{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T17:03:27Z","timestamp":1771261407332,"version":"3.50.1"},"publisher-location":"Singapore","reference-count":27,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819755967","type":"print"},{"value":"9789819755974","type":"electronic"}],"license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-981-97-5597-4_30","type":"book-chapter","created":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T09:10:06Z","timestamp":1722503406000},"page":"354-366","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Insulator Defect Detection and Segmentation Algorithm Based on Deformation Convolution"],"prefix":"10.1007","author":[{"given":"Hongxu","family":"Gao","sequence":"first","affiliation":[]},{"given":"Zhao","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Song","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Jia","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Yu","family":"Li","sequence":"additional","affiliation":[]},{"given":"Quan","family":"Wang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,8,2]]},"reference":[{"issue":"12","key":"30_CR1","doi-asserted-by":"publisher","first-page":"9699","DOI":"10.1109\/TIE.2017.2716862","volume":"64","author":"KC Park","year":"2017","unstructured":"Park, K.C., Motai, Y., Yoon, J.R.: Acoustic fault detection technique for high-power insulators. IEEE Trans. Industr. Electron. 64(12), 9699\u20139708 (2017)","journal-title":"IEEE Trans. Industr. Electron."},{"issue":"1","key":"30_CR2","doi-asserted-by":"publisher","first-page":"110","DOI":"10.1109\/TDEI.2018.006773","volume":"25","author":"X Liang","year":"2018","unstructured":"Liang, X., Bao, W., Gao, Y.: Decay-like fracture mechanism of silicone rubber composite insulator. IEEE Trans. Dielectr. Electr. Insul. 25(1), 110\u2013119 (2018)","journal-title":"IEEE Trans. Dielectr. Electr. Insul."},{"issue":"12","key":"30_CR3","doi-asserted-by":"publisher","first-page":"9350","DOI":"10.1109\/TIM.2020.3031194","volume":"69","author":"L Yang","year":"2020","unstructured":"Yang, L., Fan, J., Liu, Y., et al.: A review on state-of-the-art power line inspection techniques. IEEE Trans. Instrum. Meas. 69(12), 9350\u20139365 (2020)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"30_CR4","doi-asserted-by":"crossref","unstructured":"He, K., Gkioxari, G., Doll\u00e1r, P., et al.: Mask R-CNN. In: 2017 International Conference on Computer Vision, pp. 2961\u20132969. IEEE (2017)","DOI":"10.1109\/ICCV.2017.322"},{"key":"30_CR5","doi-asserted-by":"crossref","unstructured":"Huang, Z., Huang, L., Gong, Y., et al.: Mask scoring r-cnn. In: CVF Conference on Computer Vision and Pattern Recognition, pp. 6409\u20136418. IEEE (2019)","DOI":"10.1109\/CVPR.2019.00657"},{"key":"30_CR6","doi-asserted-by":"crossref","unstructured":"Bolya, D., Zhou, C., Xiao, F., et al.: Yolact: real-time instance segmentation. In: 2019 International Conference on Computer Vision, pp. 9157\u20139166. IEEE (2019)","DOI":"10.1109\/ICCV.2019.00925"},{"key":"30_CR7","doi-asserted-by":"crossref","unstructured":"Lee, Y., Park, J.: Centermask: real-time anchor-free instance segmentation. In: CVF Conference on Computer Vision and Pattern Recognition, pp. 13906\u201313915. IEEE (2020)","DOI":"10.1109\/CVPR42600.2020.01392"},{"key":"30_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"649","DOI":"10.1007\/978-3-030-58523-5_38","volume-title":"Computer Vision \u2013 ECCV 2020","author":"X Wang","year":"2020","unstructured":"Wang, X., Kong, T., Shen, C., Jiang, Y., Li, L.: Solo: segmenting objects by locations. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12363, pp. 649\u2013665. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58523-5_38"},{"key":"30_CR9","doi-asserted-by":"crossref","unstructured":"Chen, H., Sun, K., Tian, Z., et al.: Blendmask: top-down meets bottom-up for instance segmentation. In: CVF Conference on Computer Vision and Pattern Recognition, pp. 8573\u20138581. IEEE (2020)","DOI":"10.1109\/CVPR42600.2020.00860"},{"key":"30_CR10","unstructured":"Ge, Z., Liu, S., Wang, F., et al.: Yolox: Exceeding yolo series in 2021. arXiv preprint arXiv:2107.08430 (2021)"},{"key":"30_CR11","first-page":"21898","volume":"34","author":"B Dong","year":"2021","unstructured":"Dong, B., Zeng, F., Wang, T., et al.: Solq: segmenting objects by learning queries. Adv. Neural. Inf. Process. Syst. 34, 21898\u201321909 (2021)","journal-title":"Adv. Neural. Inf. Process. Syst."},{"key":"30_CR12","doi-asserted-by":"crossref","unstructured":"Zhang, T., Wei, S., Ji, S.: E2ec: an end-to-end contour-based method for high-quality high-speed instance segmentation. In: CVF Conference on Computer Vision and Pattern Recognition, pp. 4443\u20134452. IEEE (2022)","DOI":"10.1109\/CVPR52688.2022.00440"},{"key":"30_CR13","doi-asserted-by":"publisher","first-page":"109688","DOI":"10.1016\/j.epsr.2023.109688","volume":"224","author":"J Liu","year":"2023","unstructured":"Liu, J., Hu, M.M., Dong, J.Y., et al.: Summary of insulator defect detection based on deep learning. Electric Power Syst. Res. 224, 109688 (2023)","journal-title":"Electric Power Syst. Res."},{"key":"30_CR14","doi-asserted-by":"crossref","unstructured":"Damira, P., Aidana, I., Diana, S., et al.: High voltage outdoor insulator surface condition evaluation using aerial insulator images. High Volt. 4(3) (2019)","DOI":"10.1049\/hve.2019.0079"},{"key":"30_CR15","doi-asserted-by":"crossref","unstructured":"Fan, P., et al.: Defect identification detection research for insulator of transmission lines based on deep learning. In: Journal of Physics: Conference Series, vol. 1828, no. 1, p. 012019. IOP Publishing (2021)","DOI":"10.1088\/1742-6596\/1828\/1\/012019"},{"key":"30_CR16","doi-asserted-by":"crossref","unstructured":"Hu, M., Ju, X.: Two-stage insulator self-explosion defect detection method based on Mask R-CNN. In: 2021 2nd International Conference on Intelligent Computing and Human-Computer Interaction (ICHCI), pp. 13\u201318. IEEE (2021)","DOI":"10.1109\/ICHCI54629.2021.00010"},{"issue":"13","key":"30_CR17","doi-asserted-by":"publisher","first-page":"4720","DOI":"10.3390\/s22134720","volume":"22","author":"M Zhou","year":"2022","unstructured":"Zhou, M., Wang, J., Li, B.: ARG-mask RCNN: an infrared insulator fault-detection network based on improved mask RCNN. Sensors 22(13), 4720 (2022)","journal-title":"Sensors"},{"issue":"12","key":"30_CR18","first-page":"9350","volume":"69","author":"M He","year":"2023","unstructured":"He, M., Qin, L., Deng, X., et al.: MFI-YOLO: multi-fault insulator detection based on an improved YOLOv8. IEEE Trans. Power Deliv. 69(12), 9350\u20139365 (2023)","journal-title":"IEEE Trans. Power Deliv."},{"key":"30_CR19","doi-asserted-by":"crossref","unstructured":"Zhang, S., Qu, C., Ru, C., et al.: Multi-objects recognition and self-explosion defect detection method for insulators based on lightweight GhostNet-YOLOV4 model deployed onboard UAV. IEEE Access (2023)","DOI":"10.1109\/ACCESS.2023.3268708"},{"issue":"17","key":"30_CR20","doi-asserted-by":"publisher","first-page":"3675","DOI":"10.3390\/electronics12173675","volume":"12","author":"C Hu","year":"2023","unstructured":"Hu, C., Min, S., Liu, X., et al.: Research on an improved detection algorithm based on yolov5s for power line self-exploding insulators. Electronics 12(17), 3675 (2023)","journal-title":"Electronics"},{"issue":"1","key":"30_CR21","doi-asserted-by":"publisher","first-page":"012086","DOI":"10.1088\/1742-6596\/2185\/1\/012086","volume":"2185","author":"W Shengli","year":"2022","unstructured":"Shengli, W., Zhangpeng, Z., Wenbin, Z.: Semantic segmentation and defect detection of aerial insulators of transmission lines. J. Phys. Conf. Ser. 2185(1), 012086 (2022)","journal-title":"J. Phys. Conf. Ser."