{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T12:04:34Z","timestamp":1743077074719,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":30,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789819958467"},{"type":"electronic","value":"9789819958474"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-981-99-5847-4_21","type":"book-chapter","created":{"date-parts":[[2023,8,29]],"date-time":"2023-08-29T20:30:00Z","timestamp":1693341000000},"page":"291-302","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Fault Diagnosis of High-Voltage Circuit Breakers via Hybrid Classifier by DS Evidence Fusion Algorithm"],"prefix":"10.1007","author":[{"given":"Xiaofeng","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liangwu","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hantao","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2023,8,30]]},"reference":[{"key":"21_CR1","doi-asserted-by":"crossref","unstructured":"Liu, Y., Zhang, G., Zhao, C., Qin, H., Yang, J.: Influence of mechanical faults on electrical resistance in high voltage circuit breaker. Int. J. Electr. Power 129 (2021)","DOI":"10.1016\/j.ijepes.2021.106827"},{"key":"21_CR2","doi-asserted-by":"publisher","unstructured":"Li, X., Zhang, T., Guo, W., Wang, S.: Multi-layer integrated extreme learning machine for mechanical fault diagnosis of high-voltage circuit breaker. In: Zhang, H., et al. (eds.) NCAA 2022. CCIS, vol. 1638, pp. 287\u2013301. Springer, Singapore (2022). https:\/\/doi.org\/10.1007\/978-981-19-6135-9_22","DOI":"10.1007\/978-981-19-6135-9_22"},{"key":"21_CR3","doi-asserted-by":"publisher","first-page":"105","DOI":"10.1016\/j.epsr.2013.04.014","volume":"103","author":"X Zhang","year":"2013","unstructured":"Zhang, X., Gockenbach, E., Liu, Z., Chen, H., Yang, L.: Reliability estimation of high voltage SF6 circuit breakers by statistical analysis on the basis of the field data. Electr. Power Syst. Res. 103, 105\u20131013 (2013)","journal-title":"Electr. Power Syst. Res."},{"key":"21_CR4","doi-asserted-by":"publisher","first-page":"740","DOI":"10.1109\/TPWRD.2020.2991234","volume":"36","author":"AA Razi-Kazemi","year":"2021","unstructured":"Razi-Kazemi, A.A., Niayesh, K.: Condition monitoring of high voltage circuit breakers: past to future. IEEE Trans. Power Deliv. 36, 740\u2013750 (2021)","journal-title":"IEEE Trans. Power Deliv."},{"key":"21_CR5","doi-asserted-by":"publisher","first-page":"134","DOI":"10.1016\/j.engappai.2015.10.009","volume":"48","author":"E Ramentol","year":"2016","unstructured":"Ramentol, E., et al.: Fuzzy-rough imbalanced learning for the diagnosis of High Voltage Circuit Breaker maintenance: the SMOTE-FRST-2T algorithm. Eng. Appl. Artif. Intell. 48, 134\u2013139 (2016)","journal-title":"Eng. Appl. Artif. Intell."},{"key":"21_CR6","doi-asserted-by":"publisher","first-page":"36","DOI":"10.1016\/j.epsr.2016.08.018","volume":"142","author":"EAL Vianna","year":"2017","unstructured":"Vianna, E.A.L., Abaide, A.R., Canha, L.N., Miranda, V.: Substations SF6 circuit breakers: Reliability evaluation based on equipment condition. Electr. Power Syst. Res. 142, 36\u201346 (2017)","journal-title":"Electr. Power Syst. Res."},{"key":"21_CR7","doi-asserted-by":"publisher","first-page":"1608","DOI":"10.1109\/TPWRD.2019.2915110","volume":"34","author":"FN Rudsari","year":"2019","unstructured":"Rudsari, F.N., Kazemi, A., Shoorehdeli, M.A.: Fault analysis of high voltage circuit breakers based on coil current and contact travel waveforms through modified SVM classifier. IEEE Trans. Power Deliv. 34, 1608\u20131618 (2019)","journal-title":"IEEE Trans. Power Deliv."},{"key":"21_CR8","doi-asserted-by":"publisher","first-page":"106732","DOI":"10.1016\/j.compeleceng.2020.106732","volume":"86","author":"S Geng","year":"2020","unstructured":"Geng, S., Wang, X.: Research on data-driven method for circuit breaker condition assessment based on back propagation neural network. Comput. Electr. Eng. 86, 106732 (2020)","journal-title":"Comput. Electr. Eng."