{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T22:44:25Z","timestamp":1784241865839,"version":"3.55.0"},"publisher-location":"Singapore","reference-count":22,"publisher":"Springer Nature Singapore","isbn-type":[{"value":"9789819981809","type":"print"},{"value":"9789819981816","type":"electronic"}],"license":[{"start":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T00:00:00Z","timestamp":1701043200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T00:00:00Z","timestamp":1701043200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024]]},"DOI":"10.1007\/978-981-99-8181-6_26","type":"book-chapter","created":{"date-parts":[[2023,11,26]],"date-time":"2023-11-26T23:02:30Z","timestamp":1701039750000},"page":"339-351","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Unsupervised Fabric Defect Detection Framework Based on\u00a0Knowledge Distillation"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9554-7839","authenticated-orcid":false,"given":"Haotian","family":"Liu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4562-0883","authenticated-orcid":false,"given":"Siqi","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2914-6527","authenticated-orcid":false,"given":"Chang","family":"Meng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4232-4874","authenticated-orcid":false,"given":"Hengyu","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3534-8192","authenticated-orcid":false,"given":"Xianjing","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0403-1923","authenticated-orcid":false,"given":"Xiu","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2023,11,27]]},"reference":[{"key":"26_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"622","DOI":"10.1007\/978-3-030-20893-6_39","volume-title":"Computer Vision \u2013 ACCV 2018","author":"S Akcay","year":"2019","unstructured":"Akcay, S., Atapour-Abarghouei, A., Breckon, T.P.: GANomaly: semi-supervised anomaly detection via adversarial training. In: Jawahar, C.V., Li, H., Mori, G., Schindler, K. (eds.) ACCV 2018. LNCS, vol. 11363, pp. 622\u2013637. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-20893-6_39"},{"key":"26_CR2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2023.108706","volume":"108","author":"N Alruwais","year":"2023","unstructured":"Alruwais, N., Alabdulkreem, E., Mahmood, K., Marzouk, R.: Hybrid mutation moth flame optimization with deep learning-based smart fabric defect detection. Comput. Electr. Eng. 108, 108706 (2023). https:\/\/doi.org\/10.1016\/j.compeleceng.2023.108706","journal-title":"Comput. Electr. Eng."},{"key":"26_CR3","doi-asserted-by":"crossref","unstructured":"Bergmann, P., Fauser, M., Sattlegger, D., Steger, C.: Mvtec ad-a comprehensive real-world dataset for unsupervised anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 9592\u20139600 (2019)","DOI":"10.1109\/CVPR.2019.00982"},{"key":"26_CR4","doi-asserted-by":"crossref","unstructured":"Bergmann, P., L\u00f6we, S., Fauser, M., Sattlegger, D., Steger, C.: Improving unsupervised defect segmentation by applying structural similarity to autoencoders. arXiv preprint arXiv:1807.02011 (2018)","DOI":"10.5220\/0007364503720380"},{"key":"26_CR5","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"475","DOI":"10.1007\/978-3-030-68799-1_35","volume-title":"Pattern Recognition. ICPR International Workshops and Challenges","author":"T Defard","year":"2021","unstructured":"Defard, T., Setkov, A., Loesch, A., Audigier, R.: PaDiM: a patch distribution modeling framework for anomaly detection and localization. In: Del Bimbo, A., et al. (eds.) ICPR 2021. LNCS, vol. 12664, pp. 475\u2013489. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-68799-1_35"},{"key":"26_CR6","unstructured":"Dehaene, D., Frigo, O., Combrexelle, S., Eline, P.: Iterative energy-based projection on a normal data manifold for anomaly localization. In: International Conference on Learning Representations (2019)"},{"key":"26_CR7","unstructured":"H, Z.H.: Fabric defect detection based on improved weighted median filtering and k-means clustering. J. Textiles 40(12), 50\u201356 (2019)"},{"key":"26_CR8","doi-asserted-by":"crossref","unstructured":"Hanbay, K., Talu, M.F., \u00d6zg\u00fcven, \u00d6.F., \u00d6zt\u00fcrk, D.: Fabric defect detection methods for circular knitting machines. In: 2015 23nd Signal Processing and Communications Applications Conference (SIU), pp. 735\u2013738. IEEE (2015)","DOI":"10.1109\/SIU.2015.7129932"},{"key":"26_CR9","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"issue":"3\u20134","key":"26_CR10","doi-asserted-by":"publisher","first-page":"247","DOI":"10.1177\/0040517519862880","volume":"90","author":"G Hu","year":"2020","unstructured":"Hu, G., Huang, J., Wang, Q., Li, J., Xu, Z., Huang, X.: Unsupervised fabric defect detection based on a deep convolutional generative adversarial network. Text. Res. J. 90(3\u20134), 247\u2013270 (2020)","journal-title":"Text. Res. J."