{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:54:34Z","timestamp":1747810474034},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1990,5,1]],"date-time":"1990-05-01T00:00:00Z","timestamp":641520000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1990,5]]},"DOI":"10.1007\/bf00137390","type":"journal-article","created":{"date-parts":[[2004,11,2]],"date-time":"2004-11-02T12:30:27Z","timestamp":1099398627000},"page":"139-149","source":"Crossref","is-referenced-by-count":17,"title":["Hierarchical multi-level fault simulation of large systems"],"prefix":"10.1007","volume":"1","author":[{"given":"Daniel G.","family":"Saab","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert B.","family":"Mueller-Thuns","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joseph T.","family":"Rahmeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-95424-5","volume-title":"Diagnosis and Reliable Design of Digital Systems","author":"M.A. Breuer","year":"1976","unstructured":"M.A. Breuer and A.D. Friedman, Diagnosis and Reliable Design of Digital Systems. Woodland Hills, CA: Computer Science Press, 1976."},{"key":"CR2","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1145\/320954.320957","volume":"6","author":"R.D. Eldred","year":"1959","unstructured":"R.D. Eldred, ?Test routines based on symbolic logical statements,? J. ACM 6: 33?36, 1959.","journal-title":"J. ACM"},{"key":"CR3","unstructured":"P. Banerjee and J.A. Abraham, ?Fault characterization of VLSI MOS circuits,? Proc. IEEE Intern. Conf. Circuits and Computers, New York, pp. 564?568, September 1983."},{"key":"CR4","unstructured":"I.N. Hajj and D.G. Saab, ?Fault modeling and logic simulation of MOS VLSI circuits based on logic expression extraction,? Proc. IEEE Intern. Conf. Computer-Aided Design, Santa Clara, CA, pp. 99?100, September 1983."},{"key":"CR5","unstructured":"Y.M. El-Ziq, ?Failure analysis and test generation for VLSI physical effects,? 1983 Custom Integrated Circuit Conf, Rochester, NY, pp. 300?303, May 1983."},{"issue":"6","key":"CR6","first-page":"24","volume":"4","author":"R.E. Bryant","year":"1983","unstructured":"R.E. Bryant and M.D. Schuster, ?Fault simulation of MOS digital circuits,? VLSI Design 4 (6): 24?30, 1983.","journal-title":"VLSI Design"},{"key":"CR7","doi-asserted-by":"crossref","unstructured":"M.R. Lightner and G.D. Hachtel, ?Implication algorithms for MOS switch-level function macromodeling, implication and testing,? Proc. 19th ACM Design Autom. Workshop, pp. 691?698, June 1982.","DOI":"10.1109\/DAC.1982.1585571"},{"key":"CR8","doi-asserted-by":"crossref","unstructured":"A.K. Bose, P. Kozak, C.-Y. Lo, H.N. Nham, E. Pacas-skewes, and K. Wu, ?A fault simulator for MOSLSI circuits,? Proc. 19th ACM\/IEEE Design Autom. Conf., pp. 400?408, June 1982.","DOI":"10.1109\/DAC.1982.1585530"},{"key":"CR9","unstructured":"G. Ditlow, W. Donath, and A. Ruehli, ?Logic equations for MOSFET circuits,? Proc. IEEE Intern. Symp. Circuits and Systems, Newport Beach, CA, pp. 752?755, May 1983."},{"key":"CR10","series-title":"Ph.D. Dissertation","volume-title":"Logic and fault simulation of VLSI circuits including hierarchical techniques","author":"D.G. Saab","year":"1988","unstructured":"D.G. Saab, ?Logic and fault simulation of VLSI circuits including hierarchical techniques,? Ph.D. Dissertation, University of Illinois at Urbana-Champaign, 1988."},{"key":"CR11","unstructured":"I.N. Hajj and D.G. Saab, ?Symbolic logic simulation of MOS circuits,? Proc. IEEE Intern. Symp. Circuits and Systems, Newport Beach, CA, pp. 246?249, May 1983."