{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,10]],"date-time":"2025-04-10T04:59:00Z","timestamp":1744261140079},"reference-count":8,"publisher":"Springer Science and Business Media LLC","issue":"2-3","license":[{"start":{"date-parts":[[1994,1,1]],"date-time":"1994-01-01T00:00:00Z","timestamp":757382400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1994]]},"DOI":"10.1007\/bf00972084","type":"journal-article","created":{"date-parts":[[2005,1,8]],"date-time":"2005-01-08T21:03:00Z","timestamp":1105218180000},"page":"253-261","source":"Crossref","is-referenced-by-count":8,"title":["Improving quality: Yield versus test coverage"],"prefix":"10.1007","volume":"5","author":[{"given":"Steven D.","family":"Millman","sequence":"first","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","first-page":"987","DOI":"10.1109\/TC.1981.1675742","volume":"30","author":"T.W. Williams","year":"1981","unstructured":"T.W. Williams and N.C. Brown, ?Defect Level as a Function of Fault Coverage,?IEEE Trans. Comput., vol. C-30, pp. 987?988, Dec. 1981.","journal-title":"IEEE Trans. Comput."},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"D.V. Das, S.C. Seth, P.T. Wagner, J.C. Anderson, V.D. Agrawal, ?An Experimental Study on Reject Ratio Prediction for VLSI Circuits: Kokomo Revisited,?Proc. Int. Test Conf., Washington, DC, pp. 172?720, Sept. 10?14, 1990.","DOI":"10.1109\/TEST.1990.114087"},{"key":"CR3","doi-asserted-by":"crossref","unstructured":"P.C. Maxwell, R.C. Aitken, V. Johansen, and I. Chiang, ?The Effect of Different Test Sets on Quality Level Prediction: When is 80% Better Than 90%??Proc. Int. Test Conf., Nashville, TN, pp. 358?364, Oct. 26?30, 1991.","DOI":"10.1109\/TEST.1991.519695"},{"key":"CR4","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1109\/JSSC.1982.1051686","volume":"17","author":"V.D. Agrawal","year":"1982","unstructured":"V.D. Agrawal, S.C. Seth, and P. Agrawal, ?Fault Coverage Requirement in Production Testing of LSI Circuits,?IEEE J. Solid-State Circuits, vol. SC-17, pp. 57?61, Feb. 1982.","journal-title":"IEEE J. Solid-State Circuits"},{"key":"CR5","doi-asserted-by":"crossref","first-page":"527","DOI":"10.1109\/TC.1980.1675614","volume":"29","author":"J. Galiay","year":"1980","unstructured":"J. Galiay, Y. Crouzet, and M. Vergniault, ?Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability,?IEEE Trans. Comput., vol. C-29, pp. 527?531, June 1980.","journal-title":"IEEE Trans. Comput."},{"key":"CR6","doi-asserted-by":"crossref","first-page":"13","DOI":"10.1109\/MDT.1985.294793","volume":"2","author":"J.P. Shen","year":"1985","unstructured":"J.P. Shen, W. Maly, and F.J. Ferguson, ?Inductive Fault Analysis of MOS Integrated Circuits,?IEEE Design & Test, vol. 2, pp. 13?26, Dec. 1985.","journal-title":"IEEE Design & Test"},{"key":"CR7","doi-asserted-by":"crossref","unstructured":"W. Maly, ?Realistic Fault Modeling for VLSI Testing,?Proc. 24th DAC, Miami Beach, FL, pp. 173?180, June 28?July 1, 1987.","DOI":"10.1145\/37888.37914"},{"key":"CR8","volume-title":"Nonclassical Faults in CMOS Digital Integrated Circuits","author":"S.D. Millman","year":"1989","unstructured":"S.D. Millman,Nonclassical Faults in CMOS Digital Integrated Circuits, Ph.D. thesis, Stanford University, Stanford, CA., Dec. 1989."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972084.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00972084\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972084","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,29]],"date-time":"2019-04-29T18:36:54Z","timestamp":1556563014000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00972084"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994]]},"references-count":8,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[1994]]}},"alternative-id":["BF00972084"],"URL":"https:\/\/doi.org\/10.1007\/bf00972084","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1994]]}}}