{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T14:27:04Z","timestamp":1742912824090,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":40,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789819736256"},{"type":"electronic","value":"9789819736263"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-981-97-3626-3_25","type":"book-chapter","created":{"date-parts":[[2024,6,20]],"date-time":"2024-06-20T10:07:45Z","timestamp":1718878065000},"page":"338-352","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Visual Detection System for\u00a0Industrial Defects"],"prefix":"10.1007","author":[{"given":"Lei","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aiming","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiyong","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiu","family":"Shen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,6,21]]},"reference":[{"key":"25_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"66","DOI":"10.1007\/978-3-540-79547-6_7","volume-title":"Computer Vision Systems","author":"R Achanta","year":"2008","unstructured":"Achanta, R., Estrada, F., Wils, P., S\u00fcsstrunk, S.: Salient region detection and segmentation. In: Gasteratos, A., Vincze, M., Tsotsos, J.K. (eds.) ICVS 2008. LNCS, vol. 5008, pp. 66\u201375. Springer, Heidelberg (2008). https:\/\/doi.org\/10.1007\/978-3-540-79547-6_7"},{"key":"25_CR2","doi-asserted-by":"crossref","unstructured":"Achanta, R., Hemami, S., Estrada, F., Susstrunk, S.: Frequency-tuned salient region detection. In: 2009 IEEE Conference on Computer Vision and Pattern Recognition, pp. 1597\u20131604. IEEE (2009)","DOI":"10.1109\/CVPR.2009.5206596"},{"key":"25_CR3","doi-asserted-by":"crossref","unstructured":"Barath, D., Matas, J., Noskova, J.: MAGSAC: marginalizing sample consensus. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 10197\u201310205 (2019)","DOI":"10.1109\/CVPR.2019.01044"},{"key":"25_CR4","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"404","DOI":"10.1007\/11744023_32","volume-title":"Computer Vision \u2013 ECCV 2006","author":"H Bay","year":"2006","unstructured":"Bay, H., Tuytelaars, T., Van Gool, L.: SURF: speeded up robust features. In: Leonardis, A., Bischof, H., Pinz, A. (eds.) ECCV 2006. LNCS, vol. 3951, pp. 404\u2013417. Springer, Heidelberg (2006). https:\/\/doi.org\/10.1007\/11744023_32"},{"key":"25_CR5","doi-asserted-by":"crossref","unstructured":"Bian, J., Lin, W.Y., Matsushita, Y., Yeung, S.K., Nguyen, T.D., Cheng, M.M.: Gms: grid-based motion statistics for fast, ultra-robust feature correspondence. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4181\u20134190 (2017)","DOI":"10.1109\/CVPR.2017.302"},{"key":"25_CR6","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101255","volume":"47","author":"SH Chen","year":"2021","unstructured":"Chen, S.H., Tsai, C.C.: SMD LED chips defect detection using a yolov3-dense model. Adv. Eng. Inform. 47, 101255 (2021)","journal-title":"Adv. Eng. Inform."},{"issue":"3","key":"25_CR7","doi-asserted-by":"publisher","first-page":"569","DOI":"10.1109\/TPAMI.2014.2345401","volume":"37","author":"MM Cheng","year":"2014","unstructured":"Cheng, M.M., Mitra, N.J., Huang, X., Torr, P.H., Hu, S.M.: Global contrast based salient region detection. IEEE Trans. Pattern Anal. Mach. Intell. 37(3), 569\u2013582 (2014)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"10","key":"25_CR8","doi-asserted-by":"publisher","first-page":"2165","DOI":"10.1016\/S0031-3203(01)00188-1","volume":"35","author":"D Chetverikov","year":"2002","unstructured":"Chetverikov, D., Hanbury, A.: Finding defects in texture using regularity and local orientation. Pattern Recogn. 35(10), 2165\u20132180 (2002)","journal-title":"Pattern Recogn."},{"key":"25_CR9","doi-asserted-by":"crossref","unstructured":"Dai, J., Qi, H., Xiong, Y., Li, Y., Zhang, G., Hu, H., Wei, Y.: Deformable convolutional networks. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (Oct 2017)","DOI":"10.1109\/ICCV.2017.89"},{"key":"25_CR10","doi-asserted-by":"crossref","unstructured":"Deng, C.X., Wang, G.B., Yang, X.R.: Image edge detection algorithm based on improved canny operator. In: 2013 International Conference on Wavelet Analysis and Pattern Recognition, pp. 168\u2013172. IEEE (2013)","DOI":"10.1109\/ICWAPR.2013.6599311"},{"key":"25_CR11","unstructured":"DeTone, D., Malisiewicz, T., Rabinovich, A.: Deep image homography estimation. arXiv preprint arXiv:1606.03798 (2016)"},{"key":"25_CR12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102144","volume":"107","author":"W Du","year":"2019","unstructured":"Du, W., Shen, H., Fu, J., Zhang, G., He, Q.: Approaches for improvement of the X-ray image defect detection of automobile casting aluminum parts based on deep learning. NDT & E Inter. 