{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T12:39:22Z","timestamp":1743079162892,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":14,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789819746767"},{"type":"electronic","value":"9789819746774"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-981-97-4677-4_1","type":"book-chapter","created":{"date-parts":[[2024,7,9]],"date-time":"2024-07-09T05:02:30Z","timestamp":1720501350000},"page":"3-9","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Boundary-Focused Semantic Segmentation for\u00a0Limited Wafer Transmission Electron Microscope Images"],"prefix":"10.1007","author":[{"given":"Yongwon","family":"Jo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinsoo","family":"Bae","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hansam","family":"Cho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heejoong","family":"Roh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyunghye","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Munki","family":"Jo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaeung","family":"Tae","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seoung Bum","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,7,10]]},"reference":[{"key":"1_CR1","doi-asserted-by":"publisher","first-page":"39969","DOI":"10.1109\/ACCESS.2022.3166512","volume":"10","author":"PP Shinde","year":"2022","unstructured":"Shinde, P.P., Pai, P.P., Adiga, S.P.: Wafer defect localization and classification using deep learning techniques. IEEE Access 10, 39969\u201339974 (2022)","journal-title":"IEEE Access"},{"issue":"1","key":"1_CR2","doi-asserted-by":"publisher","first-page":"74","DOI":"10.1109\/TSM.2020.3038165","volume":"34","author":"H Kahng","year":"2020","unstructured":"Kahng, H., Kim, S.B.: Self-supervised representation learning for wafer bin map defect pattern classification. IEEE Trans. Semicond. Manuf. 34(1), 74\u201386 (2020)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"1_CR3","doi-asserted-by":"crossref","unstructured":"Baderot, J., et al.: Application of deep-learning based techniques for automatic metrology on scanning and transmission electron microscopy images. J. Vacuum Sci. Technol. B 40(5) (2022)","DOI":"10.1116\/6.0001988"},{"issue":"12","key":"1_CR4","doi-asserted-by":"publisher","first-page":"2042","DOI":"10.1109\/TCPMT.2014.2363570","volume":"4","author":"MR Marks","year":"2014","unstructured":"Marks, M.R., Hassan, Z., Cheong, K.Y.: Characterization methods for ultrathin wafer and die quality: a review. IEEE Trans. Components Packag. Manuf. Technol. 4(12), 2042\u20132057 (2014)","journal-title":"IEEE Trans. Components Packag. Manuf. Technol."},{"key":"1_CR5","doi-asserted-by":"publisher","first-page":"113437","DOI":"10.1016\/j.ultramic.2021.113437","volume":"233","author":"KM Saaim","year":"2022","unstructured":"Saaim, K.M., Afridi, S.K., Nisar, M., Islam, S.: In search of best automated model: explaining nanoparticle TEM image segmentation. Ultramicroscopy 233, 113437 (2022)","journal-title":"Ultramicroscopy"},{"key":"1_CR6","doi-asserted-by":"publisher","first-page":"106318","DOI":"10.1016\/j.cmpb.2021.106318","volume":"209","author":"DJ Matuszewski","year":"2021","unstructured":"Matuszewski, D.J., Sintorn, I.-M.: TEM virus images: benchmark dataset and deep learning classification. Comput. Methods Program. Biomed. 209, 106318 (2021)","journal-title":"Comput. Methods Program. Biomed."},{"key":"1_CR7","doi-asserted-by":"crossref","unstructured":"Chen, L.-C., Zhu, Y., Papandreou, G., Schroff, F., Adam, H.: Encoder-decoder with atrous separable convolution for semantic image segmentation. In: Proceedings of the European conference on computer vision (ECCV), pp. 801\u2013818 (2018)","DOI":"10.1007\/978-3-030-01234-2_49"},{"issue":"5786","key":"1_CR8","doi-asserted-by":"publisher","first-page":"504","DOI":"10.1126\/science.1127647","volume":"313","author":"GE Hinton","year":"2006","unstructured":"Hinton, G.E., Salakhutdinov, R.R.: Reducing the dimensionality of data with neural networks. Science 313(5786), 504\u2013507 (2006)","journal-title":"Science"},{"key":"1_CR9","unstructured":"Vincent, P., Larochelle, H., Lajoie, I., Bengio, Y., Manzagol, P.-A., Bottou, L.: Stacked denoising autoencoders: learning useful representations in a deep network with a local denoising criterion. J. Mach. Learn. Res. 11(12) (2010)"},{"key":"1_CR10","doi-asserted-by":"crossref","unstructured":"Pathak, D., Krahenbuhl, P., Donahue, J., Darrell, T., Efros, A.A.: Context encoders: feature learning by inpainting. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2536\u20132544 (2016)","DOI":"10.1109\/CVPR.2016.278"},{"key":"1_CR11","doi-asserted-by":"crossref","unstructured":"Kaur, B., Garg, A.: Mathematical morphological edge detection for remote sensing images. In: 2011 3rd International Conference on Electronics Computer Technology, vol. 5, pp. 324\u2013327. IEEE (2011)","DOI":"10.1109\/ICECTECH.2011.5942012"},{"key":"1_CR12","unstructured":"Glorot, X., Bengio, Y.: Understanding the difficulty of training deep feedforward neural networks. In: Proceedings of the Thirteenth International Conference on Artificial Intelligence and Statistics, pp. 249\u2013256. JMLR Workshop and Conference Proceedings (2010)"},{"key":"1_CR13","unstructured":"Loshchilov, I., Hutter, F.: Decoupled weight decay regularization. arXiv preprint arXiv:1711.05101 (2017)"},{"key":"1_CR14","doi-asserted-by":"crossref","unstructured":"Long, J., Shelhamer, E., Darrell, T.: Fully convolutional networks for semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3431\u20133440 (2015)","DOI":"10.1109\/CVPR.2015.7298965"}],"container-title":["Lecture Notes in Computer Science","Advances and Trends in Artificial Intelligence. Theory and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-97-4677-4_1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,9]],"date-time":"2024-07-09T05:02:41Z","timestamp":1720501361000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-97-4677-4_1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9789819746767","9789819746774"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-981-97-4677-4_1","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"10 July 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IEA\/AIE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Hradec Kralove","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Czech Republic","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 July 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 July 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"37","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ieaaie2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/www.ieaaie2024.com\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}