by":"publisher","first-page":"2162","DOI":"10.1109\/TSE.2019.2944914","volume":"47","author":"A Afzal","year":"2019","unstructured":"Afzal, A., Motwani, M., Stolee, K.T., Brun, Y., Le Goues, C.: Sosrepair: expressive semantic search for real-world program repair. IEEE Trans. Softw. Eng. 47(10), 2162\u20132181 (2019)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"5","key":"50_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-021-09989-x","volume":"26","author":"A Aleti","year":"2021","unstructured":"Aleti, A., Martinez, M.: E-apr: mapping the effectiveness of automated program repair techniques. Empir. Softw. Eng. 26(5), 99 (2021)","journal-title":"Empir. Softw. Eng."},{"issue":"OOPSLA","key":"50_CR3","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3360585","volume":"3","author":"J Bader","year":"2019","unstructured":"Bader, J., Scott, A., Pradel, M., Chandra, S.: Getafix: learning to fix bugs automatically. Proc. ACM Program. Lang. 3(OOPSLA), 1\u201327 (2019)","journal-title":"Proc. ACM Program. Lang."},{"issue":"1","key":"50_CR4","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-023-10415-7","volume":"29","author":"QC Bui","year":"2024","unstructured":"Bui, Q.C., Paramitha, R., Vu, D.L., Massacci, F., Scandariato, R.: Apr4vul: an empirical study of automatic program repair techniques on real-world java vulnerabilities. Empir. Softw. Eng. 29(1), 18 (2024)","journal-title":"Empir. Softw. Eng."},{"issue":"2","key":"50_CR5","doi-asserted-by":"publisher","first-page":"831","DOI":"10.1109\/TSE.2022.3164662","volume":"49","author":"L Chen","year":"2022","unstructured":"Chen, L., Pei, Y., Pan, M., Zhang, T., Wang, Q., Furia, C.A.: Program repair with repeated learning. IEEE Trans. Softw. Eng. 49(2), 831\u2013848 (2022)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"9","key":"50_CR6","first-page":"1943","volume":"47","author":"Z Chen","year":"2019","unstructured":"Chen, Z., Kommrusch, S., Tufano, M., Pouchet, L.N., Poshyvanyk, D., Monperrus, M.: Sequencer: sequence-to-sequence learning for end-to-end program repair. IEEE Trans. Softw. Eng. 47(9), 1943\u20131959 (2019)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"50_CR7","doi-asserted-by":"publisher","first-page":"302","DOI":"10.1145\/3338906.3338911","volume-title":"Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering","author":"T Durieux","year":"2019","unstructured":"Durieux, T., Madeiral, F., Martinez, M., Abreu, R.: Empirical review of java program repair tools: a large-scale experiment on 2,141 bugs and 23,551 repair attempts. In: Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp. 302\u2013313 (2019)"},{"key":"50_CR8","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1145\/2896921.2896931","volume-title":"Proceedings of the 11th International Workshop on Automation of Software Test","author":"T Durieux","year":"2016","unstructured":"Durieux, T., Monperrus, M.: Dynamoth: dynamic code synthesis for automatic program repair. In: Proceedings of the 11th International Workshop on Automation of Software Test, pp. 85\u201391 (2016)"},{"key":"50_CR9","first-page":"1","volume-title":"Proceedings of the IEEE\/ACM 46th International Conference on Software Engineering","author":"H Eladawy","year":"2024","unstructured":"Eladawy, H., Le Goues, C., Brun, Y.: Automated program repair, what is it good for? Not absolutely nothing! In: Proceedings of the IEEE\/ACM 46th International Conference on Software Engineering, pp. 1\u201313 (2024)"},{"key":"50_CR10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2024.112083","volume":"214","author":"R Gharibi","year":"2024","unstructured":"Gharibi, R., Sadreddini, M.H., Fakhrahmad, S.M.: T5apr: empowering automated program repair across languages through checkpoint ensemble. J. Syst. Softw. 214, 112083 (2024)","journal-title":"J. Syst. Softw."