},{"key":"26_CR11","unstructured":"Jing, J., Wang, Z., Rtsch, M., Zhang, H.: Mobile-unet: an efficient convolutional neural network for fabric defect detection. Textile Res. J. 004051752092860 (2020)"},{"issue":"4","key":"26_CR12","doi-asserted-by":"publisher","first-page":"1064","DOI":"10.3390\/s18041064","volume":"18","author":"S Mei","year":"2018","unstructured":"Mei, S., Wang, Y., Wen, G.: Automatic fabric defect detection with a multi-scale convolutional denoising autoencoder network model. Sensors 18(4), 1064 (2018)","journal-title":"Sensors"},{"key":"26_CR13","doi-asserted-by":"crossref","unstructured":"Perera, P., Nallapati, R., Bing, X.: OcGAN: one-class novelty detection using GANs with constrained latent representations. In: 2019 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/CVPR.2019.00301"},{"key":"26_CR14","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.116827","volume":"198","author":"Z Pourkaramdel","year":"2022","unstructured":"Pourkaramdel, Z., Fekri-Ershad, S., Nanni, L.: Fabric defect detection based on completed local quartet patterns and majority decision algorithm. Expert Syst. Appl. 198, 116827 (2022)","journal-title":"Expert Syst. Appl."},{"key":"26_CR15","doi-asserted-by":"crossref","unstructured":"Salehi, M., Sadjadi, N., Baselizadeh, S., Rohban, M.H., Rabiee, H.R.: Multiresolution knowledge distillation for anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 14902\u201314912 (2021)","DOI":"10.1109\/CVPR46437.2021.01466"},{"key":"26_CR16","doi-asserted-by":"publisher","first-page":"30","DOI":"10.1016\/j.media.2019.01.010","volume":"54","author":"T Schlegl","year":"2019","unstructured":"Schlegl, T., Seeb\u00f6ck, P., Waldstein, S.M., Langs, G., Schmidt-Erfurth, U.: f-AnoGAN: fast unsupervised anomaly detection with generative adversarial networks. Med. Image Anal. 54, 30\u201344 (2019)","journal-title":"Med. Image Anal."},{"key":"26_CR17","doi-asserted-by":"crossref","unstructured":"Shumin, D., Zhoufeng, L., Chunlei, L.: Adaboost learning for fabric defect detection based on hog and SVM. In: 2011 International Conference on Multimedia Technology, pp. 2903\u20132906. IEEE (2011)","DOI":"10.1109\/ICMT.2011.6001937"},{"key":"26_CR18","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556 (2014)"},{"key":"26_CR19","unstructured":"W, L.: Deep learning-based algorithm for online detection of fabric defects. Comput. Appl. 39(7), 2125 (2019)"},{"issue":"6","key":"26_CR20","first-page":"5","volume":"10","author":"GL Yin","year":"2011","unstructured":"Yin, G.L.: Fabric defect detection method based on edge detection and wavelet analysis. J. Jiangnan Univ. Nat. Sci. Ed. 10(6), 5 (2011)","journal-title":"J. Jiangnan Univ. Nat. Sci. Ed."},{"key":"26_CR21","doi-asserted-by":"crossref","unstructured":"Z, J.: Real-time defect detection algorithm for fabric based on s-yolov3 model. Adv. Lasers Optoelectron. 57(16), 161001 (2020)","DOI":"10.3788\/LOP57.161001"},{"key":"26_CR22","unstructured":"Z, Z.: Deep learning in fabric defect detection. Foreign Electron. Meas. Technol. 38(8), 110\u2013116 (2019)"}],"container-title":["Communications in Computer and Information Science","Neural Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-981-99-8181-6_26","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T10:57:13Z","timestamp":1730631433000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-981-99-8181-6_26"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,27]]},"ISBN":["9789819981809","9789819981816"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-981-99-8181-6_26","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"value":"1865-0929","type":"print"},{"value":"1865-0937","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11,27]]},"assertion":[{"value":"27 November 2023","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICONIP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Information Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Changsha","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2023","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 November 2023","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 November 2023","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iconip2023","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/iconip2023.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1274","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"650","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"51% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4.14","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.46","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}