{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,24]],"date-time":"2025-11-24T07:15:38Z","timestamp":1763968538995,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":21,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789819965007"},{"type":"electronic","value":"9789819965014"}],"license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023]]},"DOI":"10.1007\/978-981-99-6501-4_29","type":"book-chapter","created":{"date-parts":[[2023,10,12]],"date-time":"2023-10-12T21:01:23Z","timestamp":1697144483000},"page":"339-350","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Efficient and Accurate Detector with Global Feature Aggregation for Steel Surface Defect Detection"],"prefix":"10.1007","author":[{"given":"Kefei","family":"Qian","sequence":"first","affiliation":[]},{"given":"Zhiwen","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Lai","family":"Zou","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,10,13]]},"reference":[{"key":"29_CR1","doi-asserted-by":"publisher","first-page":"126570","DOI":"10.1016\/j.optcom.2020.126570","volume":"484","author":"J Zhang","year":"2021","unstructured":"Zhang, J., Qin, X., Yuan, J., Wang, X., Zeng, Y.: The extraction method of laser ultrasonic defect signal based on EEMD. Optics Commun. 484, 126570 (2021)","journal-title":"Optics Commun."},{"key":"29_CR2","doi-asserted-by":"publisher","first-page":"2798","DOI":"10.1109\/TII.2018.2887145","volume":"15","author":"H Wang","year":"2019","unstructured":"Wang, H., Zhang, J., Tian, Y., Chen, H., Sun, H., Liu, K.: A simple guidance template-based defect detection method for strip steel surfaces. IEEE Trans. Industr. Inf. 15, 2798\u20132809 (2019)","journal-title":"IEEE Trans. Industr. Inf."},{"key":"29_CR3","doi-asserted-by":"publisher","first-page":"717","DOI":"10.1007\/s11665-018-3842-4","volume":"28","author":"B Baucher","year":"2019","unstructured":"Baucher, B., Chaudhary, A.B., Babu, S.S., Chakraborty, S.: Defect characterization through automated laser track trace identification in slm processes using laser profilometer data. J. Mater. Eng. Perform. 28, 717\u2013727 (2019)","journal-title":"J. Mater. Eng. Perform."},{"key":"29_CR4","first-page":"1","volume":"70","author":"H Mei","year":"2021","unstructured":"Mei, H., Jiang, H., Yin, F., Wang, L., Farzaneh, M.: Terahertz imaging method for composite insulator defects based on edge detection algorithm. IEEE Trans. Instrum. Meas. 70, 1\u201310 (2021)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"29_CR5","doi-asserted-by":"publisher","first-page":"324","DOI":"10.1109\/TSM.2022.3146849","volume":"35","author":"JL G\u00f3mez-Sirvent","year":"2022","unstructured":"G\u00f3mez-Sirvent, J.L., de la Rosa, F.L., S\u00e1nchez-Reolid, R., Fern\u00e1ndez-Caballero, A., Morales, R.: Optimal feature selection for defect classification in semiconductor wafers. IEEE Trans. Semicond. Manuf. 35, 324\u2013331 (2022)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"29_CR6","doi-asserted-by":"publisher","first-page":"359","DOI":"10.1016\/j.egyr.2021.01.058","volume":"7","author":"X Wang","year":"2021","unstructured":"Wang, X., Yan, Z., Zeng, Y., Liu, X., Peng, X., Yuan, H.: Research on correlation factor analysis and prediction method of overhead transmission line defect state based on association rule mining and RBF-SVM. Energy Rep. 7, 359\u2013368 (2021)","journal-title":"Energy Rep."},{"key":"29_CR7","doi-asserted-by":"publisher","first-page":"85232","DOI":"10.1109\/ACCESS.2021.3067641","volume":"9","author":"C Xu","year":"2021","unstructured":"Xu, C., Li, L., Li, J., Wen, C.: Surface defects detection and identification of lithium battery pole piece based on multi-feature fusion and PSO-SVM. IEEE Access 9, 85232\u201385239 (2021)","journal-title":"IEEE Access"},{"key":"29_CR8","first-page":"388","volume":"11","author":"S Wang","year":"2021","unstructured":"Wang, S., Xia, X., Ye, L., Yang, B.: Automatic detection and classification of steel surface defect using deep convolutional neural networks. Metals - Open Access Metall. J. 11, 388 (2021)","journal-title":"Metals - Open Access Metall. J."