107, 102144 (2019)","journal-title":"NDT & E Inter."},{"issue":"6","key":"25_CR13","doi-asserted-by":"publisher","first-page":"381","DOI":"10.1145\/358669.358692","volume":"24","author":"MA Fischler","year":"1981","unstructured":"Fischler, M.A., Bolles, R.C.: Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography. Commun. ACM 24(6), 381\u2013395 (1981)","journal-title":"Commun. ACM"},{"key":"25_CR14","doi-asserted-by":"crossref","unstructured":"Girshick, R.: Fast R-CNN. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 1440\u20131448 (2015)","DOI":"10.1109\/ICCV.2015.169"},{"key":"25_CR15","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 580\u2013587 (2014)","DOI":"10.1109\/CVPR.2014.81"},{"issue":"9","key":"25_CR16","doi-asserted-by":"publisher","first-page":"813","DOI":"10.1080\/03610927708827533","volume":"6","author":"PW Holland","year":"1977","unstructured":"Holland, P.W., Welsch, R.E.: Robust regression using iteratively reweighted least-squares. Commun. Stat.-Theory Methods 6(9), 813\u2013827 (1977)","journal-title":"Commun. Stat.-Theory Methods"},{"key":"25_CR17","doi-asserted-by":"crossref","unstructured":"Hou, W., Jing, H.: Rc-yolov5s: for tile surface defect detection. The Visual Computer, pp. 1\u201312 (2023)","DOI":"10.1007\/s00371-023-02793-2"},{"key":"25_CR18","doi-asserted-by":"crossref","unstructured":"Hou, Z., Parker, J.M.: Texture defect detection using support vector machines with adaptive gabor wavelet features. In: 2005 Seventh IEEE Workshops on Applications of Computer Vision (WACV\/MOTION 2005), vol.\u00a01, pp. 275\u2013280. IEEE (2005)","DOI":"10.1109\/ACVMOT.2005.115"},{"key":"25_CR19","doi-asserted-by":"publisher","first-page":"108335","DOI":"10.1109\/ACCESS.2020.3001349","volume":"8","author":"B Hu","year":"2020","unstructured":"Hu, B., Wang, J.: Detection of PCB surface defects with improved faster-RCNN and feature pyramid network. IEEE Access 8, 108335\u2013108345 (2020)","journal-title":"IEEE Access"},{"key":"25_CR20","doi-asserted-by":"crossref","unstructured":"Huang, Z., Wang, X., Huang, L., Huang, C., Wei, Y., Liu, W.: Ccnet: Criss-cross attention for semantic segmentation. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 603\u2013612 (2019)","DOI":"10.1109\/ICCV.2019.00069"},{"issue":"11","key":"25_CR21","doi-asserted-by":"publisher","first-page":"1254","DOI":"10.1109\/34.730558","volume":"20","author":"L Itti","year":"1998","unstructured":"Itti, L., Koch, C., Niebur, E.: A model of saliency-based visual attention for rapid scene analysis. IEEE Trans. Pattern Anal. Mach. Intell. 20(11), 1254\u20131259 (1998)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"25_CR22","first-page":"155892502090826","volume":"15","author":"J Jing","year":"2020","unstructured":"Jing, J., Zhuo, D., Zhang, H., Liang, Y., Zheng, M.: Fabric defect detection using the improved yolov3 model. J. Eng. Fibers Fabr. 15, 1558925020908268 (2020)","journal-title":"J. Eng. Fibers Fabr."},{"issue":"2","key":"25_CR23","doi-asserted-by":"publisher","first-page":"358","DOI":"10.1109\/4.996","volume":"23","author":"N Kanopoulos","year":"1988","unstructured":"Kanopoulos, N., Vasanthavada, N., Baker, R.L.: Design of an image edge detection filter using the Sobel operator. IEEE J. Solid-State Circ. 23(2), 358\u2013367 (1988)","journal-title":"IEEE J. Solid-State Circ."},{"key":"25_CR24","doi-asserted-by":"crossref","unstructured":"Lin, T.Y., Goyal, P., Girshick, R., He, K., Doll\u00e1r, P.: Focal loss for dense object detection. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2980\u20132988 (2017)","DOI":"10.1109\/ICCV.2017.324"},{"key":"25_CR25","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"21","DOI":"10.1007\/978-3-319-46448-0_2","volume-title":"Computer Vision \u2013 ECCV 2016","author":"W Liu","year":"2016","unstructured":"Liu, W., et al.: SSD: single shot multibox detector. In: Leibe, B., Matas, J., Sebe, N., Welling, M. (eds.) ECCV 2016. LNCS, vol. 9905, pp. 21\u201337. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-46448-0_2"},{"key":"25_CR26","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1023\/B:VISI.0000029664.99615.94","volume":"60","author":"DG Lowe","year":"2004","unstructured":"Lowe, D.G.: Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vis. 60, 91\u2013110 (2004)","journal-title":"Int. J. Comput. Vis."