{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:29Z","timestamp":1749205529704,"version":"3.32.0"},"reference-count":19,"publisher":"Springer Science and Business Media LLC","issue":"1-2","license":[{"start":{"date-parts":[[1996,1,1]],"date-time":"1996-01-01T00:00:00Z","timestamp":820454400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1996]]},"DOI":"10.1007\/bf00137570","type":"journal-article","created":{"date-parts":[[2004,11,4]],"date-time":"2004-11-04T04:49:57Z","timestamp":1099543797000},"page":"135-151","source":"Crossref","is-referenced-by-count":15,"title":["Unified built-in self-test for fully differential analog circuits"],"prefix":"10.1007","volume":"9","author":[{"given":"S.","family":"Mir","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Lubaszewski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Courtois","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"M. Nicolaidis, ?A Unified Built-in Self-Test Scheme: UBIST,? Proc. 18th International Symposium on Fault Tolerant Computing, Tokyo, Japan, 1988, pp. 157?163.","DOI":"10.1109\/FTCS.1988.5314"},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"S.K. Gupta and D.K. Pradhan, ?Can Concurrent Checkers Help BIST,? Proc. International Test Conference, 1992, pp. 140?150.","DOI":"10.1109\/TEST.1992.527814"},{"key":"CR3","unstructured":"X. Sun and M. Serra, ?Merging Concurrent Checking and Off-line,? Proc. International Test Conference, 1992, pp. 958?965."},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"M. Lubaszewski and B. Courtois, ?On the Design of SelfChecking Boundary Scannable Boards,? Proc. International Test Conference, 1992, pp. 372?381.","DOI":"10.1109\/TEST.1992.527846"},{"key":"CR5","doi-asserted-by":"crossref","unstructured":"J.L. Huertas, D. V\u00e1zquez, and A. Rueda, ?On-line Testing of Switched-Capacitor Filters,? Proc. IEEE VLSI Test Symp., 1992, pp. 102?106.","DOI":"10.1109\/VTEST.1992.232732"},{"key":"CR6","doi-asserted-by":"crossref","unstructured":"A. Chatterjee, ?Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums,? Proc. IEEE International Text Conference, 1991, pp. 582?591.","DOI":"10.1109\/TEST.1991.519721"},{"key":"CR7","doi-asserted-by":"crossref","unstructured":"M. Lubaszewski, V. Kolarik, S. Mir, C. Nielsen, and B. Courtois. ?Mixed-signal Circuits and Boards for High Safety Applications,? Proc. European Design and Test Conference, Paris, March 1995, pp. 34?39.","DOI":"10.1109\/EDTC.1995.470423"},{"key":"CR8","doi-asserted-by":"crossref","unstructured":"M. Slamani and B. Kaminska, ?T-BIST: A Built-in Self-Test for Analog Circuits Based on Parameter Translation,? Proc. Asian Test Symposium, 1993, pp. 172?177.","DOI":"10.1109\/ATS.1993.398798"},{"key":"CR9","doi-asserted-by":"crossref","unstructured":"S. Mir, V. Kolarik, M. Lubaszewski, C. Nielsen, and B. Courtois, ?Built-in Self-Test and Fault Diagnosis of Fully Differential Analogue Circuits,? Proc. 12th International Conference on Computer-Aided Design, San Jose, California, Nov. 1994, pp. 486?490.","DOI":"10.1109\/ICCAD.1994.629857"},{"key":"CR10","unstructured":"P.R. Gray, B.A. Wooley, and R.W. Brodersen (eds.), Analog MOS Integrated Circuits, II, IEEE Press, 1989."},{"key":"CR11","unstructured":"Y.P. Tsidivis and J.O. Voorman (eds.), Integrated Continuous-Time Filters. Principles, Design and Applications, IEEE Press, 1993."},{"key":"CR12","unstructured":"IEEE Standards Board, 345 East 47th Street, New York, NY 10017-2394, IEEE Standard Test Access Port and Boundary Scan Architecture, IEEE Standard 1149.1, 1990."},{"issue":"6","key":"CR13","doi-asserted-by":"crossref","first-page":"1122","DOI":"10.1109\/JSSC.1985.1052449","volume":"SC-20","author":"R. Castello","year":"1985","unstructured":"R. Castello and P.R. Gray, ?A High-Performance Micropower Switched-Capacitor Filter,? IEEE Journal of Solid-State Circuits, Vol. SC-20, No. 6, pp. 1122?1132, Dec. 1985.","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"CR14","doi-asserted-by":"crossref","first-page":"131","DOI":"10.1007\/BF01254864","volume":"4","author":"J.F. Duque-Carrillo","year":"1993","unstructured":"J.F. Duque-Carrillo, ?Control of the Common-Mode Component in CMOS Continuous-Time Fully Differential Signal Processing,? Analog Integrated Circuits and Signal Processing, Vol. 4, pp. 131?140, 1993.","journal-title":"Analog Integrated Circuits and Signal Processing"},{"key":"CR15","doi-asserted-by":"crossref","unstructured":"R. Harjani and B. Vinnakota, ?Analog Circuit Observer Blocks,? Proc. 12th IEEE VLSI Test Symposium, April 1994, pp. 258?263.","DOI":"10.1109\/VTEST.1994.292303"},{"issue":"6","key":"CR16","doi-asserted-by":"crossref","first-page":"1114","DOI":"10.1109\/JSSC.1985.1052448","volume":"SC-20","author":"M. Banu","year":"1985","unstructured":"M. Banu and Y. Tsividis, ?An Elliptic Continuous-Time CMOS Filter with On-Chip Automatic Tuning,? IEEE Journal of Solid-State Circuits, Vol. SC-20, No. 6, pp. 1114?1121, Dec. 1985.","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"CR17","unstructured":"S. Mir, M. Lubaszewski, V. Kolarik, and B. Courtois, ?Programmable Self-Checking Analogue Oscilators,? Proc. IEEE International On-line Testing Workshop, Nice, France, July 1995, pp. 30?33."},{"issue":"6","key":"CR18","doi-asserted-by":"crossref","first-page":"828","DOI":"10.1109\/JSSC.1984.1052233","volume":"SC-19","author":"P.W. Li","year":"1984","unstructured":"P.W. Li, M.J. Chin, P.R. Gray, and R. Castello, ?A Ratio-Independent Algorithmic Analog-to-Digital Conversion Technique,? IEEE Journal of Solid-State Circuits, Vol. SC-19, No. 6, pp. 828?836, Dec. 1984.","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"CR19","doi-asserted-by":"crossref","unstructured":"S. Mir, M. Lubaszewski, V. Kolarik, and B. Courtois, ?Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits,? Proc. European Design and Test Conference, Paris, France, March 1996, pp. 254?258.","DOI":"10.1109\/EDTC.1996.494157"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137570.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00137570\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00137570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,19]],"date-time":"2024-12-19T17:30:59Z","timestamp":1734629459000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00137570"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1996]]},"references-count":19,"journal-issue":{"issue":"1-2","published-print":{"date-parts":[[1996]]}},"alternative-id":["BF00137570"],"URL":"https:\/\/doi.org\/10.1007\/bf00137570","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1996]]}}}