{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:31Z","timestamp":1749205531166,"version":"3.32.0"},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[1992,12,1]],"date-time":"1992-12-01T00:00:00Z","timestamp":723168000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1992,12]]},"DOI":"10.1007\/bf00135338","type":"journal-article","created":{"date-parts":[[2004,11,2]],"date-time":"2004-11-02T14:36:41Z","timestamp":1099406201000},"page":"349-357","source":"Crossref","is-referenced-by-count":24,"title":["Quietest: A methodology for selecting I DDQ test vectors"],"prefix":"10.1007","volume":"3","author":[{"given":"Weiwei","family":"Mao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ravi K.","family":"Gulati","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","unstructured":"S. McEuen, ?I DDQ benefits,? Proc. VLSI Test Symp., pp. 285?291, 1991."},{"key":"CR2","unstructured":"C.F. Hawkins and J.M. Soden, ?Electrical characteristics and testing considerations for gate oxide shorts in CMOS ICs,? Proc. Int. Test Conf., pp. 544?555, 1985."},{"key":"CR3","doi-asserted-by":"crossref","unstructured":"J.M. Soden, R.K. Treece, M.R. Taylor and C.F. Hawkins, ?CMOS IC stuck-open fault electrical effects and design considerations,? Proc. Int. Test Conf., pp. 423?430, 1989.","DOI":"10.1109\/TEST.1989.82325"},{"key":"CR4","doi-asserted-by":"crossref","first-page":"56","DOI":"10.1109\/MDT.1986.294977","volume":"vol. 3","author":"J.M. Soden","year":"August 1986","unstructured":"J.M. Soden and C.F. Hawkins, ?Test considerations for gate oxide shorts in CMOS ICs,? IEEE Design & Test of Comp., vol. 3, pp. 56?64, August 1986.","journal-title":"IEEE Design & Test of Comp."},{"key":"CR5","unstructured":"C.F. Hawkins and J.M. Soden, ?Reliability and electrical properties of gate oxide shorts in CMOS ICs,? Proc. Int. Test Conf., pp. 443?451, 1986."},{"key":"CR6","doi-asserted-by":"crossref","unstructured":"J.M. Soden and C.F. Hawkins, ?Electrical properties and detection methods for CMOS IC defects,? Proc. 1st European Test Conf., pp. 159?167, 1989.","DOI":"10.1109\/ETC.1989.36238"},{"key":"CR7","doi-asserted-by":"crossref","unstructured":"F.J. Ferguson, M. Taylor and T. Larrabee, ?Testing for parametric faults in static CMOS circuits,? Proc. Int. Test Conf., pp. 436?443, 1990.","DOI":"10.1109\/TEST.1990.114052"},{"key":"CR8","unstructured":"Y.K. Malaiya and S.Y.H. Su, ?A new fault model and testing technique for CMOS devices,? Proc. Int. Test Conf., pp. 25?34, 1982."},{"key":"CR9","doi-asserted-by":"crossref","unstructured":"W. Maly and P. Nigh, ?Built-in current testing: Feasibility study,? Proc. Int. Conf. on Computer-Aided Design, pp. 340?343, 1988.","DOI":"10.1109\/ICCAD.1988.122524"},{"key":"CR10","unstructured":"L.K. Horning, J.M. Soden, R.R. Fritzemeier and C.F. Hawkins, ?Measurements of quiescent power supply current for CMOS ICs in production testing,? Proc. Int. Test Conf., pp. 300?308, 1987."},{"key":"CR11","unstructured":"C. Crapuchettes, ?Testing CMOS I DD on large devices,? Proc. Int. Test Conf., pp. 310?315, 1987."},{"key":"CR12","unstructured":"M. Keating and D. Meyer, ?A new approach to dynamic I DD testing,? Proc. Int. Test Conf., pp. 316?321, 1987."},{"key":"CR13","doi-asserted-by":"crossref","unstructured":"W. Mao, R.K. Gulati, D.K. Goel and M.D. Ciletti, ?QUIETEST: A quiescent current testing methodology for detecting leakage faults,? Proc. Int. Conf. on Computer-Aided Design, pp. 280?283, 1990.","DOI":"10.1109\/ICCAD.1990.129902"},{"key":"CR14","doi-asserted-by":"crossref","unstructured":"R.K. Gulati, W. Mao and D.K. Goel, ?Detection of undetectable faults using I DDQ testing,? Proc. Int. Test Conf., pp. 770?777, 1992.","DOI":"10.1109\/TEST.1992.527899"},{"key":"CR15","volume-title":"Principles of CMOS VLSI design","author":"N. Weste","year":"1985","unstructured":"N. Weste and K. Eshraghian, ?Principles of CMOS VLSI design,? Reading, MA: Addison-Wesley, 1985."},{"key":"CR16","doi-asserted-by":"crossref","unstructured":"Special issue on ?Switch level techniques,? IEEE Design and Test of Comp., vol. 4, August 1987.","DOI":"10.1109\/MDT.1987.295143"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00135338.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00135338\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00135338","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,19]],"date-time":"2024-12-19T15:33:13Z","timestamp":1734622393000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00135338"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1992,12]]},"references-count":16,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1992,12]]}},"alternative-id":["BF00135338"],"URL":"https:\/\/doi.org\/10.1007\/bf00135338","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1992,12]]}}}