{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T00:23:38Z","timestamp":1743121418443,"version":"3.40.3"},"publisher-location":"Singapore","reference-count":25,"publisher":"Springer Nature Singapore","isbn-type":[{"type":"print","value":"9789819980697"},{"type":"electronic","value":"9789819980703"}],"license":[{"start":{"date-parts":[[2023,11,15]],"date-time":"2023-11-15T00:00:00Z","timestamp":1700006400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,11,15]],"date-time":"2023-11-15T00:00:00Z","timestamp":1700006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-981-99-8070-3_13","type":"book-chapter","created":{"date-parts":[[2023,11,14]],"date-time":"2023-11-14T08:02:54Z","timestamp":1699948974000},"page":"161-171","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Differential Fault Analysis Against AES Based on a Hybrid Fault Model"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5334-4884","authenticated-orcid":false,"given":"Xusen","family":"Wan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8319-5354","authenticated-orcid":false,"given":"Jinbao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-8334-4660","authenticated-orcid":false,"given":"Weixiang","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0597-9823","authenticated-orcid":false,"given":"Shi","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0645-353X","authenticated-orcid":false,"given":"Jiehua","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2023,11,15]]},"reference":[{"key":"13_CR1","doi-asserted-by":"publisher","unstructured":"Biham, E.: Advanced encryption standard. In: Biham, E. (eds) Fast Software Encryption, FSE 1997. LNCS, vol. 1267, pp. 83\u201387. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/BFb0052336","DOI":"10.1007\/BFb0052336"},{"key":"13_CR2","doi-asserted-by":"crossref","unstructured":"Ramani, S., Jhaveri, R.H.: ML-based delay attack detection and isolation for fault-tolerant software-defined industrial networks. Sensors 22(18), 6958 2022","DOI":"10.3390\/s22186958"},{"key":"13_CR3","doi-asserted-by":"crossref","unstructured":"Azam, S., Bibi, M., Riaz, R., et al.: Collaborative learning based sybil attack detection in Vehicular AD-HOC Networks (VANETS). Sensors 22(18), 6934 (2022)","DOI":"10.3390\/s22186934"},{"key":"13_CR4","doi-asserted-by":"publisher","unstructured":"Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems. In: Kaliski, B.S. (eds.) Advances in Cryptology \u2014 CRYPTO 1997, CRYPTO 1997. LNCS, vol. 1294, pp. 513\u2013525. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/BFb0052259","DOI":"10.1007\/BFb0052259"},{"key":"13_CR5","doi-asserted-by":"publisher","first-page":"359","DOI":"10.1007\/11502760_24","volume-title":"Fast Software Encryption","author":"E Biham","year":"2005","unstructured":"Biham, E., Granboulan, L., Nguy\u00ea\u0303n, P.Q.: Impossible fault analysis of RC4 and differential fault analysis of RC4. In: Gilbert, H., Handschuh, H. (eds.) FSE 2005. LNCS, vol. 3557, pp. 359\u2013367. Springer, Heidelberg (2005). https:\/\/doi.org\/10.1007\/11502760_24"},{"key":"13_CR6","doi-asserted-by":"publisher","first-page":"240","DOI":"10.1007\/978-3-540-28632-5_18","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2004","author":"JJ Hoch","year":"2004","unstructured":"Hoch, J.J., Shamir, A.: Fault analysis of stream ciphers. In: Joye, M., Quisquater, J.-J. (eds.) CHES 2004. LNCS, vol. 3156, pp. 240\u2013253. Springer, Heidelberg (2004). https:\/\/doi.org\/10.1007\/978-3-540-28632-5_18"},{"key":"13_CR7","doi-asserted-by":"crossref","unstructured":"Lin, I.C., Chang, C.C.: Security enhancement for digital signature schemes with fault tolerance in RSA. Inf. Sci. 177(19), 4031\u20134039 (2007)","DOI":"10.1016\/j.ins.2007.03.035"},{"key":"13_CR8","doi-asserted-by":"crossref","unstructured":"Trichina, E., Korkikyan, R.: Multi fault laser attacks on protected CRT-RSA. In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 75\u201386. IEEE, Santa Barbara, CA, USA (2010)","DOI":"10.1109\/FDTC.2010.14"},{"key":"13_CR9","doi-asserted-by":"publisher","first-page":"265","DOI":"10.1007\/978-3-319-24315-3_27","volume-title":"Information and Communication Technology","author":"D Jap","year":"2015","unstructured":"Jap, D., Breier, J.: Differential fault attack on LEA. In: Khalil, I., Neuhold, E., Tjoa, A.M., Da Xu, L., You, I. (eds.) CONFENIS\/ICT-EurAsia-2015. LNCS, vol. 9357, pp. 265\u2013274. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-24315-3_27"},{"key":"13_CR10","doi-asserted-by":"crossref","unstructured":"Jeong, K., Lee, Y., Sung, J., et al.: Improved differential fault analysis on PRESENT-80\/128. Int. J. Comput. Math. 90(12), 2553\u20132563 (2013)","DOI":"10.1080\/00207160.2012.760732"},{"key":"13_CR11","doi-asserted-by":"crossref","unstructured":"Tupsamudre, H., Bisht, S., Mukhopadhyay, D.: Differential fault analysis on the families of SIMON and SPECK ciphers. In: 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 40\u201348. IEEE, Busan, Korea (South) (2014)","DOI":"10.1109\/FDTC.2014.14"},{"key":"13_CR12","doi-asserted-by":"crossref","unstructured":"Zhang, J.B., Wang, J.H., Bin, G., et al.: An efficient differential fault attack against SIMON key schedule. J. Inf. Secur. Appl. 66, 103155 (2022)","DOI":"10.1016\/j.jisa.2022.103155"},{"key":"13_CR13","doi-asserted-by":"publisher","first-page":"48","DOI":"10.1007\/978-3-540-85893-5_4","volume-title":"Smart Card Research and Advanced Applications","author":"CH Kim","year":"2008","unstructured":"Kim, C.H., Quisquater, J.