},{"key":"50_CR11","first-page":"1895","volume-title":"ICSE","author":"K Huang","year":"2025","unstructured":"Huang, K., Zhang, J., Meng, X., Liu, Y.: Template-guided program repair in the era of large language models. In: ICSE, pp. 1895\u20131907 (2025)"},{"key":"50_CR12","doi-asserted-by":"publisher","first-page":"1430","DOI":"10.1109\/ICSE48619.2023.00125","volume-title":"2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE)","author":"N Jiang","year":"2023","unstructured":"Jiang, N., Liu, K., Lutellier, T., Tan, L.: Impact of code language models on automated program repair. In: 2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE), pp. 1430\u20131442. IEEE (2023)"},{"key":"50_CR13","doi-asserted-by":"publisher","first-page":"1251","DOI":"10.1109\/ICSE48619.2023.00111","volume-title":"2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE)","author":"N Jiang","year":"2023","unstructured":"Jiang, N., Lutellier, T., Lou, Y., Tan, L., Goldwasser, D., Zhang, X.K.: Domain knowledge distilled tree decoder for automated program repair. In: 2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE), pp. 1251\u20131263. IEEE (2023)"},{"key":"50_CR14","doi-asserted-by":"publisher","first-page":"1161","DOI":"10.1109\/ICSE43902.2021.00107","volume-title":"2021 IEEE\/ACM 43rd International Conference on Software Engineering (ICSE)","author":"N Jiang","year":"2021","unstructured":"Jiang, N., Lutellier, T., Tan, L.C.: Code-aware neural machine translation for automatic program repair. In: 2021 IEEE\/ACM 43rd International Conference on Software Engineering (ICSE), pp. 1161\u20131173. IEEE (2021)"},{"key":"50_CR15","doi-asserted-by":"publisher","first-page":"437","DOI":"10.1145\/2610384.2628055","volume-title":"Proceedings of the 2014 International Symposium on Software Testing and Analysis","author":"R Just","year":"2014","unstructured":"Just, R., Jalali, D., Ernst, M.D.: Defects4j: a database of existing faults to enable controlled testing studies for java programs. In: Proceedings of the 2014 International Symposium on Software Testing and Analysis, pp. 437\u2013440 (2014)"},{"key":"50_CR16","doi-asserted-by":"publisher","first-page":"802","DOI":"10.1109\/ICSE.2013.6606626","volume-title":"2013 35th International Conference on Software Engineering (ICSE)","author":"D Kim","year":"2013","unstructured":"Kim, D., Nam, J., Song, J., Kim, S.: Automatic patch generation learned from human-written patches. In: 2013 35th International Conference on Software Engineering (ICSE), pp. 802\u2013811. IEEE (2013)"},{"issue":"3","key":"50_CR17","doi-asserted-by":"publisher","first-page":"1980","DOI":"10.1007\/s10664-019-09780-z","volume":"25","author":"A Koyuncu","year":"2020","unstructured":"Koyuncu, A. et al.: Fixminer: mining relevant fix patterns for automated program repair. Empir. Softw. Eng. 25(3), 1980\u20132024 (2020)","journal-title":"Empir. Softw. Eng."},{"issue":"1","key":"50_CR18","doi-asserted-by":"publisher","first-page":"54","DOI":"10.1109\/TSE.2011.104","volume":"38","author":"C Le Goues","year":"2011","unstructured":"Le Goues, C., Nguyen, T., Forrest, S., Weimer, W.: Genprog: a generic method for automatic software repair. IEEE Trans. Softw. Eng. 38(1), 54\u201372 (2011)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"12","key":"50_CR19","doi-asserted-by":"publisher","first-page":"56","DOI":"10.1145\/3318162","volume":"62","author":"C Le Goues","year":"2019","unstructured":"Le Goues, C., Pradel, M., Roychoudhury, A.: Automated program repair. Commun. ACM. 62(12), 56\u201365 (2019)","journal-title":"Commun. ACM"},{"issue":"7","key":"50_CR20","first-page":"1","volume":"34","author":"F Li","year":"2025","unstructured":"Li, F., Jiang, J., Sun, J., Zhang, H.: Hybrid automated program repair by combining large language models and program analysis. ACM Trans. Softw. Eng. Methodol. 