},{"key":"CR12","doi-asserted-by":"crossref","unstructured":"R.E. Bryant, D. Beatty, K. Brace, K. Cho, and T. Scheffler, ?COSMOS: A Compiled Simulator for MOS Circuits,? Proc. 24th ACM\/IEEE Design Autom. Conf., pp. 9?16, 1987.","DOI":"10.1145\/37888.37890"},{"key":"CR13","doi-asserted-by":"crossref","unstructured":"D.T. Blaauw, D.G. Saab, R.B. Mueller-Thuns, J.T. Rahmeh, and J.A. Abraham, ?Automatic generation of behavioral models from switch-level descriptions,? Proc. 26th ACM\/IEEE Design Autom. Conf., Las Vegas, NV, pp. 179?184, June 1989.","DOI":"10.1145\/74382.74413"},{"key":"CR14","unstructured":"W.A. Rogers and J.A. Abraham, ?CHIEFS: A concurrent, hierarchical and extensible fault simulator,? Proc Intern. Test Conf., Philadelphia, pp. 710?716, November 1985."},{"key":"CR15","unstructured":"D.D Hill and W.M. Van Cleemput, ?SABLE: Multilevel simulation for hierarchical design,? Proc. IEEE Intern. Symp. Circuits and Systems, Houston, TX, pp. 361?365, April 1980."},{"key":"CR16","volume-title":"MC68000 Programmer's Reference Manual","author":"Motorola Corporation","year":"1986","unstructured":"Motorola Corporation, MC68000 Programmer's Reference Manual, Englewood Cliffs, NJ: Prentice-Hall, 1986."},{"key":"CR17","doi-asserted-by":"crossref","unstructured":"L. Jones, ?Fast online\/offline netlist compilation of hierarchical schematics,? Proc. 26th ACM\/IEEE Design Autom. Conf., Las Vegas, NV, pp. 822?825, June 1989.","DOI":"10.1145\/74382.74539"},{"key":"CR18","doi-asserted-by":"crossref","first-page":"160","DOI":"10.1109\/TC.1984.1676408","volume":"C-33","author":"R.E. Bryant","year":"1984","unstructured":"R.E. Bryant, ?A switch-level model and simulator for MOS digital systems,? IEEE Trans. Comput. C-33, pp. 160?177, 1984.","journal-title":"IEEE Trans. Comput."},{"key":"CR19","first-page":"93","volume-title":"Advances in Computer-Aided Engineering Design","author":"R.H. Byrd","year":"1985","unstructured":"R.H. Byrd, G.D. Hachtel, M.R. Lightner, and M.H. Heydemann, ?Switch level simulation: models, theory, and algorithms.? In Advances in Computer-Aided Engineering Design, ed., A.L. Sangiovanni-Vincentelli. JAI Press, Greenwich, CT, pp. 93?148, 1985."},{"issue":"2","key":"CR20","doi-asserted-by":"crossref","first-page":"90","DOI":"10.1147\/rd.92.0090","volume":"9","author":"E.B. Eichelberger","year":"March 1965","unstructured":"E.B. Eichelberger, ?Hazard detection in combinational and sequential switching circuits,? IBM J. Res. Develop. 9 (2): 90?99, March 1965.","journal-title":"IBM J. Res. Develop."},{"issue":"3","key":"CR21","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1109\/TC.1979.1675317","volume":"C-28","author":"J.A. Brzozowski","year":"March 1979","unstructured":"J.A. Brzozowski and M. Yoeli, ?On a ternary model of gate networks,? IEEE Trans. Comput. C-28, No. 3, pp. 178?184, March 1979.","journal-title":"IEEE Trans. Comput."},{"key":"CR22","volume-title":"CADAT user's Manual","author":"HHB Inc.","year":"1987","unstructured":"HHB Inc., CADAT user's Manual. HHB Inc., Mahwah, NJ, 1987."},{"key":"CR23","volume-title":"SILOS User's Manual","author":"SimuCad","year":"1984","unstructured":"SimuCad, SILOS User's Manual. SimuCad, Incline Village, NV, 1984."},{"key":"CR24","series-title":"Annual Report, S-1 Project","volume-title":"SCALD User's Manual","author":"T.M. McWilliams","year":"1979","unstructured":"T.M. McWilliams, J.B. Rubin, L.C. Widdoes, and S. Correl, SCALD User's Manual. Berkeley, CA, Lawrence Livermore Laboratory, 1979, Annual Report, S-1 Project."},{"key":"CR25","unstructured":"F. Brglez and H. Fujiwara, ?A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran,? Proc. Intern. Test Conf., Philadelphia, pp. 785?794, 1985."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137390.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00137390\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,3]],"date-time":"2020-04-03T17:44:12Z","timestamp":1585935852000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00137390"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1990,5]]},"references-count":25,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1990,5]]}},"alternative-id":["BF00137390"],"URL":"https:\/\/doi.org\/10.1007\/bf00137390","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1990,5]]}}}