{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,20]],"date-time":"2024-12-20T05:34:03Z","timestamp":1734672843472,"version":"3.32.0"},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1996,6,1]],"date-time":"1996-06-01T00:00:00Z","timestamp":833587200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1996,6]]},"DOI":"10.1007\/bf00133390","type":"journal-article","created":{"date-parts":[[2004,11,6]],"date-time":"2004-11-06T09:36:12Z","timestamp":1099733772000},"page":"287-298","source":"Crossref","is-referenced-by-count":0,"title":["ITA: An algorithm for I DDQ testability analysis"],"prefix":"10.1007","volume":"8","author":[{"given":"Michael G.","family":"McNamer","sequence":"first","affiliation":[]},{"given":"H. Troy","family":"Nagle","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"D. Wu and E. Hsieh, ?CMOS Stuck-Open Fault Modelling, Detection and Simulation,? Int. Symp. on Circ. and Systems, May 1989, pp. 379?383.","DOI":"10.1109\/ISCAS.1989.100370"},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"F.J. Ferguson and J.P. Shen, ?Extraction and Simulation of Realistic CMOS Faults with Inductive Fault Analysis,? Proc. of the 1988 International Test Conference, Sept. 1988, pp. 475?484.","DOI":"10.1109\/TEST.1988.207759"},{"issue":"No. 1","key":"CR3","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1049\/ip-d.1988.0001","volume":"Vol 135","author":"N. Burgess","year":"Jan. 1988","unstructured":"N. Burgess, R. Damper, K. Totton, and S. Shaw, ?Physical Faults in MOS Circuits and Their Coverage by Different Fault Models,? IEE Proceedings, Jan. 1988, Vol 135, PT. E, No. 1, pp. 1?9.","journal-title":"IEE Proceedings"},{"key":"CR4","unstructured":"M. Syrzycki, ?Modelling of Spot Defects in MOS Transistors,? Proc. of the 1987 IEEE Int. Test Conf., Sept. 1987, pp. 148?157."},{"key":"CR5","doi-asserted-by":"crossref","unstructured":"R. Lipp, ?Limitations of the Stuck-At Fault Model As An Accurate Measure of CMOS IC Quality and a Proposed Schematic Level Fault Model,? IEEE 1989 Custom Int. Circ. Conf., pp. 26.2.1?26.2.4, May 1989.","DOI":"10.1109\/CICC.1989.56836"},{"key":"CR6","unstructured":"L.K. Horning, J.M. Soden, R.R. Fritzemeier, and C.F. Hawkins, ?Measurement of Quiescent Power Supply Current for CMOS ICs in Production Testing,? Proc. of the 1987 International Test Conference, Sept. 1987, pp. 300?309."},{"key":"CR7","doi-asserted-by":"crossref","unstructured":"R.R. Fritzemeier, J.M. Soden, R.K. Treece, and C.F. Hawkins, ?Increased CMOS Stuck-At Fault Coverage with Reduced I DDQ Test Sets,? Proc. of the 1990 International Test Conference, Sept. 1990, pp. 427?433.","DOI":"10.1109\/TEST.1990.114051"},{"key":"CR8","doi-asserted-by":"crossref","unstructured":"J.M. Soden, R.K. Treece, M.R. Taylor, and C.F. Hawkins, ?CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations,? Proc. of the 1989 International Test Conference, Sept. 1989, pp. 423?430.","DOI":"10.1109\/TEST.1989.82325"},{"issue":"No. 4","key":"CR9","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1007\/BF00135338","volume":"Vol. 3","author":"W. Mao","year":"Dec. 1992","unstructured":"W. Mao and R. Gulati, ?QUIETEST: A Methodology for Selecting I DDQ Test Vectors,? Journal of Electronics Testing: Theory and Application, Vol. 3, No. 4, pp. 349?357, Dec. 1992.","journal-title":"Journal of Electronics Testing: Theory and Application"},{"issue":"No. 4","key":"CR10","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1007\/BF00135336","volume":"Vol. 3","author":"S.D. McEuen","year":"Dec. 1992","unstructured":"S.D. McEuen, ?Reliability Benefits of I DDQ,? Journal of Electronics Testing: Theory and Applications, Vol. 3, No. 4, pp. 41?49, Dec. 1992.","journal-title":"Journal of Electronics Testing: Theory and Applications"},{"key":"CR11","unstructured":"F. Brglez, P. Pownall, and R. Hum, ?Application of Testability Analysis: From ATPG to Critical Delay Path Tracing,? Proc. of the Int. Test Conf., Oct. 1984, p. 705."},{"key":"CR12","doi-asserted-by":"crossref","unstructured":"S. Ercolani, M. Favalli, M. Damiani, P. Olivo, and B. Ricco, ?Estimate of Signal Probability in Combinational Logic Networks,? Proc. of the European Test Conf., Apr. 1989, pp. 132?138.","DOI":"10.1109\/ETC.1989.36234"},{"key":"CR13","volume-title":"Switching and Finite Automata Theory","author":"Z. Kohavi","year":"1978","unstructured":"Z. Kohavi, Switching and Finite Automata Theory, McGraw-Hill, New York, 1978."},{"key":"CR14","unstructured":"F. Brglez and H. Fujiwara, ?A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in FORTRAN,? Special Session on ATPG and Fault Simulation, Int. Symposium Circuits and Systems, June 1985."},{"key":"CR15","doi-asserted-by":"crossref","unstructured":"F. Brglez, D. Bryan, and K. Kozmynski, ?Combinational Profiles of Sequential Benchmark Circuits,? 1989 Int. Symp. on Circuits and Systems, Portland, pp. 1929?1934, May 1989.","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"CR16","unstructured":"Benchmark circuit (from Logic Synthesis Benchmarks) obtained from C. Gloster, NCSU\/MCNC."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00133390.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00133390\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00133390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,19]],"date-time":"2024-12-19T18:57:52Z","timestamp":1734634672000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00133390"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1996,6]]},"references-count":16,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1996,6]]}},"alternative-id":["BF00133390"],"URL":"https:\/\/doi.org\/10.1007\/bf00133390","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1996,6]]}}}