{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T21:57:01Z","timestamp":1648763821313},"reference-count":11,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[1993,2,1]],"date-time":"1993-02-01T00:00:00Z","timestamp":728524800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1993,2]]},"DOI":"10.1007\/bf00971938","type":"journal-article","created":{"date-parts":[[2005,1,12]],"date-time":"2005-01-12T06:56:18Z","timestamp":1105512978000},"page":"33-41","source":"Crossref","is-referenced-by-count":8,"title":["Functional versus random test generation for sequential circuits"],"prefix":"10.1007","volume":"4","author":[{"given":"Margot","family":"Karam","sequence":"first","affiliation":[]},{"given":"Gabriele","family":"Saucier","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","first-page":"475","DOI":"10.1109\/TC.1984.1676471","volume":"33","author":"D. Brahme","year":"1984","unstructured":"D. Brahme and J.A. Abraham, ?Functional testing of microprocessors?IEEE Trans. on Comp., vol. C-33, pp. 475?485, June 1984.","journal-title":"IEEE Trans. on Comp."},{"key":"CR2","doi-asserted-by":"crossref","first-page":"617","DOI":"10.1109\/TC.1978.1675161","volume":"27","author":"C. Robach","year":"1978","unstructured":"C. Robach and G. Saucier, ?Dynamic testing of control units,?IEEE Trans. on Comp. vol. C-27, pp. 617?623, July 1978.","journal-title":"IEEE Trans. on Comp."},{"key":"CR3","series-title":"Workshop on Defect and Fault Tolerance in VLSI Systems","first-page":"135","volume-title":"Experience in functional-level test generation and fault coverage in a silicon compiler","author":"C. Jay","year":"1989","unstructured":"C. Jay, ?Experience in functional-level test generation and fault coverage in a silicon compiler? Workshop on Defect and Fault Tolerance in VLSI Systems, New York: Plenum Press, pp. 135?148, 1989."},{"key":"CR4","unstructured":"M. Karam, ?Test generation based on functional modeling,? Ph.D. Dissertation, Institut National Polytechnique de Grenoble, 1991."},{"key":"CR5","unstructured":"P. Kovijanic, ?A new look at test generation and verification,?Proc. 14th Design Auto. Conf., pp. 58?63, June 1977."},{"key":"CR6","doi-asserted-by":"crossref","unstructured":"K. Sabnani and A. Dahbura, ?A new technique for generating protocol tests?9th Data Communications Symp., IEEE Comp. Soc. Press, pp. 36?43, September 1985.","DOI":"10.1145\/318951.319003"},{"key":"CR7","unstructured":"M. Uyar and A. Dahbura, ?Optimal test sequence generation for protocols: The Chinese postman algorithm applied to Q.931,?Proc. IEEE Global Telecommunications Conference, 1986."},{"key":"CR8","series-title":"Protocol Specification, Testing, and Verification","first-page":"75","volume-title":"An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tour","author":"A. Aho","year":"1988","unstructured":"A. Aho, A. Dahbura, D. Lee, and M. Uyar, ?An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tour,?Protocol Specification, Testing, and Verification VIII, New York: Elsevier Science Publishers B.V., pp. 75?86, June 1988."},{"key":"CR9","doi-asserted-by":"crossref","unstructured":"K.-T. Cheng and J.-Y. Jou, ?Functional test generation for finite state machines,?Proc. International Test Conference, pp. 162?168, Washington, D.C., 1990.","DOI":"10.1109\/TEST.1990.114014"},{"key":"CR10","doi-asserted-by":"crossref","unstructured":"I. Pomeranz and S. Reddy, ?On achieving a complete fault coverage for sequential machines using the transition fault model,?Proc. Design Auto. Conf., pp. 341?346, California, June 1991.","DOI":"10.1145\/127601.127691"},{"key":"CR11","volume-title":"Algorithmic graph theory","author":"A. Gibbons","year":"1985","unstructured":"A. Gibbons,Algorithmic graph theory, Cambridge, MA: Cambridge University Press, 1985."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00971938.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00971938\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00971938","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,5]],"date-time":"2020-04-05T08:38:38Z","timestamp":1586075918000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00971938"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,2]]},"references-count":11,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1993,2]]}},"alternative-id":["BF00971938"],"URL":"https:\/\/doi.org\/10.1007\/bf00971938","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1993,2]]}}}