},{"key":"29_CR9","doi-asserted-by":"publisher","first-page":"1493","DOI":"10.1109\/TIM.2019.2915404","volume":"69","author":"Y He","year":"2020","unstructured":"He, Y., Song, K., Meng, Q., Yan, Y.: An end-to-end steel surface defect detection approach via fusing multiple hierarchical features. IEEE Trans. Instrum. Meas. 69, 1493\u20131504 (2020)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"29_CR10","first-page":"1","volume":"70","author":"L Cui","year":"2021","unstructured":"Cui, L., Jiang, X., Xu, M., Li, W., Lv, P., Zhou, B.: SDDNet: a fast and accurate network for surface defect detection. IEEE Trans. Instrum. Meas. 70, 1\u201313 (2021)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"29_CR11","first-page":"1","volume":"71","author":"X Yu","year":"2022","unstructured":"Yu, X., Lyu, W., Zhou, D., Wang, C., Xu, W.: ES-Net: efficient scale-aware network for tiny defect detection. IEEE Trans. Instrum. Meas. 71, 1\u201314 (2022)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"9","key":"29_CR12","doi-asserted-by":"publisher","first-page":"3467","DOI":"10.3390\/s22093467","volume":"22","author":"Z Guo","year":"2022","unstructured":"Guo, Z., Wang, C., Yang, G., Huang, Z., Li, G.: MSFT-YOLO: improved YOLOv5 based on transformer for detecting defects of steel surface. Sensors 22(9), 3467 (2022)","journal-title":"Sensors"},{"key":"29_CR13","first-page":"1","volume":"70","author":"X Cheng","year":"2022","unstructured":"Cheng, X., Yu, J.: RetinaNet with difference channel attention and adaptively spatial feature fusion for steel surface defect detection. IEEE Trans. Instrum. Meas. 70, 1\u201311 (2022)","journal-title":"IEEE Trans. Instrum. Meas."},{"doi-asserted-by":"publisher","unstructured":"Jocher, G.: YOLOv5 by Ultralytics (2020). https:\/\/doi.org\/10.5281\/zenodo.3908559","key":"29_CR14","DOI":"10.5281\/zenodo.3908559"},{"doi-asserted-by":"crossref","unstructured":"Pang, J., Chen, K., Shi, J., Feng, H., Ouyang, W., Lin, D.: Libra R-CNN: towards balanced learning for object detection. In: 2019 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","key":"29_CR15","DOI":"10.1109\/CVPR.2019.00091"},{"doi-asserted-by":"crossref","unstructured":"Tan, M., Pang, R., Le, Q.V.: EfficientDet: scalable and efficient object detection. In: 2020 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 10778\u201387 (2020)","key":"29_CR16","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"29_CR17","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/978-3-030-01234-2_1","volume-title":"Computer Vision \u2013 ECCV 2018: 15th European Conference, Munich, Germany, September 8\u201314, 2018, Proceedings, Part VII","author":"S Woo","year":"2018","unstructured":"Woo, S., Park, J., Lee, J.-Y., Kweon, I.S.: CBAM: Convolutional Block Attention Module. In: Ferrari, V., Hebert, M., Sminchisescu, C., Weiss, Y. (eds.) Computer Vision \u2013 ECCV 2018: 15th European Conference, Munich, Germany, September 8\u201314, 2018, Proceedings, Part VII, pp. 3\u201319. Springer International Publishing, Cham (2018). https:\/\/doi.org\/10.1007\/978-3-030-01234-2_1"},{"doi-asserted-by":"crossref","unstructured":"Hou, Q., Zhou, D., Feng, J.: Coordinate attention for efficient mobile network design. In: 2021 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 13708\u201313717 (2021)","key":"29_CR18","DOI":"10.1109\/CVPR46437.2021.01350"},{"issue":"6","key":"29_CR19","doi-asserted-by":"publisher","first-page":"1562","DOI":"10.3390\/s20061562","volume":"20","author":"X Lv","year":"2020","unstructured":"Lv, X., Duan, F., Jiang, J.-j, Fu, X., Gan, L.: Deep metallic surface defect detection: the new benchmark and detection network. Sensors 20(6), 1562 (2020)","journal-title":"Sensors"},{"unstructured":"MMDetection contributors. OpenMMLab detection toolbox and benchmark (2018)","key":"29_CR20"},{"key":"29_CR21","doi-asserted-by":"publisher","first-page":"110211","DOI":"10.1016\/j.measurement.2021.110211","volume":"187","author":"R Tian","year":"2022","unstructured":"Tian, R., Jia, M.: DCC-CenterNet: a rapid detection method for steel surface defects. Measurement 187, 110211 (2022)","journal-title":"Measurement"}],"container-title":["Lecture Notes in Computer Science","Intelligent Robotics and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-99-6501-4_29","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,12]],"date-time":"2023-10-12T21:04:12Z","timestamp":1697144652000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-99-6501-4_29"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"ISBN":["9789819965007","9789819965014"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-981-99-6501-4_29","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023]]},"assertion":[{"value":"13 October 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIRA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Robotics and Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Hangzhou","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5 July 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7 July 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icira2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/icira2023.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Microsoft CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"630","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"431","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"68% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}