{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:31Z","timestamp":1749205531382},"reference-count":13,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1990,5,1]],"date-time":"1990-05-01T00:00:00Z","timestamp":641520000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1990,5]]},"DOI":"10.1007\/bf00137391","type":"journal-article","created":{"date-parts":[[2004,11,2]],"date-time":"2004-11-02T12:30:27Z","timestamp":1099398627000},"page":"151-162","source":"Crossref","is-referenced-by-count":19,"title":["Detection of coupling faults in RAMs"],"prefix":"10.1007","volume":"1","author":[{"given":"J. A.","family":"Brzozowski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B. F.","family":"Cockburn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","unstructured":"S.M. Thatte, ?Fault diagnosis of semiconductor random access memories,? Report R-769, Coordinated Science Laboratory, University of Illinois, May 1977."},{"issue":"12","key":"CR2","doi-asserted-by":"crossref","first-page":"982","DOI":"10.1109\/TC.1981.1675739","volume":"C-30","author":"D.S. Suk","year":"1981","unstructured":"D.S. Suk and S.M. Reddy, ?A march test for functional faults in semiconductor random access memories,? IEEE Trans. Comput. C-30(12):982?985, 1981.","journal-title":"IEEE Trans. Comput."},{"key":"CR3","unstructured":"R. Dekker, ?Fault modeling and self-test of static random access memories,? Master's thesis, Rep. No. 1-68340-28(1987)25, Department of Electrical Engineering, Delft University of Technology, September 1987."},{"issue":"2","key":"CR4","doi-asserted-by":"crossref","first-page":"244","DOI":"10.1109\/PROC.1974.9412","volume":"62","author":"E.D. Colbourne","year":"1974","unstructured":"E.D. Colbourne, G.R Coverley, and S.K. Behera, ?Reliability of MOS LSI circuits,? Proc. IEEE 62(2):244?259, 1974.","journal-title":"Proc. IEEE"},{"key":"CR5","first-page":"1","volume-title":"Digest of Papers of the 1975 Semiconductor Test Symposium","author":"J. Cocking","year":"1975","unstructured":"J. Cocking, ?RAM test patterns and test strategy,? Digest of Papers of the 1975 Semiconductor Test Symposium, Cherry Hill, NJ, IEEE Computer Society, pp. 1?8, 1975."},{"issue":"6","key":"CR6","doi-asserted-by":"crossref","first-page":"572","DOI":"10.1109\/TC.1978.1675150","volume":"C-27","author":"R. Nair","year":"1978","unstructured":"R. Nair, S.M. Thatte, and J.A. Abraham, ?Efficient algorithms for testing semiconductor random-access memories,? IEEE Trans. Comput. C-27(6):572?576, 1978.","journal-title":"IEEE Trans. Comput."},{"key":"CR7","first-page":"31","volume-title":"Efficient functional testing of RAMs","author":"M. Marinescu","year":"1980","unstructured":"M. Marinescu, ?Efficient functional testing of RAMs,? Proc. 2nd Intern. Conf. Reliability, Perros Guirec, France, pp. 31?37, 1980."},{"issue":"2","key":"CR8","doi-asserted-by":"crossref","first-page":"110","DOI":"10.1109\/TC.1985.1676547","volume":"C-34","author":"C.A. Papachristou","year":"1985","unstructured":"C.A. Papachristou and N.B. Sahgal, ?An improved method for detecting functional faults in semiconductor random access memories,? IEEE Trans. Comput. C-34(2):110?116, 1985.","journal-title":"IEEE Trans. Comput."},{"issue":"5","key":"CR9","doi-asserted-by":"crossref","first-page":"637","DOI":"10.1109\/12.24267","volume":"38","author":"R. David","year":"1989","unstructured":"R. David, A. Fuentes, and B. Courtois, ?Random pattern testing versus deterministic testing of RAMs,? IEEE Trans. Comput. 38(5):637?650, 1989.","journal-title":"IEEE Trans. Comput."},{"key":"CR10","unstructured":"J.A. Brzozowski and H. J\u00fcrgensen, ?A model for sequential machine testing,? Research Report CS-88-12, Department of Computer Science, University of Waterloo, April 1988."},{"key":"CR11","unstructured":"J.A. Brzozowski and B.F. Cockburn, ?Detection of coupling faults in RAMs,? Research Report CS-89-27, Department of Computer Science, University of Waterloo, June 1989."},{"issue":"3","key":"CR12","doi-asserted-by":"crossref","first-page":"175","DOI":"10.1145\/356914.356916","volume":"15","author":"M.S. Abadir","year":"1983","unstructured":"M.S. Abadir and H.K. Reghbati, ?Functional testing of semiconductor random access memories,? Computing Surveys 15(3):175?198, 1983.","journal-title":"Computing Surveys"},{"key":"CR13","volume-title":"Topics in Algebra","author":"I.N. Herstein","year":"1964","unstructured":"I.N. Herstein, Topics in Algebra, Ginn, Waltham, MA, 1964."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137391.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00137391\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137391","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,3]],"date-time":"2019-04-03T10:28:25Z","timestamp":1554287305000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00137391"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1990,5]]},"references-count":13,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1990,5]]}},"alternative-id":["BF00137391"],"URL":"https:\/\/doi.org\/10.1007\/bf00137391","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1990,5]]}}}