{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T13:40:02Z","timestamp":1734874802343,"version":"3.32.0"},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"2-3","license":[{"start":{"date-parts":[[1994,1,1]],"date-time":"1994-01-01T00:00:00Z","timestamp":757382400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1994]]},"DOI":"10.1007\/bf00972083","type":"journal-article","created":{"date-parts":[[2005,1,9]],"date-time":"2005-01-09T02:03:00Z","timestamp":1105236180000},"page":"239-251","source":"Crossref","is-referenced-by-count":6,"title":["Sensitivity analysis in economics based test strategy planning"],"prefix":"10.1007","volume":"5","author":[{"given":"J. H.","family":"Dick","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Trischler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Dislis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. P.","family":"Ambler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"C. Dislis, I.D. Dear, J.R. Miles, S.C. Lau and A.P. Ambler, ?Cost Analysis of Test Method Environments,? IEEE International Test Conference, pp. 875?883, 1989.","DOI":"10.1109\/TEST.1989.82378"},{"issue":"no. 4","key":"CR2","doi-asserted-by":"crossref","first-page":"64","DOI":"10.1109\/54.107206","volume":"8","author":"I.D. Dear","year":"1991","unstructured":"I.D. Dear, C. Dislis, A.P. Ambler, J. Dick, ?Economic Effects in Design and Test,?IEEE Design and Test of Computers, vol. 8, no. 4, pp. 64?77, Dec. 1991.","journal-title":"IEEE Design and Test of Computers"},{"key":"CR3","doi-asserted-by":"crossref","unstructured":"M.S. Abadir, ?TIGER: Testability Insertion Guidance Expert System,?Proceedings IEEE International Conference on Computer Aided Design, pp. 562?565, 1989.","DOI":"10.1109\/ICCAD.1989.77013"},{"key":"CR4","unstructured":"M.A. Myers, ?An Analysis of the Cost and Quality Impact of LSI\/VLSI Technology on PCB Test Strategies,? IEEE International Test Conference, 1983, pp. 382?395."},{"key":"CR5","volume-title":"Proc. Economics of Design and Test for Electronic Circuits and Systems","author":"S.A. Szygenda","year":"1992","unstructured":"S.A. Szygenda, ?Profit, Liability, and Education: Influencing Factors on the Economics of Non-testing,?Proc. Economics of Design and Test for Electronic Circuits and Systems, Ellis Horwood Limited, Chichester, 1992."},{"key":"CR6","volume-title":"The Economics of Automatic Testing","author":"B. Davis","year":"1982","unstructured":"B. Davis,The Economics of Automatic Testing; McGraw-Hill, London, 1982."},{"key":"CR7","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-88169-5","volume-title":"Sensitivit\u00e4tsanalysen und parametrische Programmierung","author":"W. Dinkelbach","year":"1969","unstructured":"W. Dinkelbach,Sensitivit\u00e4tsanalysen und parametrische Programmierung; Springer-Verlag, Berlin, Heidelberg, New York, 1969."},{"key":"CR8","volume-title":"A Financially Based Automated Advisor for Design for Test Strategy Generation","author":"C. Dislis","year":"1992","unstructured":"C. Dislis,A Financially Based Automated Advisor for Design for Test Strategy Generation, Ph.D. thesis, Brunel University, United Kingdom, 1992."},{"key":"CR9","unstructured":"P. Varma, A.P. Ambler, and K. Baker, ?An Analysis of the Economics of Self-Test,?IEEE Proceedings of the International Test Conference, 1984."},{"key":"CR10","volume-title":"Monte Carlo Optimization, Simulation and Sensitivity of Queueing Networks","author":"R.Y. Rubinstein","year":"1986","unstructured":"R.Y. Rubinstein,Monte Carlo Optimization, Simulation and Sensitivity of Queueing Networks, John Wiley & Sons, New York, 1986."},{"key":"CR11","volume-title":"Monte Carlo Methods","author":"J.M. Hammersley","year":"1965","unstructured":"J.M. Hammersley and D.C. Handscomb,Monte Carlo Methods, Methuen & Co. Ltd., London, 1965."},{"key":"CR12","unstructured":"J. Armaos,Zur Optimierung elektrischer Schaltungen unter Ber\u00fccksichtigung der Parametertoleranzen. Ph.D. thesis, Institute for Computer Aided Circuit Design, Technical University of Munich, 1982."},{"key":"CR13","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1109\/TCS.1982.1085115","volume":"29","author":"K.J. Antreich","year":"1982","unstructured":"K.J. Antreich, and R.K. Koblitz, ?Design Centering by Yield Prediction,?IEEE Transactions on Circuits and Systems, vol. CAS-29, pp. 88?95, Feb. 1982.","journal-title":"IEEE Transactions on Circuits and Systems"},{"key":"CR14","doi-asserted-by":"crossref","unstructured":"G. Kjellstrom and L. Taxen, ?Stochastic Optimization in System Design,?IEEE Transactions on Circuits and Systems, vol. cas-28, July 1991.","DOI":"10.1109\/TCS.1981.1085030"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972083.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00972083\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972083","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T13:09:37Z","timestamp":1734872977000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00972083"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994]]},"references-count":14,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[1994]]}},"alternative-id":["BF00972083"],"URL":"https:\/\/doi.org\/10.1007\/bf00972083","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1994]]}}}