},{"key":"21_CR9","doi-asserted-by":"crossref","unstructured":"Huang, N., Fang, L., Cai, G., Xu, D., Chen, H., Nie, Y.: Mechanical fault diagnosis of high voltage circuit breakers with unknown fault type using hybrid classifier based on LMD and time segmentation energy entropy. Entropy 18 (2016)","DOI":"10.3390\/e18090322"},{"key":"21_CR10","doi-asserted-by":"publisher","first-page":"1221","DOI":"10.3390\/s18041221","volume":"18","author":"S Ma","year":"2018","unstructured":"Ma, S., Chen, M., Wu, J., Wang, Y., Jia, B., Yuan, J.: Intelligent fault diagnosis of HVCB with feature space optimization-based random forest. Sensors 18, 1221 (2018)","journal-title":"Sensors"},{"key":"21_CR11","doi-asserted-by":"publisher","first-page":"9777","DOI":"10.1109\/TIE.2018.2879308","volume":"66","author":"S Ma","year":"2018","unstructured":"Ma, S., Chen, M., Wu, J., Wang, Y., Jia, B., Jiang, Y.: High-voltage circuit breaker fault diagnosis using a hybrid feature transformation approach based on random forest and stacked auto-encoder. IEEE Trans. Ind. Electron. 66, 9777\u20139788 (2018)","journal-title":"IEEE Trans. Ind. Electron."},{"key":"21_CR12","doi-asserted-by":"crossref","unstructured":"Lin, L., Wang, B., Qi, J., Chen, L., Huang, N.: A novel mechanical fault feature selection and diagnosis approach for high-voltage circuit breakers using features extracted without signal processing. Sensors 19 (2019)","DOI":"10.3390\/s19020288"},{"key":"21_CR13","doi-asserted-by":"publisher","first-page":"643","DOI":"10.1016\/j.neucom.2015.09.081","volume":"174","author":"Z Yin","year":"2016","unstructured":"Yin, Z., Hou, J.: Recent advances on SVM based fault diagnosis and process monitoring in complicated industrial processes. Neurocomputing 174, 643\u2013650 (2016)","journal-title":"Neurocomputing"},{"key":"21_CR14","doi-asserted-by":"publisher","first-page":"1018","DOI":"10.1016\/j.measurement.2011.02.017","volume":"44","author":"H Jian","year":"2011","unstructured":"Jian, H., Hu, X., Fan, Y.: Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker. Measurement 44, 1018\u20131027 (2011)","journal-title":"Measurement"},{"key":"21_CR15","doi-asserted-by":"publisher","first-page":"6","DOI":"10.1186\/s10033-019-0428-5","volume":"33","author":"X Li","year":"2020","unstructured":"Li, X., Wu, S., Li, X., Yuan, H., Zhao, D.: Particle swarm optimization-support vector machine model for machinery fault diagnoses in high-voltage circuit breakers. Chin. J. Mech. Eng. 33, 6 (2020)","journal-title":"Chin. J. Mech. Eng."},{"key":"21_CR16","doi-asserted-by":"crossref","unstructured":"Huang, N., Chen, H., Cai, G., Fang, L., Wang, Y.: Mechanical fault diagnosis of high voltage circuit breakers based on variational mode decomposition and multi-layer classifier. Sensors (Basel, Switzerland) 16 (2014)","DOI":"10.3390\/s16111887"},{"key":"21_CR17","doi-asserted-by":"publisher","first-page":"489","DOI":"10.1016\/j.neucom.2005.12.126","volume":"70","author":"GB Huang","year":"2006","unstructured":"Huang, G.B., Zhu, Q.Y., Siew, C.K.: Extreme learning machine: theory and applications. Neurocomputing 70, 489\u2013501 (2006)","journal-title":"Neurocomputing"},{"key":"21_CR18","doi-asserted-by":"publisher","first-page":"60091","DOI":"10.1109\/ACCESS.2019.2915252","volume":"7","author":"W Gao","year":"2019","unstructured":"Gao, W., Wai, R.J., Qiao, S.P., Guo, M.F.: Mechanical faults diagnosis of high-voltage circuit breaker via hybrid features and integrated extreme learning machine. IEEE Access 7, 60091\u201360103 (2019)","journal-title":"IEEE Access"},{"key":"21_CR19","doi-asserted-by":"publisher","first-page":"85146","DOI":"10.1109\/ACCESS.2019.2926100","volume":"7","author":"S Wan","year":"2019","unstructured":"Wan, S., Chen, L.: Fault diagnosis of high-voltage circuit breakers using mechanism action time and hybrid classifier. IEEE Access 7, 85146\u201385157 (2019)","journal-title":"IEEE Access"},{"key":"21_CR20","doi-asserted-by":"publisher","first-page":"85107","DOI":"10.1088\/1361-6501\/ab7deb","volume":"31","author":"L Chen","year":"2020","unstructured":"Chen, L.: Mechanical fault diagnosis of high-voltage circuit breakers using multi-segment permutation entropy and a density-weighted one-class extreme learning machine. Meas. Sci. Technol. 31, 85107\u201385118 (2020)","journal-title":"Meas. Sci. Technol."},{"key":"21_CR21","doi-asserted-by":"crossref","unstructured":"Gao, W., Qiao, S.P., Wai, R.J., Guo, M.F.: A newly designed diagnostic method for mechanical faults of high-voltage circuit breakers via SSAE and IELM. IEEE Trans. Instrum. Meas. 1 (2020)","DOI":"10.1109\/TIM.2020.3011734"},{"key":"21_CR22","first-page":"303","volume":"72\u201373","author":"J Feng","year":"2016","unstructured":"Feng, J., Lei, Y., Jing, L., Xin, Z., Na, L.: Deep neural networks: a promising tool for fault characteristic mining and intelligent diagnosis of rotating machinery with massive data. Mech. Syst. Sig. Process. 