{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T08:09:37Z","timestamp":1783930177913,"version":"3.55.0"},"publisher-location":"Singapore","reference-count":28,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819235032","type":"print"},{"value":"9789819235049","type":"electronic"}],"license":[{"start":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T00:00:00Z","timestamp":1783987200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T00:00:00Z","timestamp":1783987200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2027]]},"DOI":"10.1007\/978-981-92-3504-9_36","type":"book-chapter","created":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T07:36:24Z","timestamp":1783928184000},"page":"438-449","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Few-Shot Anomaly Image Generation Based on Dual-Interrelated Diffusion Model with Feature-Aligned"],"prefix":"10.1007","author":[{"given":"Yv","family":"Zhao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fei","family":"Han","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qinghua","family":"Ling","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,7,14]]},"reference":[{"key":"36_CR1","first-page":"9592","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"P Bergmann","year":"2019","unstructured":"Bergmann, P., Fauser, M., Sattlegger, D., Steger, C.: MVTec AD \u2013 a comprehensive real-world dataset for unsupervised anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 9592\u20139600 (2019)"},{"key":"36_CR2","first-page":"9737","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"H Deng","year":"2022","unstructured":"Deng, H., Li, X.: Anomaly detection via reverse distillation from one-class embedding. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 9737\u20139746 (2022)"},{"key":"36_CR3","first-page":"7388","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"C Ding","year":"2022","unstructured":"Ding, C., Pang, G., Shen, C.: Catching both gray and black swans: open-set supervised anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 7388\u20137398 (2022)"},{"key":"36_CR4","first-page":"571","volume-title":"Proceedings of the AAAI Conference on Artificial Intelligence","author":"Y Duan","year":"2023","unstructured":"Duan, Y., Yan, H., Li, N., Zhang, L.: Few-shot defect image generation via defect-aware feature manipulation. In: Proceedings of the AAAI Conference on Artificial Intelligence, pp. 571\u2013578 (2023)"},{"key":"36_CR5","unstructured":"Gal, R., et al. An image is worth one word: Personalizing text-to-image generation using textual inversion. arXiv preprint https:\/\/arxiv.org\/abs\/2208.01618 (2022)."},{"issue":"11","key":"36_CR6","doi-asserted-by":"publisher","first-page":"139","DOI":"10.1145\/3422622","volume":"63","author":"G Ian","year":"2020","unstructured":"Ian, G., et al.: Generative adversarial networks. Commun. ACM. 63(11), 139\u2013144 (2020)","journal-title":"Commun. ACM"},{"key":"36_CR7","unstructured":"Hu, E.J., et al. LoRA: Low-rank adaptation of large language models. arXiv preprint https:\/\/arxiv.org\/abs\/2106.09685 (2021)."},{"key":"36_CR8","first-page":"8526","volume-title":"Proceedings of the AAAI Conference on Artificial Intelligence","author":"T Hu","year":"2024","unstructured":"Hu, T., et al.: AnomalyDiffusion: few-shot anomaly image generation with diffusion model. In: Proceedings of the AAAI Conference on Artificial Intelligence, pp. 8526\u20138534 (2024)"},{"key":"36_CR9","first-page":"4015","volume-title":"Proceedings of the IEEE\/CVF International Conference on Computer Vision","author":"A Kirillov","year":"2023","unstructured":"Kirillov, A., et al.: Segment anything. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 4015\u20134026 (2023)"},{"key":"36_CR10","doi-asserted-by":"publisher","first-page":"78446","DOI":"10.1109\/ACCESS.2022.3193699","volume":"10","author":"S Lee","year":"2022","unstructured":"Lee, S., Lee, S., Song, B.C.: CFA: coupled-hypersphere-based feature adaptation for target-oriented anomaly localization. IEEE Access. 10, 78446\u201378454 (2022)","journal-title":"IEEE Access"},{"key":"36_CR11","first-page":"9664","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"C-L Li","year":"2021","unstructured":"Li, C.-L., Sohn, K., Yoon, J., Pfister, T.: CutPaste: self-supervised learning for anomaly detection and localization. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 9664\u20139674 (2021)"},{"key":"36_CR12","unstructured":"Li, X., et al. MUSC: Zero-shot industrial anomaly classification and segmentation with mutual scoring of the unlabeled images. arXiv preprint https:\/\/arxiv.org\/abs\/2401.16753 (2024)."},{"key":"36_CR13","first-page":"1","volume-title":"2021 IEEE International Conference on Multimedia and Expo (ICME)","author":"D Lin","year":"2021","unstructured":"Lin, D., Cao, Y., Zhu, W., Li, Y.: Few-shot defect segmentation leveraging abundant defect-free training samples through normal background regularization and crop-and-paste operation. In: 2021 IEEE International Conference on Multimedia and Expo (ICME), pp. 1\u20136. IEEE (2021)"},{"key":"36_CR14","unstructured":"Mo, S., Cho, M., Shin, J. Freeze the discriminator: a simple baseline for fine-tuning GANs. arXiv preprint https:\/\/arxiv.org\/abs\/2002.10964 (2020)."