},{"issue":"8","key":"30_CR22","doi-asserted-by":"publisher","first-page":"2211","DOI":"10.1007\/s11760-022-02186-3","volume":"16","author":"K Zhang","year":"2022","unstructured":"Zhang, K., Qian, S., Zhou, J., et al.: ARFNet: adaptive receptive field network for detecting insulator self-explosion defects. SIViP 16(8), 2211\u20132219 (2022)","journal-title":"SIViP"},{"issue":"9","key":"30_CR23","doi-asserted-by":"publisher","first-page":"7253","DOI":"10.1007\/s00521-021-06792-z","volume":"34","author":"E Antwi-Bekoe","year":"2022","unstructured":"Antwi-Bekoe, E., Liu, G., Ainam, J.P., et al.: A deep learning approach for insulator instance segmentation and defect detection. Neural Comput. Appl. 34(9), 7253\u20137269 (2022)","journal-title":"Neural Comput. Appl."},{"issue":"16","key":"30_CR24","doi-asserted-by":"publisher","first-page":"9109","DOI":"10.3390\/app13169109","volume":"13","author":"J Guo","year":"2023","unstructured":"Guo, J., Li, T., Du, B.: Segmentation head networks with harnessing self-attention and transformer for insulator surface defect detection. Appl. Sci. 13(16), 9109 (2023)","journal-title":"Appl. Sci."},{"key":"30_CR25","doi-asserted-by":"publisher","first-page":"112177","DOI":"10.1016\/j.measurement.2022.112177","volume":"205","author":"B Li","year":"2022","unstructured":"Li, B., Wang, T., Zhai, Y., et al.: RFIENet: RGB-thermal feature interactive enhancement network for semantic segmentation of insulator in backlight scenes. Measurement 205, 112177 (2022)","journal-title":"Measurement"},{"key":"30_CR26","doi-asserted-by":"crossref","unstructured":"Dai, J., Qi, H., Xiong, Y., et al.: Deformable convolutional networks. In: 2017 International Conference on Computer Vision, pp. 764\u2013773. IEEE (2017)","DOI":"10.1109\/ICCV.2017.89"},{"key":"30_CR27","unstructured":"Loshchilov, I., Hutter, F.: Decoupled weight decay regularization. arXiv preprint arXiv:1711.05101 (2017)"}],"container-title":["Lecture Notes in Computer Science","Advanced Intelligent Computing Technology and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-97-5597-4_30","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T09:15:50Z","timestamp":1722503750000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-97-5597-4_30"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"ISBN":["9789819755967","9789819755974"],"references-count":27,"URL":"https:\/\/doi.org\/10.1007\/978-981-97-5597-4_30","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"2 August 2024","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"The authors have no competing interests to declare that are relevant to the content of this article.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Disclosure of Interests"}},{"value":"ICIC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Tianjin","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2024","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5 August 2024","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 August 2024","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icic2024","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.ic-icc.cn\/2024\/index.htm","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}