{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,11]],"date-time":"2025-04-11T05:11:00Z","timestamp":1744348260232},"reference-count":3,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1993,5,1]],"date-time":"1993-05-01T00:00:00Z","timestamp":736214400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1993,5]]},"DOI":"10.1007\/bf00971647","type":"journal-article","created":{"date-parts":[[2005,1,8]],"date-time":"2005-01-08T23:11:59Z","timestamp":1105225919000},"page":"191-195","source":"Crossref","is-referenced-by-count":12,"title":["On the exact ordered binary decision diagram size of totally symmetric functions"],"prefix":"10.1007","volume":"4","author":[{"given":"Mark","family":"Heap","sequence":"first","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","first-page":"243","DOI":"10.1007\/BF00135441","volume":"2","author":"D.E. Ross","year":"1991","unstructured":"D.E. Ross, K.M. Butler and M.R. Mercer, ?Exact ordered binary decision diagram size when representing clases of symmetric functions,?Journal of Electronic Testing, vol. 2, pp. 243?259, August 1991.","journal-title":"Journal of Electronic Testing"},{"key":"CR2","volume-title":"Logic Design Principles with emphasis on testable semi-custom circuits","author":"E.J. McCluskey","year":"1986","unstructured":"E.J. McCluskey,Logic Design Principles with emphasis on testable semi-custom circuits, Englewood Cliffs, NJ: Prentice-Hall, 1986."},{"key":"CR3","doi-asserted-by":"crossref","first-page":"677","DOI":"10.1109\/TC.1986.1676819","volume":"35","author":"R.E. Bryant","year":"1986","unstructured":"R.E. Bryant, ?Graph-based algorithms for Boolean function manipulation,?IEEE Transactions on Computers, vol. C-35, pp. 677?690, August 1986.","journal-title":"IEEE Transactions on Computers"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00971647.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00971647\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00971647","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,29]],"date-time":"2019-04-29T22:36:46Z","timestamp":1556577406000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00971647"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,5]]},"references-count":3,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1993,5]]}},"alternative-id":["BF00971647"],"URL":"https:\/\/doi.org\/10.1007\/bf00971647","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1993,5]]}}}