34(7), 1\u201328 (2025)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"50_CR21","first-page":"1","volume-title":"2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER)","author":"K Liu","year":"2019","unstructured":"Liu, K., Koyuncu, A., Kim, D., Bissyand'e, T.F.: Avatar: fixing semantic bugs with fix patterns of static analysis violations. In: 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), pp. 1\u201312. IEEE (2019)"},{"key":"50_CR22","doi-asserted-by":"publisher","first-page":"31","DOI":"10.1145\/3293882.3330577","volume-title":"Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis","author":"K Liu","year":"2019","unstructured":"Liu, K., Koyuncu, A., Kim, D., Bissyand'e, T.F.: Tbar: revisiting template-based automated program repair. In: Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 31\u201342 (2019)"},{"key":"50_CR23","doi-asserted-by":"publisher","first-page":"101","DOI":"10.1145\/3395363.3397369","volume-title":"Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis","author":"T Lutellier","year":"2020","unstructured":"Lutellier, T., Pham, H.V., Pang, L., Li, Y., Wei, M., Tan, L.: Coconut: combining context-aware neural translation models using ensemble for program repair. In: Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 101\u2013114 (2020)"},{"key":"50_CR24","doi-asserted-by":"publisher","first-page":"65","DOI":"10.1007\/978-3-319-99241-9_3","volume-title":"International Symposium on Search Based Software Engineering","author":"M Martinez","year":"2018","unstructured":"Martinez, M., Monperrus, M.: Ultra-large repair search space with automatically mined templates: the cardumen mode of astor. In: International Symposium on Search Based Software Engineering, pp. 65\u201386. Springer (2018)"},{"key":"50_CR25","doi-asserted-by":"publisher","first-page":"691","DOI":"10.1145\/2884781.2884807","volume-title":"Proceedings of the 38th International Conference on Software Engineering","author":"S Mechtaev","year":"2016","unstructured":"Mechtaev, S., Yi, J., Roychoudhury, A.: Angelix: scalable multiline program patch synthesis via symbolic analysis. In: Proceedings of the 38th International Conference on Software Engineering, pp. 691\u2013701 (2016)"},{"key":"50_CR26","doi-asserted-by":"publisher","first-page":"1169","DOI":"10.1145\/3510003.3510147","volume-title":"Proceedings of the 44th International Conference on Software Engineering","author":"X Meng","year":"2022","unstructured":"Meng, X., Wang, X., Zhang, H., Sun, H., Liu, X.: Improving fault localization and program repair with deep semantic features and transferred knowledge. In: Proceedings of the 44th International Conference on Software Engineering, pp. 1169\u20131180 (2022)"},{"key":"50_CR27","doi-asserted-by":"publisher","first-page":"1456","DOI":"10.1109\/ICSE48619.2023.00127","volume-title":"2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE)","author":"X Meng","year":"2023","unstructured":"Meng, X., Wang, X., Zhang, H., Sun, H., Liu, X., Hu, C.: Template-based neural program repair. In: 2023 IEEE\/ACM 45th International Conference on Software Engineering (ICSE), pp. 1456\u20131468. IEEE (2023)"},{"issue":"1","key":"50_CR28","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3105906","volume":"51","author":"M Monperrus","year":"2018","unstructured":"Monperrus, M.: Automatic software repair: a bibliography. ACM Comput. Surv. (CSUR). 51(1), 1\u201324 (2018)","journal-title":"ACM Comput. Surv. (CSUR)"},{"issue":"2","key":"50_CR29","doi-asserted-by":"publisher","first-page":"637","DOI":"10.1109\/TSE.2020.2998785","volume":"48","author":"M Motwani","year":"2020","unstructured":"Motwani, M., Soto, M., Brun, Y., Just, R., Le Goues, C.: Quality of automated program repair on real-world defects. IEEE Trans. Softw. Eng. 48(2), 637\u2013661 (2020)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"50_CR30","first-page":"1","volume-title":"Proceedings of the 46th IEEE\/ACM International Conference on Software Engineering","author":"Y Peng","year":"2024","unstructured":"Peng, Y., Gao, S., Gao, C., Huo, Y., Lyu, M.: Domain knowledge matters: improving prompts with fix templates for repairing python type errors. In: Proceedings of the 46th IEEE\/ACM International Conference on Software Engineering, pp. 1\u201313 (2024)"},{"key":"50_CR31","doi-asserted-by":"publisher","first-page":"69","DOI":"10.1145\/3524459.3527351","volume-title":"Proceedings of the Third International Workshop on Automated Program Repair","author":"JA Prenner","year":"2022","unstructured":"Prenner, J.A., Babii, H., Robbes, R.: Can openai\u2019s codex fix bugs? An evaluation on quixbugs. In: Proceedings of the Third International Workshop on Automated Program Repair, pp. 69\u201375 (2022)"},{"key":"50_CR32","doi-asserted-by":"publisher","first-page":"13","DOI":"10.1109\/ICSE.2019.00020","volume-title":"2019 IEEE\/ACM 41st International Conference on Software Engineering (ICSE)","author":"S Saha","year":"2019","unstructured":"Saha, S., et al.: Harnessing evolution for multi-hunk program repair. In: 2019 IEEE\/ACM 41st International Conference on Software Engineering (ICSE), pp. 13\u201324. IEEE (2019)"},{"key":"50_CR33","volume-title":"ICLR 2025","author":"T Sun","year":"2025","unstructured":"Sun, T. et al.: Repofixeval: a repository-level program repair benchmark from issue discovering to bug fixing. In: ICLR 2025 (2025)"},{"issue":"5","key":"50_CR34","doi-asserted-by":"publisher","DOI":"10.3390\/app10051593","volume":"10","author":"Y Venugopal","year":"2020","unstructured":"Venugopal, Y., Quang-Ngoc, P., Eunseok, L.: Modification point aware test prioritization and sampling to improve patch validation in automatic program repair. Appl. Sci. 10(5), 1593 (2020)","journal-title":"Appl. Sci."},{"key":"50_CR35","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1145\/3611643.3616256","volume-title":"Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering","author":"W Wang","year":"2023","unstructured":"Wang, W., Wang, Y., Joty, S., Hoi, S.C.: Rap-gen: retrieval-augmented patch generation with codet5 for automatic program repair. In: Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp. 146\u2013158 (2023)"},{"key":"50_CR36","doi-asserted-by":"publisher","unstructured":"Xia, C.S., Zhang, L.: Conversational automated program repair. arXiv. (2023). https:\/\/doi.org\/10.48550\/arXiv.2301.13246","DOI":"10.48550\/arXiv.2301.13246"},{"key":"50_CR37","doi-asserted-by":"publisher","first-page":"416","DOI":"10.1109\/ICSE.2017.45","volume-title":"2017 IEEE\/ACM 39th International Conference on Software Engineering (ICSE)","author":"Y Xiong","year":"2017","unstructured":"Xiong, Y. et al.: Precise condition synthesis for program repair. In: 2017 IEEE\/ACM 39th International Conference on Software Engineering (ICSE), pp. 416\u2013426. IEEE (2017)"},{"issue":"1","key":"50_CR38","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/TSE.2016.2560811","volume":"43","author":"J Xuan","year":"2016","unstructured":"Xuan, J. et al.: Nopol: automatic repair of conditional statement bugs in java programs. IEEE Trans. Softw. Eng. 43(1), 34\u201355 (2016)","journal-title":"IEEE Trans. Softw. Eng."}],"container-title":["Lecture Notes in Computer Science","Advanced Intelligent Computing Technology and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-92-3450-9_50","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,20]],"date-time":"2026-07-20T07:00:25Z","timestamp":1784530825000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-92-3450-9_50"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,21]]},"ISBN":["9789819234493","9789819234509"],"references-count":38,"URL":"https:\/\/doi.org\/10.1007\/978-981-92-3450-9_50","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,21]]},"assertion":[{"value":"21 July 2026","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Toronto","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Canada","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2026","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 July 2026","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 July 2026","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icic2026a","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.ic-icc.cn\/2026\/index.htm","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}