{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T11:21:41Z","timestamp":1648639301297},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1992,5,1]],"date-time":"1992-05-01T00:00:00Z","timestamp":704678400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1992,5]]},"DOI":"10.1007\/bf00137253","type":"journal-article","created":{"date-parts":[[2004,11,6]],"date-time":"2004-11-06T09:31:41Z","timestamp":1099733501000},"page":"159-169","source":"Crossref","is-referenced-by-count":1,"title":["An implicitly testable boundary scan TAP controller"],"prefix":"10.1007","volume":"3","author":[{"given":"Bernhard","family":"Eschermann","sequence":"first","affiliation":[]}],"member":"297","reference":[{"key":"CR1","unstructured":"IEEE Std. P1149.1: Standard Test Access Port and BoundaryScan Architecture, 1990."},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"A. Dahbura, M. Uyar and C. Yau, ?An optimal test sequence for the JTAG\/IEEE P1149.1 test access port controller,? Proc. Int. Test Conference, pp. 55?62, 1989.","DOI":"10.1109\/TEST.1989.82277"},{"key":"CR3","unstructured":"B. K\u00f6nemann, J. Mucha and G. Zwiehoff, ?Built-in logic block observation techniques,? Proc. Int. Test Conference, pp. 37?41, 1979."},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"C. Chuang and A. Gupta, ?The analysis of parallel BIST by the combined markov chain (CMC) model,? Proc. Int. Test Conference, pp. 337?343, 1989.","DOI":"10.1109\/TEST.1989.82317"},{"key":"CR5","unstructured":"L. Wang and E. McCluskey, ?Built-in self-test for sequential machines,? Proc. Int. Test Conference, pp. 334?341, 1987."},{"key":"CR6","doi-asserted-by":"crossref","first-page":"919","DOI":"10.1109\/43.3223","volume":"vol. 8","author":"K. Kim","year":"1988","unstructured":"K. Kim, D. Ha and J. Tront, ?On using signature registers as pseudorandom pattern generators in built-in self-testing,? IEEE Transactions on CAD, vol. 8. pp. 919?928, 1988.","journal-title":"IEEE Transactions on CAD"},{"key":"CR7","doi-asserted-by":"crossref","first-page":"46","DOI":"10.1109\/43.21818","volume":"vol. 8","author":"A. Krasniewski","year":"January 1989","unstructured":"A. Krasniewski and S. Pilarski, ?Circular self-test path: A lowcost BIST technique for VLSI circuits,? IEEE Transactions on CAD, vol. 8, pp. 46?55, January 1989.","journal-title":"IEEE Transactions on CAD"},{"key":"CR8","doi-asserted-by":"crossref","unstructured":"B. Eschermann and H.J. Wunderlich, ?A unified approach for the synthesis of self-testable finite state machines,? Proc. 28th Design Automation Conference, pp. 372?377, 1991.","DOI":"10.1145\/127601.127697"},{"key":"CR9","volume-title":"PhD Dissertation, Dept. of Computer Science, U. of Karlsruhe, May 1991","author":"B. Eschermann","year":"1992","unstructured":"B. Eschermann, ?Test-friendly synthesis of VLSI controllers,? (in German), PhD Dissertation, Dept. of Computer Science, U. of Karlsruhe, May 1991, to be published by Springer, Berlin, 1992."},{"key":"CR10","volume-title":"Sequential Machines and Automata Theory","author":"T. Booth","year":"1967","unstructured":"T. Booth, Sequential Machines and Automata Theory, New York: John Wiley, 1967."},{"key":"CR11","volume-title":"An Introduction to Probability Theory and its Applications","author":"W. Feller","year":"1957","unstructured":"W. Feller, An Introduction to Probability Theory and its Applications; New York: John Wiley, 1957."},{"key":"CR12","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/43.45852","volume":"vol. CAD-9","author":"S. Devadas","year":"January 1990","unstructured":"S. Devadas, H.K.T. Ma, A.R. Newton, and A. Sangiovanni-Vincentelli, ?Irredundant sequential machines via optimal logic synthesis,? IEEE Transactions on Computer-Aided Design, vol. CAD-9, pp. 8?18, January 1990.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"CR13","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-67131-9","volume-title":"Stochastische Matrizen","author":"F. J. Fritz","year":"1979","unstructured":"F. J. Fritz, B. Huppert, W. Willems, Stochastische Matrizen; Berlin: Springer, 1979."},{"key":"CR14","doi-asserted-by":"crossref","first-page":"584","DOI":"10.1109\/43.55187","volume":"vol. 9","author":"H.J. Wunderlich","year":"June 1990","unstructured":"H.J. Wunderlich, ?Multiple distributions for biased test patterns,? IEEE Transactions on CAD, vol. 9, pp. 584?593, June 1990.","journal-title":"IEEE Transactions on CAD"},{"key":"CR15","unstructured":"GenRad Ltd., System HILO System Reference Manual, 1988."},{"key":"CR16","unstructured":"Octtools Distribution 4.0, University of California, Berkeley, 1990."},{"key":"CR17","doi-asserted-by":"crossref","unstructured":"T. Williams and W. Daehn, ?Aliasing probability for multiple input signature analyzers with dependent inputs,? Proc. 3rd CompEuro, pp. 120-5.127, 1989.","DOI":"10.1109\/CMPEUR.1989.93497"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137253.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00137253\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137253","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,3]],"date-time":"2019-04-03T10:28:08Z","timestamp":1554287288000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00137253"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1992,5]]},"references-count":17,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1992,5]]}},"alternative-id":["BF00137253"],"URL":"https:\/\/doi.org\/10.1007\/bf00137253","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1992,5]]}}}