},{"issue":"3","key":"25_CR27","doi-asserted-by":"publisher","first-page":"626","DOI":"10.1109\/TIM.2019.2963555","volume":"69","author":"Q Luo","year":"2020","unstructured":"Luo, Q., Fang, X., Liu, L., Yang, C., Sun, Y.: Automated visual defect detection for flat steel surface: a survey. IEEE Trans. Instrum. Meas. 69(3), 626\u2013644 (2020)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"25_CR28","doi-asserted-by":"publisher","first-page":"512","DOI":"10.1007\/s11263-018-1117-z","volume":"127","author":"J Ma","year":"2019","unstructured":"Ma, J., Zhao, J., Jiang, J., Zhou, H., Guo, X.: Locality preserving matching. Int. J. Comput. Vis. 127, 512\u2013531 (2019)","journal-title":"Int. J. Comput. Vis."},{"key":"25_CR29","doi-asserted-by":"crossref","unstructured":"Malge, P., Nadaf, R.: Pcb defect detection, classification and localization using mathematical morphology and image processing tools. Intern. J. Comput. Appli. 87(9) (2014)","DOI":"10.5120\/15240-3782"},{"key":"25_CR30","doi-asserted-by":"crossref","unstructured":"Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 779\u2013788 (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"25_CR31","doi-asserted-by":"crossref","unstructured":"Redmon, J., Farhadi, A.: YOLO9000: better, faster, stronger. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 7263\u20137271 (2017)","DOI":"10.1109\/CVPR.2017.690"},{"key":"25_CR32","unstructured":"Redmon, J., Farhadi, A.: Yolov3: An incremental improvement. arXiv preprint arXiv:1804.02767 (2018)"},{"key":"25_CR33","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: towards real-time object detection with region proposal networks. Adv. Neural Inform. Process. Syst. 28 (2015)"},{"key":"25_CR34","doi-asserted-by":"crossref","unstructured":"Rublee, E., Rabaud, V., Konolige, K., Bradski, G.: ORB: an efficient alternative to SIFT or SURF. In: 2011 International Conference on Computer Vision, pp. 2564\u20132571. IEEE (2011)","DOI":"10.1109\/ICCV.2011.6126544"},{"key":"25_CR35","unstructured":"Song, Y., Ma, B., Gao, W., Fan, S.: Medical image edge detection based on improved differential evolution algorithm and Prewitt operator. Acta Microscopica 28(1) (2019)"},{"key":"25_CR36","doi-asserted-by":"crossref","unstructured":"Sun, J., Shen, Z., Wang, Y., Bao, H., Zhou, X.: Loftr: detector-free local feature matching with transformers. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 8922\u20138931 (2021)","DOI":"10.1109\/CVPR46437.2021.00881"},{"key":"25_CR37","doi-asserted-by":"crossref","unstructured":"Zhai, Y., Shah, M.: Visual attention detection in video sequences using spatiotemporal cues. In: Proceedings of the 14th ACM International Conference on Multimedia, pp. 815\u2013824 (2006)","DOI":"10.1145\/1180639.1180824"},{"key":"25_CR38","doi-asserted-by":"crossref","unstructured":"Zhang, C., Chang, C.c., Jamshidi, M.: Concrete bridge surface damage detection using a single-stage detector. Comput.-Aided Civil Infrastructure Eng. 35(4), 389\u2013409 (2020)","DOI":"10.1111\/mice.12500"},{"key":"25_CR39","doi-asserted-by":"crossref","unstructured":"Zhang, J., Sclaroff, S.: Saliency detection: a boolean map approach. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 153\u2013160 (2013)","DOI":"10.1109\/ICCV.2013.26"},{"key":"25_CR40","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"653","DOI":"10.1007\/978-3-030-58452-8_38","volume-title":"Computer Vision \u2013 ECCV 2020","author":"J Zhang","year":"2020","unstructured":"Zhang, J., et al.: Content-aware unsupervised deep homography estimation. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12346, pp. 653\u2013669. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58452-8_38"}],"container-title":["Communications in Computer and Information Science","Digital Multimedia Communications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-97-3626-3_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,22]],"date-time":"2024-11-22T08:24:39Z","timestamp":1732263879000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-97-3626-3_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9789819736256","9789819736263"],"references-count":40,"URL":"https:\/\/doi.org\/10.1007\/978-981-97-3626-3_25","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"21 June 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IFTC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Forum on Digital TV and Wireless Multimedia Communications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Beijing","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21 December 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 December 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iftc2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.siga.org.cn\/xshd\/iftc2023.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}