},{"issue":"3","key":"36_CR15","first-page":"1611","volume":"17","author":"S Niu","year":"2020","unstructured":"Niu, S., Li, B., Wang, X., Lin, H.: Defect image sample generation with GAN for improving defect recognition. IEEE Trans. Autom. Sci. Eng. 17(3), 1611\u20131622 (2020)","journal-title":"IEEE Trans. Autom. Sci. Eng."},{"key":"36_CR16","first-page":"10743","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"U Ojha","year":"2021","unstructured":"Ojha, U., et al.: Few-shot image generation via cross-domain correspondence. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 10743\u201310752 (2021)"},{"key":"36_CR17","unstructured":"Pang, G., et al. Explainable deep few-shot anomaly detection with deviation networks. arXiv preprint https:\/\/arxiv.org\/abs\/2108.00462 (2021)."},{"key":"36_CR18","first-page":"8748","volume-title":"International Conference on Machine Learning","author":"A Radford","year":"2021","unstructured":"Radford, A., et al.: Learning transferable visual models from natural language supervision. In: International Conference on Machine Learning, pp. 8748\u20138763. PMLR (2021)"},{"key":"36_CR19","first-page":"13576","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"NC Ristea","year":"2022","unstructured":"Ristea, N.C., et al.: Self-supervised predictive convolutional attentive block for anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 13576\u201313586 (2022)"},{"key":"36_CR20","first-page":"10684","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"R Rombach","year":"2022","unstructured":"Rombach, R., et al.: High-resolution image synthesis with latent diffusion models. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 10684\u201310695 (2022)"},{"key":"36_CR21","first-page":"14318","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"K Roth","year":"2022","unstructured":"Roth, K., et al.: Towards total recall in industrial anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 14318\u201314328 (2022)"},{"key":"36_CR22","first-page":"22500","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"N Ruiz","year":"2023","unstructured":"Ruiz, N., et al.: DreamBooth: fine tuning text-to-image diffusion models for subject-driven generation. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 22500\u201322510 (2023)"},{"key":"36_CR23","first-page":"29","volume-title":"Advances in Neural Information Processing Systems","author":"T Salimans","year":"2016","unstructured":"Salimans, T., et al.: Improved techniques for training gans. In: Advances in Neural Information Processing Systems, p. 29 (2016)"},{"key":"36_CR24","doi-asserted-by":"crossref","unstructured":"Yi, R., et al.: Feditnet++: few-shot editing of latent semantics in Gan spaces with correlated attribute disentanglement. IEEE Trans. Pattern Anal. Mach. Intell. (2024)","DOI":"10.1109\/TPAMI.2024.3432529"},{"key":"36_CR25","first-page":"8330","volume-title":"Proceedings of the IEEE\/CVF International Conference on Computer Vision","author":"V Zavrtanik","year":"2021","unstructured":"Zavrtanik, V., Kristan, M., Sko\u010daj, D.: Draema discriminatively trained reconstruction embedding for surface anomaly detection. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 8330\u20138339 (2021)"},{"key":"36_CR26","first-page":"2524","volume-title":"Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision","author":"G Zhang","year":"2021","unstructured":"Zhang, G., Cui, K., Hung, T.-Y., Lu, S.: Defect-GAN: high-fidelity defect synthesis for automated defect inspection. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision, pp. 2524\u20132534 (2021)"},{"key":"36_CR27","first-page":"16281","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","author":"H Zhang","year":"2023","unstructured":"Zhang, H., et al.: Prototypical residual networks for anomaly detection and localization. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 16281\u201316291 (2023)"},{"key":"36_CR28","first-page":"30420","volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"Y Jin","year":"2025","unstructured":"Jin, Y., et al.: Dual-interrelated diffusion model for few-shot anomaly image generation. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 30420\u201330429 (2025)"}],"container-title":["Lecture Notes in Computer Science","Advanced Intelligent Computing Technology and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-92-3504-9_36","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T07:36:28Z","timestamp":1783928188000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-92-3504-9_36"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,14]]},"ISBN":["9789819235032","9789819235049"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-981-92-3504-9_36","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,14]]},"assertion":[{"value":"14 July 2026","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Toronto","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Canada","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2026","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 July 2026","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 July 2026","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icic2026a","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.ic-icc.cn\/2026\/index.htm","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}