72\u201373, 303\u2013315 (2016)","journal-title":"Mech. Syst. Sig. Process."},{"key":"21_CR23","doi-asserted-by":"crossref","unstructured":"Zhao, S., Wang, E., Hao, J.: Fault diagnosis method for energy storage mechanism of high voltage circuit breaker based on CNN characteristic matrix constructed by sound-vibration signal. J. Vibroeng.21 (2019)","DOI":"10.21595\/jve.2019.20781"},{"key":"21_CR24","doi-asserted-by":"publisher","first-page":"8116","DOI":"10.1109\/JSEN.2019.2918335","volume":"19","author":"Q Yang","year":"2019","unstructured":"Yang, Q., Ruan, J., Zhuang, Z., Huang, D.: Condition evaluation for opening damper of spring operated high-voltage circuit breaker using vibration time-frequency image. IEEE Sens. J. 19, 8116\u20138126 (2019)","journal-title":"IEEE Sens. J."},{"key":"21_CR25","doi-asserted-by":"crossref","unstructured":"Niu, W., Liang, G., Yuan, H., Li, B.: A fault diagnosis method of high voltage circuit breaker based on moving contact motion trajectory and ELM. Math. Probl. Eng. 1\u201310 (2016)","DOI":"10.1155\/2016\/3271042"},{"key":"21_CR26","doi-asserted-by":"publisher","first-page":"2349","DOI":"10.3906\/elk-1508-73","volume":"25","author":"F Ali","year":"2017","unstructured":"Ali, F., Akbar, A.A., Ali, N.G.: Model-based fault analysis of a high-voltage circuit breaker operating mechanism. Turk. J. Electr. Eng. Comput. Sci. 25, 2349\u20132362 (2017)","journal-title":"Turk. J. Electr. Eng. Comput. Sci."},{"key":"21_CR27","doi-asserted-by":"publisher","first-page":"2763","DOI":"10.3233\/JIFS-169325","volume":"33","author":"F Mei","year":"2017","unstructured":"Mei, F., Pan, Y., Zhu, K., Zheng, J.: On-line hybrid fault diagnosis method for high voltage circuit breaker. J. Intell. Fuzzy Syst. 33, 2763\u20132774 (2017)","journal-title":"J. Intell. Fuzzy Syst."},{"key":"21_CR28","doi-asserted-by":"publisher","first-page":"813","DOI":"10.5370\/JEET.2013.8.4.813","volume":"8","author":"F Mei","year":"2013","unstructured":"Mei, F., Mei, J., Zheng, J., Wang, Y.: Development and application of distributed multilayer on-line monitoring system for high voltage vacuum circuit breaker. J. Electr. Eng. Technol. 8, 813\u2013823 (2013)","journal-title":"J. Electr. Eng. Technol."},{"key":"21_CR29","doi-asserted-by":"crossref","unstructured":"Li, X., Zheng, X., Zhang, T., Guo, W., Wu, Z.: Robust fault diagnosis of a high-voltage circuit breaker via an ensemble echo state network with evidence fusion. Complex Intell. Syst. (2023)","DOI":"10.1007\/s40747-023-01025-3"},{"key":"21_CR30","doi-asserted-by":"publisher","first-page":"448","DOI":"10.3390\/e20060448","volume":"20","author":"B Li","year":"2018","unstructured":"Li, B., Liu, M., Guo, Z., Ji, Y.: Mechanical fault diagnosis of high voltage circuit breakers utilizing EWT-improved time frequency entropy and optimal GRNN classifier. Entropy 20, 448 (2018)","journal-title":"Entropy"}],"container-title":["Communications in Computer and Information Science","International Conference on Neural Computing for Advanced Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-99-5847-4_21","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,29]],"date-time":"2023-08-29T20:33:14Z","timestamp":1693341194000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-99-5847-4_21"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9789819958467","9789819958474"],"references-count":30,"URL":"https:\/\/doi.org\/10.1007\/978-981-99-5847-4_21","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"30 August 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"NCAA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Computing for Advanced Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Hefei","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7 July 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 July 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ncaa2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/dl2link.com\/ncaa2023\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easy chair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"211","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"83","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"39% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.21","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.67","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}