-J.: New differential fault analysis on AES key schedule: two faults are enough. In: Grimaud, G., Standaert, F.-X. (eds.) CARDIS 2008. LNCS, vol. 5189, pp. 48\u201360. Springer, Heidelberg (2008). https:\/\/doi.org\/10.1007\/978-3-540-85893-5_4"},{"key":"13_CR14","doi-asserted-by":"crossref","unstructured":"Kim, C.H.: Improved differential fault analysis on AES key schedule. IEEE Trans. Inf. Forensics Secur. 7(1), 41\u201350 (2012)","DOI":"10.1109\/TIFS.2011.2161289"},{"issue":"5","key":"13_CR15","doi-asserted-by":"publisher","first-page":"661","DOI":"10.1049\/iet-cds.2018.5428","volume":"13","author":"Z Jinbao","year":"2019","unstructured":"Jinbao, Z., et al.: A novel differential fault analysis using two-byte fault model on AES key schedule. IET Circuits Devices Syst. 13(5), 661\u2013666 (2019)","journal-title":"IET Circuits Devices Syst."},{"key":"13_CR16","doi-asserted-by":"crossref","unstructured":"Fukunaga, T., Takahashi, J.: Practical fault attack on a cryptographic LSI with IOS\/IEC 18033-3 block ciphers. In: 6th International Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2009, pp. 84\u201392. IEEE Computer Society, Lusanne, Switzerland (2009)","DOI":"10.1109\/FDTC.2009.34"},{"key":"13_CR17","doi-asserted-by":"crossref","unstructured":"Floissac, N., L\u2019Hyver, Y.: From AES-128 to AES-192 and AES-256, how to adapt differential fault analysis attacks. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 43\u201353, Nara, Japan (2011)","DOI":"10.1109\/FDTC.2011.15"},{"key":"13_CR18","doi-asserted-by":"publisher","first-page":"77","DOI":"10.1007\/978-3-540-45238-6_7","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2003","author":"G Piret","year":"2003","unstructured":"Piret, G., Quisquater, J.-J.: A differential fault attack technique against SPN structures, with application to the AES and Khazad. In: Walter, C.D., Ko\u00e7, \u00c7.K., Paar, C. (eds.) Cryptographic Hardware and Embedded Systems - CHES 2003. LNCS, vol. 2779, pp. 77\u201388. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/978-3-540-45238-6_7"},{"key":"13_CR19","doi-asserted-by":"crossref","unstructured":"Saha, D., Mukhopadhyay, D., Chowdhury, D.R.: A diagonal fault attack on the advanced encryption standard. Cryptology eprint archive (2009)","DOI":"10.1109\/ECCTD.2009.5275006"},{"key":"13_CR20","doi-asserted-by":"crossref","unstructured":"Kim, C.H.: Differential fault analysis of AES: toward reducing number of faults. Inf. Sci. 199, 43\u201357 (2011)","DOI":"10.1016\/j.ins.2012.02.028"},{"key":"13_CR21","doi-asserted-by":"crossref","unstructured":"Tunstall, M., Mukhopadhyay, D., Ali, S.: Differential fault analysis of the advanced encryption standard using a single fault. Community Mental Health J. 49(6), 658\u2013667 (2011)","DOI":"10.1007\/978-3-642-21040-2_15"},{"key":"13_CR22","doi-asserted-by":"crossref","unstructured":"Barenghi, A., Bertoni, G.M., Breveglieri, L., et al.: Low voltage fault attacks to AES. In: 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 7\u201312. IEEE, Anaheim, CA, USA (2010)","DOI":"10.1109\/HST.2010.5513121"},{"key":"13_CR23","doi-asserted-by":"crossref","unstructured":"Kim, C.H.: Differential fault analysis against AES-192 and AES-256 with minimal faults. In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 3\u20139. IEEE, Santa Barbara, CA, USA (2010)","DOI":"10.1109\/FDTC.2010.10"},{"key":"13_CR24","doi-asserted-by":"crossref","unstructured":"Takahashi, J., Fukunaga, T.: Differential fault analysis on AES with 192 and 256-bit keys. IACR eprint archive, 023 (2010)","DOI":"10.1587\/transfun.E93.A.136"},{"key":"13_CR25","doi-asserted-by":"crossref","unstructured":"Liu, Y., Cui, X., Cao, J., et al.: A hybrid fault model for differential fault attack on AES. In: 2017 IEEE 12th International Conference on ASIC, pp. 784\u2013787. IEEE, Guiyang, China (2017)","DOI":"10.1109\/ASICON.2017.8252593"}],"container-title":["Lecture Notes in Computer Science","Neural Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-99-8070-3_13","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T16:47:32Z","timestamp":1710262052000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-99-8070-3_13"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,15]]},"ISBN":["9789819980697","9789819980703"],"references-count":25,"URL":"https:\/\/doi.org\/10.1007\/978-981-99-8070-3_13","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2023,11,15]]},"assertion":[{"value":"15 November 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICONIP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Information Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Changsha","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 November 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 November 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iconip2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/iconip2023.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1274","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"650","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"51% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4.14","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.46","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}